Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Exploring the Causes of Power-Converter Failure in Wind Turbines based on Comprehensive Field-Data and Damage Analysis
Fischer, Katharina; Pelka, Karoline; Puls, Sebastian; Poech, Max-Hermann; Mertens, Axel; Bartschat, Arne; Tegtmeier, Bernd; Broer, Christian; Wenske, Jan
Zeitschriftenaufsatz
2019Reliability of power converters in wind turbines: Exploratory analysis of failure and operating data from a worldwide turbine fleet
Fischer, Katharina; Pelka, Karoline; Bartschat, Arne; Tegtmeier, Bernd; Coronado, Diego; Broer, Christian; Wenske, Jan
Zeitschriftenaufsatz
2019Thermochemical Stress in Solar Cells: Contact Pad Modeling and Reliability Analysis
Rendler, L.; Romer, P.; Beinert, A.; Stecklum, S.; Kraft, A.; Eitner, U.; Wiese, S.
Zeitschriftenaufsatz
2018Assessing factors impacting on reliability of wind turbines by use of survival analysis - a case study
Ozturk, S.; Fthenakis, V.; Faulstich, S.
Zeitschriftenaufsatz
2018Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology
Dammann, Michael; Baeumler, Martina; Brueckner, Peter; Kemmer, Tobias; Konstanzer, Helmer; Graff, Andreas; Simon-Najasek, Michél; Quay, Rüdiger
Zeitschriftenaufsatz
2018Failure modes, effects and criticality analysis for wind turbines considering climatic regions and comparing geared and direct drive wind turbines
Ozturk, S.; Fthenakis, V.; Faulstich, S.
Zeitschriftenaufsatz
2018Focusing Requirements Elicitation by Using a UX Measurement Method
Ohashi, Kyoko; Katayama, Asako; Hasegawa, Naoki; Kurihara, Hidetoshi; Yamamoto, Rieko; Dörr, Jörg; Magin, Dominik Pascal
Konferenzbeitrag
2018Functional reliability of cognitive control systems for manufacturing processes
Permin, Eike; Lossie, Karl; Schmitt, Robert H.
Zeitschriftenaufsatz
2018Improving the error behavior of DRAM by exploiting its Z-channel property
Kraft, Kira; Sudarshan, Chirag; Mathew, Deepak M.; Weis, Christian; Wehn, Norbert; Jung, Matthias
Konferenzbeitrag
2018On the limits of scalpel AFM for the 3D electrical characterization of nanomaterials
Chen, Shaochuan; Jiang, Lanlan; Buckwell, Mark; Jing, Xu; Ji, Yanfeng; Grustan-Gutierrez, Enric; Hui, Fei; Shi, Yuanyuan; Rommel, Mathias; Paskaleva, Albena; Benstetter, Günther; Ng, Wing. H.; Mehonic, Adnan; Kenyon, Anthony J.; Lanza, Mario
Zeitschriftenaufsatz
2018Reliability analysis of encapsulated components in 3D-circuit board integration
Schwerz, Robert; Röllig, Mike; Wolter, Klaus-Jürgen
Konferenzbeitrag
2018Wave-Shaped Wires Soldered on the Finger Grid of Solar Cells: Solder Joint Stability under Thermal Cycling
Rendler, L.; Haryantho, A.P.; Walter, J.; Huyeng, J.; Kraft, A.; Wiese, S.; Eitner, U.
Konferenzbeitrag
201717. Wind Farm Data Collection and Reliability Assessment for O&M Optimization
Hahn, B.; Faulstich, S.
Bericht
2017Analysis of peel and shear forces after temperature cycle tests for electrical conductive adhesives
Hoffmann, S.; Geipel, T.; Meinert, M.; Kraft, A.
Konferenzbeitrag
2017Applying operational and event data to understand the turbine's performance and reliability behaviour
Faulstich, S.
