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| 2019 | Process and design optimization of SiC MOSFET for low on-state resistance
Sledziewski, Tomasz; Erlbacher, Tobias; Bauer, Anton | Vortrag |
| 2018 | Confined electron and hole states in semiconducting carbon nanotube sub-10 nm artificial quantum dots
Buchs, G.; Bercioux, D.; Mayrhofer, L.; Gröning, O. | Zeitschriftenaufsatz |
| 2018 | Extrusion foaming of thermoplastic cellulose acetate sheets with HFO-1234ze and co-blowing agents
Hendriks, Sven; Hopmann, Christian H.; Zepnik, Stefan | Zeitschriftenaufsatz |
| 2018 | High-speed quantum efficiency determination of multijunction solar cells
Missbach, T.; Dengler, S.A.; Siefer, G.; Bett, A.W. | Zeitschriftenaufsatz |
| 2018 | OLED-on-silicon microdisplays: Technology, devices, applications
Vogel, Uwe; Wartenberg, Philipp; Richter, Bernd; Brenner, Stephan; Fehse, Karsten; Schober, Matthias | Konferenzbeitrag |
| 2018 | Selective silver sintering of semiconductor dies on PCB
Dresel, Fabian; Letz, Sebastian; Zischler, Sigrid; Schletz, Andreas; Novak, Michael | Konferenzbeitrag |
| 2017 | High-speed broadband quantum efficiency determination of solar cells
Missbach, T.; Straub, R.S.L.; Benkhoff, T.M.; Siefer, G. | Zeitschriftenaufsatz |
| 2017 | Multi-segment photovoltaic laser power converters and their electrical losses
Kimovec, R.; Helmers, H.; Bett, A.W.; Topic, M. | Konferenzbeitrag |
| 2016 | Drill-down analysis with equipment health monitoring
Krauel, Christopher; Weishäupl, Laura; Pfeffer, Markus | Vortrag |
| 2016 | Inhomogeneous growth of micrometer thick plasma polymerized films
Akhavan, Behnam; Menges, Bernhard; Förch, Renate | Zeitschriftenaufsatz |
| 2015 | Energy level of the Si-related DX-center in (AlyGa1-y)1-xInxAs
Heckelmann, S.; Lackner, D.; Bett, A.W. | Zeitschriftenaufsatz |
| 2015 | Enhanced pressure response in ZnO nanorods due to spontaneous polarization charge
Seifikar, M.; O'Reilly, E.P.; Christian, B.; Lebedev, V.; Volk, J.; Erdélyi, R.; Lukács, I.E.; Dauksevicious, R.; Gaidys, R. | Konferenzbeitrag |
| 2015 | Imaging defect luminescence measurements of 4H-SiC by UV-PL
Kaminzky, Daniel; Roßhirt, Katharina; Kallinger, Birgit; Berwian, Patrick; Friedrich, Jochen; Oppel, Steffen; Schneider, Adrian; Schütz, Michael | Vortrag |
| 2015 | Imaging defect luminescence of 4H-SiC by UV-photoluminescence
Kaminzky, Daniel; Roßhirt, Katharina; Kallinger, Birgit; Berwian, Patrick; Friedrich, Jochen; Oppel, Steffen; Schneider, Adrian; Schütz, Michael | Vortrag |
| 2015 | Impact of Photon Recycling and Luminescence Coupling in III-V Photovoltaic Devices
Walker, A.; Höhn, O.; Micha, D.; Wagner, L.; Helmers, H.; Dimroth, F.; Bett, A. | Konferenzbeitrag |
| 2015 | Influence of growth temperature on the defect density for 4H-SiC homoepitaxy
Kaminzky, Daniel; Roßhirt, Katharina; Kallinger, Birgit; Berwian, Patrick; Friedrich, Jochen | Poster |
| 2014 | Focus on quantum efficiency. Editorial
Buchleitner, A.; Burghardt, I.; Cheng, Y.C.; Scholes, G.D.; Schwarz, U.T.; Weber-Bargioni, A.; Wellens, T. | Zeitschriftenaufsatz |
| 2013 | Breve introdução à Tecnologia de Salas Limpas: Enfrentando os desafios futuros
