Fraunhofer-Gesellschaft

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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Multilayer Thickness Measurements below the Rayleigh Limit Using FMCW Millimeter and Terahertz Waves
Schreiner, N.S.; Sauer-Greff, W.; Urbansky, R.; Freymann, G. von; Friederich, F.
Zeitschriftenaufsatz
2016Fast thickness measurements with frequency modulated continuous wave terahertz radiation
Schreiner, Nina S.; Baccouche, Bessem; Sauer-Greff, Wolfgang; Urbansky, Ralph; Friederich, Fabian
Konferenzbeitrag
2016Highly accurate thickness measurement of multi-layered automotive paints using terahertz technology
Krimi, Soufiene; Klier, Jens; Jonuscheit, Joachim; Freymann, Georg von; Urbansky, Ralph; Beigang, René
Zeitschriftenaufsatz
2016Self-calibrating approach for terahertz thickness measurements of ceramic coatings
Krimi, Soufiene; Klier, Jens; Jonuscheit, Joachim; Freymann, Georg von; Urbansky, Ralph; Beigang, René
Konferenzbeitrag
2016Terahertz time-domain technology for thickness determination of industrial relevant multi-layer coatings
Ellrich, Frank; Klier, Jens; Weber, Stefan; Jonuscheit, Joachim; Freymann, Georg von
Konferenzbeitrag
2013Inline multilayer thickness sensing by using terahertz time-domain spectroscopy in reflection geometry
Krimi, S.; Klier, J.; Herrmann, M.; Jonuscheit, J.; Beigang, R.
Konferenzbeitrag
2004On the accuracy of thickness measurements in impact-echo testing of finite concrete specimens - numerical and experimental results
Schubert, F.; Wiggenhauser, H.; Lausch, R.
Zeitschriftenaufsatz
2002Electron probe microanalysis (EPMA) measurement of thin-film thickness in the nanometre range
Procop, M.; Radtke, M.; Krumrey, M.; Hasche, K.; Schädlich, S.; Frank, W.
Zeitschriftenaufsatz
1999Application and cost analysis of scatterometry for integrated metrology
Benesch, N.; Schneider, C.; Pfitzner, L.; Ryssel, H.
Konferenzbeitrag
1997Controlling the quality of thin films by surface acoustic waves
Schneider, S.; Schwarz, T.; Bradford, A.S.; Shan, Q.; Dewhurst, R.J.
Zeitschriftenaufsatz
1991Optical thickness mapping of InGaAsP/InP layers
Sartorius, B.; Brandstattner, M.; Wolfram, P.; Franke, D.
Zeitschriftenaufsatz
1991Optimization and calibration of two-wavelength transmission for absolute thickness measurements of InGaAsP/InP layers
Sartorius, B.; Brandstattner, M.
Konferenzbeitrag
1990Nondestructive thickness mapping of epitaxial InGaAsP/InP layers
Sartorius, B.; Brandstattner, M.
Konferenzbeitrag