Vortrag
2017Comparison of inline hot spot detection and evaluation algorithms for crystalline silicon solar cells
Wasmer, S.; Geisemeyer, I.; Pfengler, D.; Greulich, J.; Rein, S.
Konferenzbeitrag
2017Failure behaviour of power converters in wind turbines
Pelka, Karoline; Fischer, Katharina
Konferenzbeitrag
2017Formative evaluation of a tool for managing software quality
Guzman, Liliana; Vollmer, Anna Maria; Ciolkowski, Marcus; Gillmann, Michael
Konferenzbeitrag
2017Impact of individual pitch control on pitch actuators in megawatt wind turbines
Morisse, Marcel; Bartschat, Arne; Wenske, Jan; Mertens, Axel
Konferenzbeitrag
2017Know thy neighbor - a data-driven approach to neighborhood estimation in VANETs
Roscher, Karsten; Nitsche, Thomas; Knorr, Rudi
Konferenzbeitrag
2017Laser cuts increase the reliability of heavy-wire bonds and enable on-line process control using thermography
Middendorf, A.; Grams, A.; Janzen, S.; Lang, K.-D.; Wittler, O.
Zeitschriftenaufsatz
2017Optical stressing of 4H-SiC material and devices
Kallinger, Birgit; Kaminzky, Daniel; Berwian, Patrick; Friedrich, Jochen; Oppel, Steffen
Poster
2017Performance and failure analysis of concentrator solar cells after intensive stressing with thermal, electrical, and combined load
Eltermann, F.; Ziegler, L.; Wiesenfarth, M.; Wilde, J.; Bett, A.W.
Konferenzbeitrag
2017Performance and reliability of wind turbines: A review
Pfaffel, S.; Faulstich, S.; Rohrig, K.
Zeitschriftenaufsatz
2017Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications
Dammann, Michael; Baeumler, Martina; Polyakov, Vladimir M.; Brueckner, Peter; Konstanzer, Helmer; Quay, Rüdiger; Mikulla, Michael; Graff, Andreas; Simon-Najasek, M.
Zeitschriftenaufsatz
2017Safe adaptation for reliable and energy-efficient E/E architectures
Weiß, Gereon; Schleiß, Philipp; Drabek, Christian; Ruiz, Alejandra; Radermacher, Ansgar
Aufsatz in Buch
2017Standardized wind farm data collection and reliability assessment for O&M optimization
Berkhout, V.; Faulstich, S.; Hahn, B.
Vortrag
2017TPedge: Progress on cost-efficient and durable edge-sealed PV modules
Mittag, M.; Eitner, U.; Neff, T.
Konferenzbeitrag
2017Training the next generation of PV reliability experts - new Marie-Sklodowska Curie (MSCA) project SOLAR-TRAIN
Weiß, Karl-Anders; Saile, Sandrin; Keiner, A.; Bauermann, Pitta; Oreski, G.; Gottschalg, R.; Moser, D.; Topic, M.; Lagunas, A.R.; Chiantore, P.; Iseghem, M. van
Konferenzbeitrag
2017Ultra-soft wires for direct soldering on finger grids of solar cells
Rendler, L.C.; Walter, J.; Kraft, A.; Ebert, C.; Wiese, S.; Eitner, U.