Gommel, Udo; Kreck, Guido | Zeitschriftenaufsatz |
| 2013 | Opposites attract: An approach to collaborative supply chain management between semiconductor and automotive companies
Aelker, Judith; Meister, Verena; Forster, Christoph; Zapp, Matthias; Bauernhansl, Thomas | Zeitschriftenaufsatz |
| 2012 | Future Demands and Challenges for Cleanroom Technology
Gommel, Udo | Vortrag |
| 2012 | Im Spannungsfeld der Absatzmärkte
Forster, Christoph; Zapp, Matthias | Zeitschriftenaufsatz |
| 2012 | A short introduction to cleanliness technology: Meeting the future challenges
Gommel, Udo; Kreck, Guido | Konferenzbeitrag |
| 2012 | Traceable measurements of electrical conductivity and Seebeck coefficient of β-Fe0.95Co0.05Si2 and Ge in the temperature range from 300 K to 850 K
Lenz, E.; Haupt, S.; Edler, F.; Ziolkowski, P.; Pernau, H.-F. | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2011 | (Bi,Sb)2Te3-PbTe chalcogenide alloys: Impact of the cooling rate and sintering parameters on the microstructures and thermoelectric performances
Jacquot, A.; Thomas, J.; Schumann, J.; Jägle, M.; Böttner, H.; Gemming, T.; Schmidt, J.; Ebling, D. | Zeitschriftenaufsatz |
| 2011 | A more reliable supply of semiconductor components
Forster, Christoph; Zapp, Matthias | Zeitschriftenaufsatz |
| 2011 | Reduzierung von Beschaffungsrisiken bei Halbleiterbauteilen
Zapp, Matthias; Forster, Christoph | Zeitschriftenaufsatz |
| 2010 | Analysis of polar GaN surfaces with photoelectron and high resolution electron energy loss spectroscopy
Lorenz, P.; Haensel, T.; Gutt, R.; Koch, R.J.; Schaefer, J.A.; Krischok, S. | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2009 | Werkstofftrends: Werkstoffe der Mikrosystemtechnik
Weimert, B.; Reschke, S.; Kohlhoff, J.; Grüne, M. | Zeitschriftenaufsatz |
| 2008 | Optically pumped GaSb-based VECSELs
Schulz, N.; Rattunde, M.; Rösener, B.; Manz, C.; Köhler, K.; Wagner, J. | Konferenzbeitrag |
| 2008 | Werkstofftrends: Thermoelektrika
Reschke, S.; Grüne, M.; Kohlhoff, J. | Zeitschriftenaufsatz |
| 2007 | Barrier- and in-well pumped GaSb-based 2.3 µm VECSELs
Wagner, J.; Schulz, N.; Rattunde, M.; Ritzenthaler, C.; Manz, C.; Wild, C.; Köhler, K. | Zeitschriftenaufsatz |
| 2007 | High-speed asynchronous optical sampling for high-sensitivity detection of coherent phonons
Dekorsy, T.; Taubert, R.; Hudert, F.; Schrenk, G.; Bartels, A.; Cerna, R.; Kotaidis, A.; Plech, A.; Köhler, K.; Schmitz, J.; Wagner, J. | Konferenzbeitrag, Zeitschriftenaufsatz |
| 2007 | InGaAs/AlAsSb quantum cascade detectors operating in the near infrared
Giorgetta, F.R.; Baumann, E.; Hofstetter, D.; Manz, C.; Yang, Q.K.; Köhler, K.; Graf, M. | Zeitschriftenaufsatz |
| 2006 | Neue Halbleiter
Ruhlig, K. | Zeitschriftenaufsatz |
| 2006 | Tool supported capability management for semiconductor high volume equipment integration
Erdmann, B.; Dreiss, P. | Konferenzbeitrag |
| 2005 | Current gaps in production planning frameworks for real-time semiconductor enterprises
Fricke, P.; Fischmann, C.; Seidelmann, J. | Konferenzbeitrag |
| 2005 | Grid system for solving computing bottlenecks in semiconductor industries at the example of an AMHS
Knoll, G.; Wesemann, M.; Sturm, R. | Konferenzbeitrag |
