Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2020Comparing Microwave Detected Photoconductance, Quasi Steady State Photoconductance and Photoluminiscence Imaging for Iron Analysis in Silicon
Pengerla, M.; Al-Hajjawi, S.; Kuruganti, V.; Haunschild, J.; Schüler, N.; Dornich, K.; Rein, S.
Konferenzbeitrag
2020Early Stage Quality Assesment in Silicon Ingots from MDP Brick Characterization
Kovvali, A.S.; Demant, M.; Rebba, B.; Schüler, N.; Haunschild, J.; Rein, S.
Konferenzbeitrag
2019Non-Destructive Approach for Measuring Base Resistivity of Emitter-Diffused, Partially-Processed Wafers Using Temperature-Stage QSSPC
Kuruganti, V.; Haunschild, J.; Brand, A.; Al-Hajjawi, S.; Rein, S.; Glunz, S.W.
Konferenzbeitrag
2018About the Relevance of Defect Features in As-Cut Multicrystalline Silicon Wafers on Solar Cell Performance
Kovvali, A.; Demant, M.; Trötschler, T.; Haunschild, J.; Rein, S.
Konferenzbeitrag
2018Inline Characterization of Diamond Wire Sawn Multicrystalline Silicon Wafers
Haunschild, J.; Bergmann, N.; Hammer, T.; Krieg, K.; Kaden, T.; Anspach, O.; Schremmer, H.; Rein, S.
Konferenzbeitrag
2018Inline Wafer Identification Using Optical Character Recognition (OCR)
Al-Hajjawi, S.; Hammer, T.; Haunschild, J.
Konferenzbeitrag
2017Review of tools and approaches for inline quality control in high efficiency silicon solar cell production
Haunschild, J.; Greulich, J.; Höffler, H.; Wasmer, S.; Emanuel, G.; Krieg, A.; Friedrich, L.; Rein, S.
Konferenzbeitrag
2015Grain-to-grain contrasts in photoluminescence images of silicon wafers
Höffler, H.; Haunschild, J.; Rein, S.
Zeitschriftenaufsatz
2015Investigating the impact of parameter and process variations on multicrystalline PERC cell efficiency
Wasmer, S.; Greulich, J.; Höffler, H.; Haunschild, J.; Demant, M.; Rein, S.
Konferenzbeitrag
2014Two image processing tools to analyse alkaline texture and contact finger geometry in microscope images
Strauch, T.; Demant, M.; Lorenz, A.; Haunschild, J.; Rein, S.
Konferenzbeitrag
2013Evaluation and improvement of a feature-based classification framework to rate the quality of multicrystalline silicon wafers
Demant, M.; Höffler, H.; Schwaderer, D.; Seidl, A.; Haunschild, J.; Rein, S.
Konferenzbeitrag
2012Cz-silicon wafers in solar cell production: Efficiency-limiting defects and material quality control
Haunschild, J.; Broisch, J.; Reis, I.; Rein, S.
Zeitschriftenaufsatz
2012Tomographic defect reconstruction of multicrystalline silicon ingots using photoluminescence images of As-Cut wafers and solar cells
Zeidler, R.; Haunschild, J.; Seeber, B.; Riepe, S.; Höffler, H.; Fertig, F.; Reis, I.; Rein, S.
Konferenzbeitrag
2011Investigations on the Impact of Wafer Grippers on Optical and Electrical Properties of Alkaline Textured and A-Si Passivated Surfaces
Nold, S.; Aßmus, M.; Weil, A.; Haunschild, J.; Savio, C.; Hofmann, M.; Rentsch, J.; Preu, R.; Kunz, M.
Konferenzbeitrag
2011Quality Control of Czochralski Grown Silicon Wafers in Solar Cell Production Using Photoluminescence Imaging
Haunschild, J.; Broisch, J.; Reis, I.E.; Rein, S.
Konferenzbeitrag
2010Analysis of luminescence images applying pattern recognition techniques
Demant, M.; Glatthaar, M.; Haunschild, J.; Rein, S.
Konferenzbeitrag
2010Appearance of rift structures created by acidic texturization and their impact on solar cell efficiency
Nievendick, J.; Demant, M.; Haunschild, J.; Krieg, A.; Souren, F.M.M.; Rein, S.; Zimmer, M.; Rentsch, J.
Konferenzbeitrag
2010High aspect ratio front contacts by single step dispensing of metal pastes
Specht, J.; Zengerle, K.; Pospischil, M.; Erath, D.; Haunschild, J.; Clement, F.; Biro, D.
Konferenzbeitrag
2010Luminescence imaging for quantitative solar cell material and process characterization
Glatthaar, M.; Haunschild, J.; Zeidler, R.; Rentsch, J.; Rein, S.; Breitenstein, O.; Hinken, D.; Bothe, K.
Konferenzbeitrag
2010Quality control using luminescence imaging in production of mc-silicon solar cells from UMG feedstock
Haunschild, J.; Glatthaar, M.; Riepe, S.; Rein, S.
Konferenzbeitrag
2009Pilot-line processing of screen-printed Cz-Si MWT solar cells exceeding 17% efficiency
Clement, F.; Menkö, M.; Hoenig, R.; Haunschild, J.; Biro, D.; Preu, R.; Lahmer, D.; Lossen, J.; Krokoszinski, H.-J.
Konferenzbeitrag
2009Spatially resolved determination of the dark saturation current by electroluminescence imaging
Glatthaar, M.; Giesecke, J.; Kasemann, M.; Haunschild, J.; The, M.; Warta, W.; Rein, S.
Konferenzbeitrag
2009Wet chemical processing for c-Si solar cells - status and perspectives
Rentsch, J.; Ackermann, R.; Birmann, K.; Furtwängler, H.; Haunschild, J.; Kästner, G.; Neubauer, R.; Nievendick, J.; Oltersdorf, A.; Rein, S.; Schütte, A.; Zimmer, M.; Preu, R.
Konferenzbeitrag