Zeitschriftenaufsatz, Konferenzbeitrag
2016Experimental reliability studies and SPICE simulation for EEPROM at temperatures up to 450°C
Kelberer, Andreas; Dreiner, Stefan; Grella, Katharina; Dittrich, Dirk; Kappert, Holger; Vogt, Holger; Paschen, Uwe
Zeitschriftenaufsatz
2016Gaining certainty about uncertainty: Testing for uncertainties of cyber-physical systems at the application level
Schneider, Martin; Wendland, Marc-Florian; Bornemann, Leon
Vortrag
2016HOT-300 - a multidisciplinary technology approach targeting microelectronic systems at 300 °C operating temperature
Vogt, Holger; Altmann, Frank; Braun, Sebastian; Celik, Yusuf; Dietrich, Lothar; Dietz, Dorothee; Dijk, Marius van; Dreiner, Stefan; Döring, Ralf; Gabler, Felix; Goehlich, Andreas; Hutter, Matthias; Ihle, Martin; Kappert, Holger; Kordas, Norbert; Kokozinski, Rainer; Naumann, Falk; Nowak, Torsten; Oppermann, Hermann; Partsch, Uwe; Petzold, Matthias; Roscher, Frank; Rzepka, Sven; Schubert, Ralph; Weber, Constanze; Wiemer, Maik; Wittler, Olaf; Ziesche, Steffen
Konferenzbeitrag
2016Long-Term Stability Evaluation of Copper-Containing Contacts on Cell and Module Level
Kluska, S.
Konferenzbeitrag
2016Reliability of power converters in wind turbines: Results of a comprehensive field study
Fischer, K.; Bartschat, A.; Tegtmeier, B.; Coronado, D.; Broer, C.; Wenske, J.
Poster
2016Reliable message forwarding in VANETs for delay-sensitive applications
Roscher, Karsten; Maierbacher, Gerhard
Konferenzbeitrag
2016TPEDGE: Glass-glass photovoltaic module for BIPV-applications
Mittag, M.; Neff, T.; Hoffmann, S.; Ebert, M.; Eitner, U.; Wirth, H.
Konferenzbeitrag
2016Utilizing wind-turbine failure and operating data for root-cause analysis
Fischer, Katharina
Vortrag
2015Degradation of 0.25 μm GaN HEMTs under high temperature stress test
Dammann, M.; Baeumler, M.; Brückner, P.; Bronner, W.; Maroldt, S.; Konstanzer, H.; Wespel, M.; Quay, R.; Mikulla, M.; Graff, A.; Lorenzini, M.; Fagerlind, M.; Wel, P.J. van der; Roedle, T.
Zeitschriftenaufsatz
2015Experimental reliability studies and SPICE simulation for EEPROM at temperatures up to 450°C
Kelberer, Andreas; Dreiner, Stefan; Grella, Katharina; Dittrich, Dirk; Kappert, Holger; Vogt, Holger; Paschen, Uwe
Konferenzbeitrag
2015Experimental reliability studies and SPICE simulation for EEPROM at temperatures up to 450°C
Kelberer, Andreas; Dreiner, Stefan; Grella, Katharina; Dittrich, Dirk; Kappert, Holger; Vogt, Holger; Paschen, Uwe
Konferenzbeitrag, Zeitschriftenaufsatz
2015Failure mechanisms of microbolometer thermal imager sensors using chip-scale packaging
Elßner, Michael; Vogt, Holger
Zeitschriftenaufsatz, Konferenzbeitrag
2015Field-experience based root-cause analysis of power-converter failure in wind turbines
Fischer, Katharina; Stalin, Thomas; Ramberg, Hans; Wenske, Jan; Wetter, Göran; Karlsson, Robert; Thiringer, Torbjörn
Zeitschriftenaufsatz
2015In situ time-dependent dielectric breakdown in the transmission electron microscope: A possibility to understand the failure mechanism in microelectronic devices
Liao, Zhongquan; Gall, Martin; Yeap, Kong Boon; Sander, Christoph; Clausner, André; Mühle, Uwe; Gluch, Jürgen; Standke, Gisela; Aubel, Oliver; Beyer, Armand; Hauschildt, Meike; Zschech, Ehrenfried
Zeitschriftenaufsatz
2015Pattern-based approach for designing fail-operational safety-critical embedded systems
Penha, Dulcineia; Weiß, Gereon; Stante, Alexander
Konferenzbeitrag
2015Reliability of microbolometer thermal imager sensors using chip-scale packaging
Elßner, Michael; Vogt, Holger
Zeitschriftenaufsatz, Konferenzbeitrag
2015Towards reliable power converters for wind turbines: Field-data based identification of weak points and cost drivers
Fischer, Katharina; Wenske, Jan
Konferenzbeitrag
2015TPedge: Qualification of a gas-filled, encapsulation-free glass-glass photovoltaic module
Mittag, M.; Haedrich, I.; Neff, T.; Hoffmann, S.; Eitner, U.; Wirth, H.