| 2005 | High-power high-brightness tapered diode lasers and amplifiers
Kelemen, M.T.; Weber, J.; Mikulla, M.; Weimann, G. | Konferenzbeitrag |
| 2005 | Requirements engineering für die Automatisierung
Reddig, K. | Konferenzbeitrag |
| 2005 | Tutorial: The new specification template and procedures for writing SEMI information and control standards
Bricker, D.; Carrubba, M.; Crandell, B.; Dreiss, P.; Ghiselli, J.; Muckenhirn, R.; Rist, L.; Walsh, D. | Konferenzbeitrag |
| 2004 | Architecture of a flexible scheduling component
Wiechers, O.; Zehtaban, M. | Konferenzbeitrag |
| 2004 | Authorization and authentification standard (overview and status)
Dreiss, P.; Bichlmeier, J. | Konferenzbeitrag |
| 2004 | Design of the core scheduling component for a flexible scheduling tool
Zehtaban, M.; Seidelmann, J.; Wiechers, O. | Konferenzbeitrag |
| 2004 | Diagnostic data acquisition (DDA) data collection management standards (overview and status)
Dreiss, P.; Willmann, R. | Konferenzbeitrag |
| 2004 | EDA demonstration
Dreiss, P.; Kender, E. | Konferenzbeitrag |
| 2004 | FabSCORE
Janssen, D.; Peissner, M.; Schlegel, T.; Schuntermann, J. | Konferenzbeitrag |
| 2004 | High-power, high-brightness GaInSb/AlGaAsSb quantum-well diode-lasers emitting at 1.9µm
Pfahler, C.; Manz, C.; Kaufel, G.; Kelemen, M.T.; Mikulla, M.; Wagner, J. | Konferenzbeitrag |
| 2004 | Influence of Mg doping profile on the electroluminescence properties of GaInN multiple quantum well light emitting diodes
Stephan, T.; Köhler, K.; Maier, M.; Kunzer, M.; Schlotter, P.; Wagner, J. | Konferenzbeitrag |
| 2004 | Infrared semiconductor lasers for sensing and diagnostics
Wagner, J.; Mann, C.; Rattunde, M.; Weimann, G. | Zeitschriftenaufsatz |
| 2004 | Linearisation issues in microwave amplifiers
O'Droma, M.S.; Portilla, J.; Bertran, E.; Donati, S.; Brazil, T.J.; Rupp, M.; Quay, R. | Konferenzbeitrag |
| 2004 | Lot release planning for customer oriented manufacturing
Löffler, B. | Konferenzbeitrag |
| 2004 | Using simulation as test tool in semiconductor industries
Wiechers, O.; Zehtaban, M.; Seidelmann, J. | Konferenzbeitrag |
| 2003 | High-brightness 1040 nm tapered diode laser
Kelemen, M.T.; Weber, J.; Rinner, F.; Rogg, J.; Mikulla, M.; Weimann, G. | Konferenzbeitrag |
| 2002 | 2K PL topography of silicon doped VGf-GaAs wafers
Baeumler, M.; Maier, M.; Herres, N.; Bünger, T.; Stenzenberger, J.; Jantz, W. | Zeitschriftenaufsatz |
| 2002 | Beam quality and linewidth enhancement factor of ridge-waveguide tapered diode lasers
Kelemen, M.T.; Weber, J.; Rogg, J.; Rinner, F.; Mikulla, M.; Weimann, G. | Konferenzbeitrag |
| 2002 | High-power high-brightness ridge-waveguide tapered diode lasers at 940 nm
Kelemen, M.T.; Rinner, F.; Rogg, J.; Wiedmann, N.; Kiefer, R.; Walther, M.; Mikulla, M.; Weimann, G. | Konferenzbeitrag |
| 2002 | Nanoscopic measurements of surface recombination velocity and diffusion length in a semiconductor quantum well
Malyarchuk, V.; Tomm, J.; Lienau, C.; Rinner, F.; Baeumler, M. | Zeitschriftenaufsatz |
| 2002 | Near-diffraction-limited high power diode laser tunable from 895 to 960 nm
Kelemen, M.T.; Rinner, F.; Rogg, J.; Kiefer, R.; Mikulla, M.; Weimann, G. | Konferenzbeitrag |