Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2021The Empirical Digital Twin: Representation Learning on Solar Cell Images and Efficient Defect Detection with Human-in-the-Loop
Kunze, P.; Rein, S.; Mueller, T.; Hemsendorf, M.; Ramspeck, K.; Demant, M.
Konferenzbeitrag
2021Learning an Empirical Digital Twin from Measurement Images for a Comprehensive Quality Inspection of Solar Cells
Kunze, P.; Rein, S.; Hemsendorf, M.; Ramspeck, K.; Demant, M.
Zeitschriftenaufsatz
2020The Crystal Growth Explorer: Real-Time Navigable 3D Visualization of Silicon Grains and Defect Related Data in Cast-Mono and Multicrystalline Bricks
Schönauer, J.; Demant, M.; Trötschler, T.; Kovvali, A.S.; Schremmer, H.; Krenckel, P.; Riepe, S.; Rein, S.
Konferenzbeitrag
2020Early Stage Quality Assesment in Silicon Ingots from MDP Brick Characterization
Kovvali, A.S.; Demant, M.; Rebba, B.; Schüler, N.; Haunschild, J.; Rein, S.
Konferenzbeitrag
2020Efficient Deployment of Deep Neural Networks for Quality Inspection of Solar Cells using Smart Labeling
Kunze, P.; Greulich, J.; Rein, S.; Ramspeck, K.; Hemsendorf, M.; Vetter, A.; Demant, M.
Konferenzbeitrag
2020Machine Learning for Advanced Solar Cell Production. Adversarial Denoising, Sub-pixel Alignment and the Digital Twin
Demant, M.; Kurumundayil, L.; Kunze, P.; Woernhoer, A.; Kovvali, A.; Rein, S.
Vortrag
2019Learning Quality Rating of As-Cut mc-Si Wafers via Convolutional Regression Networks
Demant, M.; Virtue, P.; Kovvali, A.; Yu, S.X.; Rein, S.
Zeitschriftenaufsatz
2019Visualizing Material Quality and Similarity of mc-Si Wafers Learned by Convolutional Regression Networks
Demant, M.; Virtue, P.; Kovvali, A.; Yu, S.X.; Rein, S.
Zeitschriftenaufsatz
2018About the Relevance of Defect Features in As-Cut Multicrystalline Silicon Wafers on Solar Cell Performance
Kovvali, A.; Demant, M.; Trötschler, T.; Haunschild, J.; Rein, S.
Konferenzbeitrag
2018Deep Learning Approach to Inline Quality Rating and Mapping of Multi-Crystalline Si-Wafers
Demant, M.; Virtue, P.; Kovvali, A.S.; Yu, S.X.; Rein, S.
Konferenzbeitrag
2017Bifacial p-type silicon PERL solar cells with screen-printed pure silver metallization and 89% bifaciality
Lohmüller, E.; Werner, S.; Norouzi, M.H.; Mack, S.; Demant, M.; Gutscher, S.; Saint-Cast, P.; Wasmer, S.; Wöhrle, N.; Bitnar, B.; Steckemetz, S.; Palinginis, P.; Neuhaus, H.; König, M.; Wolf, A.
Konferenzbeitrag
2017Identification of defect-suppressing grain boundaries in multicrystalline silicon based on measurements of as-cut wafers using advanced image processing
Strauch, T.; Demant, M.; Krenckel, P.; Riepe, S.; Rein, S.
Konferenzbeitrag
2017Key aspects for fabrication of p-type Cz-Si PERC solar cells exceeding 22% conversion efficiency
Werner, S.; Lohmüller, E.; Saint-Cast, P.; Greulich, J.M.; Weber, J.; Schmidt, S.; Moldovan, A.; Brand, A.A.; Dannenberg, T.; Mack, S.; Wasmer, S.; Demant, M.; Linse, M.; Ackermann, R.; Wolf, A.; Preu, R.
Konferenzbeitrag
2016Analysis of grain structure evolution via image processing based on optical measurements of mc Si wafers
Strauch, T.; Demant, M.; Krenckel, P.; Riepe, S.; Rein, S.
Konferenzbeitrag
2016Microcracks in silicon wafers I: Inline detection and implications of crack morphology on wafer strength
Demant, M.; Welschehold, T.; Oswald, M.; Bartsch, S.; Brox, T.; Schoenfelder, S.; Rein, S.
Zeitschriftenaufsatz
2016Microcracks in silicon wafers II: Implications on solar cell characteristics, statistics and physical origin
Demant, M.; Welschehold, T.; Kluska, S.; Rein, S.
Zeitschriftenaufsatz
2015Investigating the impact of parameter and process variations on multicrystalline PERC cell efficiency
Wasmer, S.; Greulich, J.; Höffler, H.; Haunschild, J.; Demant, M.; Rein, S.
Konferenzbeitrag
2014Micro-cracks in silicon wafers and solar cells: Detection and rating of mechanical strength and electrical quality
Demant, M.; Oswald, M.; Welschehold, T.; Nold, S.; Bartsch, S.; Schoenfelder, S.; Rein, S.
Konferenzbeitrag
2014Two image processing tools to analyse alkaline texture and contact finger geometry in microscope images
Strauch, T.; Demant, M.; Lorenz, A.; Haunschild, J.; Rein, S.
Konferenzbeitrag
2013Evaluation and improvement of a feature-based classification framework to rate the quality of multicrystalline silicon wafers
Demant, M.; Höffler, H.; Schwaderer, D.; Seidl, A.; Haunschild, J.; Rein, S.
Konferenzbeitrag
2011Optical Characterisation of Random Pyramid Texturization
Birmann, K.; Demant, M.; Rein, S.
Konferenzbeitrag
2010Analysis of luminescence images applying pattern recognition techniques
Demant, M.; Glatthaar, M.; Haunschild, J.; Rein, S.
Konferenzbeitrag
2010Appearance of rift structures created by acidic texturization and their impact on solar cell efficiency
Nievendick, J.; Demant, M.; Haunschild, J.; Krieg, A.; Souren, F.M.M.; Rein, S.; Zimmer, M.; Rentsch, J.
Konferenzbeitrag