Konferenzbeitrag
2015Utilizing LTE QoS features to provide a reliable access network for cyber-physical systems
Elattar, Mohammad; Dürkop, Lars; Jasperneite, Jürgen
Konferenzbeitrag
2015With electroluminescence microcopy towards more reliable AlGaN/GaN transistors
Baeumler, M.; Dammann, M.; Wespel, M.; George, R.; Konstanzer, H.; Maroldt, S.; Polyakov, V.M.; Müller, S.; Bronner, W.; Brueckner, P.; Benkhelifa, F.; Waltereit, P.; Quay, R.; Mikulla, M.; Wagner, J.; Ambacher, O.; Graff, A.; Altmann, F.; Simon-Najasek, M.; Lorenzini, M.; Fagerlind, M.; Wel, P. van der; Roedle, T.
Konferenzbeitrag
2014Challenges of a safe adaptation architecture for vehicles
Weiß, Gereon
Vortrag
2014Concept for simultaneous measurement of Seebeck coefficient, electrical conductivity and thermal conductivity
Nissila, J.; Jacquot, A.; Barb, Y.; Jägle, M.; Leppanen, M.; Manninen, A.
Konferenzbeitrag
2014Fraunhofer cluster 3D integration - key to a holistic technology and service approach
Wolf, Jürgen M.; Schulz, Stefan; Schneider, Peter; Zschech, Ehrenfried
Konferenzbeitrag
2014Increasing the lifetime of electronic packaging by higher temperatures: Solders vs. silver sintering
Hutzler, Aaron; Tokarski, Adam; Kraft, Silke; Zischler, Sigrid; Schletz, Andreas
Konferenzbeitrag
2014Increasing the lifetime of power modules by smaller bond wire diameters
Hutzler, Aaron; Wright, Alan; Schletz, Andreas
Vortrag
2014Influence of surface states on the voltage robustness of AlGaN/GaN HFET power devices
Wespel, M.; Dammann, M.; Baeumler, M.; Polyakov, V.M.; Reiner, R.; Waltereit, P.; Quay, R.; Mikulla, M.; Ambacher, O.
Konferenzbeitrag
2014Inline processes for the stabilization of p-type crystalline Si solar cells against potential-induced degradation
Nagel, N.; Saint-Cast, P.; Glatthaar, M.; Glunz, S.W.
Konferenzbeitrag
2014Microscopic-scale investigation of the degradation of InGaN-based laser diodes submitted to electrical stress
Meneghini, M.; Carraro, S.; Meneghesso, G.; Trivellin, N.; Mura, G.; Rossi, F.; Salviati, G.; Holc, K.; Weig, T.; Schade, L.; Karunakaran, M.A.; Wagner, J.; Schwarz, U.T.; Zanoni, E.
Konferenzbeitrag
2014Power cycling community 1995-2014 - an overview of test results over the last 20 years
Hutzler, Aaron; Zeyss, Felix; Vater, Stephan; Tokarski, Adam; Schletz, Andreas; März, Martin
Zeitschriftenaufsatz
2014Structural health assessment of in situ timber: An interface between service life planning and timber engineering
Kasal, B.
Zeitschriftenaufsatz, Konferenzbeitrag
2014Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage
Santi, C. de; Meneghini, M.; Marioli, M.; Buffolo, M.; Trivellin, N.; Weig, T.; Holc, K.; Köhler, K.; Wagner, J.; Schwarz, U.T.; Meneghesso, G.; Zanoni, E.
Zeitschriftenaufsatz, Konferenzbeitrag
2014Towards increased reliability of power converters in wind turbines
Fischer, K.
Vortrag
2013Engineering autonomous systems
Serbedzija, Nikola; Bures, Tomas; Keznikl, Jaroslav
Konferenzbeitrag
2013Modeling the leakage current for potential induced degradation
Hoffmann, S.; Köhl, M.
Konferenzbeitrag
2013Multiscale microstructures and microstructural effects on the reliability of microbumps in three-dimensional integration
Huang, Zhiheng; Xiong, Hua; Wu, Zhiyong; Conway, Paul; Altmann, Frank
Zeitschriftenaufsatz
2013Optimized electrode and interface for enhanced reliability of high-k based metal-insulator-metal capacitors
Koch, Johannes; Seidel, Konrad; Weinreich, Wenke; Riedel, Stefan; Chiang, Jung-Chin; Beyer, Volkhard
Zeitschriftenaufsatz
2013Performance optimization of an adaptive vibration absorber using a design to reliability approach
Pfeiffer, Thomas; Janssen, Enrico; Nuffer, Jürgen; Melz, T.
Konferenzbeitrag
2013Potential-induced degradation on cell level: The inversion model
Saint-Cast, P.; Nagel, H.; Wagenmann, D.; Schön, J.; Schmitt, P.; Reichel, C.; Glunz, S.W.; Hofmann, M.; Rentsch, J.; Preu, R.
Konferenzbeitrag
2013Reliability of power electronic systems in wind turbines - Damage types in frequency converters
Fischer, K.
Vortrag
2013Structural health assessment of in-situ timber
Kasal, B.
Konferenzbeitrag
2013Submicron-AlGaN/GaN MMICs for space applications
Quay, R.; Waltereit, P.; Kühn, J.; Brueckner, P.; Heijningen, M. van; Jukkala, P.; Hirche, K.; Ambacher, O.
Konferenzbeitrag
2012A Bayesian logistic regression model for binomial failure data
Kempf, Michael
Konferenzbeitrag
2012Chemometric tools for analysing Terahertz fingerprints in a postscanner
Ellrich, Frank; Torosyan, Garik; Wohnsiedler, Sabine; Bachtler, Sebastian; Hachimi, A.; Jonuscheit, Joachim; Beigang, René; Platte, F.; Nalpantidis, K.; Sprenger, T.; Hübsch, D.
Konferenzbeitrag
2012Developing a model for the bond heel lifetime prediction of thick aluminium wire bonds
Merkle, L.; Sonner, M.; Petzold, M.
Zeitschriftenaufsatz
2012Efficient planar SOFC technology for a portable power generator
Poenicke, A.; Reuber, S.; Dosch, C.; Megel, S.; Kusnezoff, M.; Wunderlich, C.; Michaelis, A.
Konferenzbeitrag
2012Feasiblity and limitations of anti-fuses based on bistable non-volatile switches for power electronic applications
Erlbacher, Tobias; Hürner A.; Bauer, Anton J.; Frey, Lothar
Zeitschriftenaufsatz
2012GaN-based high-frequency devices and circuits: A Fraunhofer perspective
Waltereit, P.; Bronner, W.; Quay, R.; Dammann, M.; Cäsar, M.; Müller, S.; Raay, F. van; Kiefer, R.; Brueckner, P.; Kühn, J.; Musser, M.; Kirste, L.; Haupt, C.; Pletschen, W.; Lim, T.; Aidam, R.; Mikulla, M.; Ambacher, O.
Zeitschriftenaufsatz
2012High efficiency X-band AlGaN/GaN MMICs for space applications with lifetimes above 10(5) hours
Waltereit, P.; Kühn, J.; Quay, R.; Raay, F. van; Dammann, M.; Cäsar, M.; Müller, S.; Mikulla, M.; Ambacher, O.; Lätti, J.; Rostewitz, M.; Hirche, K.; Däubler, J.
Konferenzbeitrag
2012How to achieve and measure quality in multi-core systems
Hupp, Steffen
: Rombach, H. Dieter (Supervisor); Lampasona, Constanza (Supervisor)
Bachelor Thesis
2012Improving module performance and reliability in power electronic applications by monolithic integration of RC-snubbers
Erlbacher, Tobias; Schwarzmann, Holger; Bauer, Anton J.; Berberich, Sven E.; Dorp, Joachim vom; Frey, Lothar
Konferenzbeitrag
2012Interdependency of mechanical failure rate of encapsulated solar cells and module design parameters
Dietrich, S.; Sander, M.; Pander, M.; Ebert, M.
Konferenzbeitrag
2012Investigations on cracks in embedded solar cells after thermal and mechanical loading
Sander, M.; Dietrich, S.; Pander, M.; Ebert, M.; Thormann, S.; Wendt, J.; Bagdahn, J.
Konferenzbeitrag
2012Portable 100 W power generator based on efficient planar SOFC technology
Pönicke, Andreas; Reuber, Sebastian; Dosch, Christian; Megel, Stefan; Kusnezoff, Mihails; Wunderlich, Christian; Michaelis, Alexander
Vortrag
2012Portable 100W power generator based on efficient planar SOFC technology
Reuber, S.; Pönicke, A.; Wunderlich, C.; Michaelis, A.
Vortrag
2012Properties and reliability of silicon nitride substrates with AMB copper conductor
Böhm, G.; Brunner, D.; Sichert, I.; Pönicke, A.; Schilm, J.
Konferenzbeitrag
2012Safe product design - the role of the NDE reliability analysis
Pavlovic, Mato; Ronneteg, Ulf; Müller, Christina; Ewert, Uwe; Boller, Christian
Konferenzbeitrag
2012Trade-offs between performance and reliability in AlGaN/GaN transistors
Waltereit, P.; Bronner, W.; Kiefer, R.; Quay, R.; Dammann, M.; Cäsar, M.; Brueckner, P.; Müller, S.; Mikulla, M.; Ambacher, O.
Zeitschriftenaufsatz, Konferenzbeitrag
2011Approaching runtime trust assurance in open adaptive systems
Schneider, Daniel; Becker, Martin; Trapp, Mario
Konferenzbeitrag
2011Approaching runtime trust assurance in open adaptive systems
Schneider, Daniel; Becker, Martin; Trapp, Mario
Bericht
2011Characterization of reliability
Nuffer, Jürgen; Flaschenträger, D.; Janssen, Enrico; Hoffmann, D.; Gäng, J.
Aufsatz in Buch
2011A collaborative reliability database for maintenance optimisation
Faulstich, S.; Lyding, P.; Hahn, B.; Brune, D.
Konferenzbeitrag
2011From epitaxy to backside process: Reproducible AlGaN/GaN HEMT technology for reliable and rugged power devices
Bronner, W.; Waltereit, P.; Müller, S.; Dammann, M.; Kiefer, R.; Dennler, P.; Raay, F. van; Musser, M.; Quay, R.; Mikulla, M.; Ambacher, O.
Konferenzbeitrag
2011High temperature reliability investigations of EEPROM memory cells realised in Silicon-on-Insulator (SOI) technology
Grella, K.; Vogt, H.; Paschen, U.
Konferenzbeitrag
2011Integrating mobile devices into the car ecosystem - tablets and smartphones as vital part of the car
Hess, Steffen; Meschtscherjakov, Alexander; Ronneberger, Torsten; Trapp, Marcus
Konferenzbeitrag
2011Light switched plasma charging protection device for high-field characterization and flash memory protection
Sommer, S.P.; Paschen, U.; Figge, M.; Vogt, H.
Zeitschriftenaufsatz
2011Offshore~WMEP - monitoring offshore wind energy use
Faulstich, S.; Lyding, P.; Hahn, B.; Lopez, S.
Konferenzbeitrag
2011Wind turbine downtime and its importance for offshore deployment
Faulstich, S.; Hahn, B.; Tavner, P.J.
Zeitschriftenaufsatz
2010AlGaN/GaN epitaxy and technology
Waltereit, P.; Bronner, W.; Quay, R.; Dammann, M.; Kiefer, R.; Pletschen, W.; Müller, S.; Aidam, R.; Menner, H.; Kirste, L.; Köhler, K.; Mikulla, M.; Ambacher, O.
Zeitschriftenaufsatz
2010A Bayesian reliability model for failure count data
Kempf, Michael
Konferenzbeitrag
2010Component-based modeling and verification of dynamic adaptation in safety-critical embedded systems
Adler, Rasmus; Schäfer, Ina; Trapp, Mario; Poetzsch-Heffter, Arnd
Zeitschriftenaufsatz
2010Conditional safety certificates in open systems
Schneider, Daniel; Trapp, Mario
Konferenzbeitrag
2010Data-mining-based link failure detection for wireless mesh networks
Lindhorst, Timo; Lukas, Georg; Nett, Edgar; Mock, Michael
Konferenzbeitrag
2010Degradation of sealing glasses under electrical load
Rost, A.; Schilm, J.; Kusnezoff, M.; Michaelis, A.
Konferenzbeitrag
2010Development of rugged 2 GHz power bars delivering more than 100 W and 60% power added efficiency
Waltereit, P.; Bronner, W.; Quay, R.; Dammann, M.; Müller, S.; Mikulla, M.; Ambacher, O.; Harm, L.; Lorenzini, M.; Rödle, T.; Riepe, K.; Bellmann, K.; Buchheim, C.; Goldhahn, R.
Zeitschriftenaufsatz, Konferenzbeitrag
2010Entwickungsbegleitendes, domänenübergreifendes Zuverlässigkeitsmodell
Kempf, Michael; Rauschenbach, Matthias
Konferenzbeitrag
2010Fault tolerant sequential control
Neugebauer, Reimund; Barthel, S.; Richter, M.
Konferenzbeitrag
2010High efficiency and low leakage AlGaN/GaN HEMTs for a robust, reproducible and reliable X-band MMIC space technology
Waltereit, P.; Bronner, W.; Kiefer, R.; Quay, R.; Kühn, J.; Raay, F. van; Dammann, M.; Müller, S.; Libal, C.; Meier, T.; Mikulla, M.; Ambacher, O.
Konferenzbeitrag
2010Reliability of intralogistics-systems - oversizing or maintenance
Wenzel, S.; Köpcke, C.; Bandow, G.
Konferenzbeitrag
2010Reliability status of GaN transistors and MMICs in Europe
Dammann, M.; Cäsar, M.; Konstanzer, H.; Waltereit, P.; Quay, R.; Bronner, W.; Kiefer, R.; Müller, S.; Mikulla, M.; Wel, P.J. van der; Rödle, T.; Bourgeois, F.; Riepe, K.
Konferenzbeitrag
2010Reliable component fatigue design applying appropriate cyclic properties
Amos, D.; Delarbre, P.; Lipp, K.; Kaufmann, H.
Konferenzbeitrag
2010Softwarequalität in medizinischen Produkten sichern
Eschbach, Robert; Rosbach, Alla
Zeitschriftenaufsatz
2010A survey to control unvertainties by comprehensive monitoring of load-carrying structures
Koenen, J.F.; Platz, R.; Hanselka, H.
Konferenzbeitrag
2010Transparent combination of expert and measurement data for defect prediction - an industrial case study
Kläs, Michael; Elberzhager, Frank; Münch, Jürgen; Hartjes, Klaus; Graevemeyer, Olaf von
Bericht
2009Advanced failure analysis methods and microstructural investigations of wire bond contacts for current microelectronic system
Klengel, R.; Bennemann, S.; Petzold, M.
Konferenzbeitrag
2009Design of reliable circuits by determination of SOA borders as part of the degradation analysis
Jancke, R.; Ellmers, C.; Gaertner, R.
Konferenzbeitrag
2009Influence of cyclic loading and temperature on integrity of piezoceramic patch transducers
Gall, M.; Thielicke, B.
Konferenzbeitrag
2009Komposition von Benutzungsmodellen: Anforderungen und Konzeption
Bauer, Thomas; Eschbach, Robert; Hussain, Tanvir; Kloos, Johannes; Zimmermann, Fabian
Bericht
2009Komposition von Benutzungsmodellen: Operatoren und Anwendungsbeispiele
Bauer, Thomas; Eschbach, Robert; Hussain, Tanvir; Kloos, Johannes; Zimmermann, Fabian
Bericht
2009Oversizing or maintenance
Wenzel, S.; Bandow, G.
Konferenzbeitrag
2009Packaging influence on laser bars of different dimensions
Westphalen, T.; Leers, M.; Werner, M.; Traub, M.; Hoffmann, H.-D.; Ostendorf, R.
Konferenzbeitrag
2009Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems
Dammann, M.; Pletschen, W.; Waltereit, P.; Bronner, W.; Quay, R.; Müller, S.; Mikulla, M.; Ambacher, O.; Wel, P.J. van der; Murad, S.; Rödle, T.; Behtash, R.; Bourgeois, F.; Riepe, K.; Fagerlind, M.; Sveinbjörnsson, E.Ö.
Zeitschriftenaufsatz, Konferenzbeitrag
2009Reliability and effective signal-to-noise ratio of RuO(sub 2)-based thick film strain gauges
Dietrich, S.; Kretzschmar, C.; Partsch, U.; Rebenklau, L.
Konferenzbeitrag
2009Reliability consideration of low-power-grid-tied inverter for photovoltaic application
Liu, J.; Henze, N.
Konferenzbeitrag
2009Reliability of AlGaN/GaN HEMTs under DC- and RF-operation
Dammann, Michael; Cäsar, M.; Waltereit, Patrick; Bronner, Wolfgang; Konstanzer, Helmer; Quay, Rüdiger; Müller, Stefan; Mikulla, Michael; Ambacher, O.; Wel, P. van der; Rödle, T.; Behtash, R.; Bourgeois, F.; Riepe, K.
Konferenzbeitrag
2008Assembly of ASICs for high temperature applications - material characterization and reliability testing
Klieber, R.; Trieu, H.-K.
Konferenzbeitrag
2008A Bayesian approach for estimating survival probabilities
Kempf, Michael
Konferenzbeitrag
2008Berücksichtigung von Streuungen in der simulationsgeschützten Funktions- und Zuverlässigkeitsanalyse
Jöckel, M.; Bruder, T.
Konferenzbeitrag
2008Component engineering for adaptive Ad-hoc systems
Peper, Christian; Schneider, Daniel
Konferenzbeitrag
2008DC-arc behavior of a novel active fuse
Dorp, J. vom; Berberich, S.E.; Bauer, A.J.; Ryssel, H.
Konferenzbeitrag
2008Development of test procedures for polymer material characterization in view of long-term durability of PV-modules
Schulze, S.-H.; Dietrich, S.; Ebert, M.; Bagdahn, J.
Konferenzbeitrag
2008High-efficiency GaN HEMTs on 3-inch semi-insulating SiC substrates
Waltereit, P.; Bronner, W.; Quay, R.; Dammann, M.; Müller, S.; Kiefer, R.; Raynor, B.; Mikulla, M.; Weimann, G.
Zeitschriftenaufsatz
2008Managing software quality through a hybrid defect content and effectiveness model
Kläs, Michael; Elberzhager, Frank; Nakao, Haruka
Konferenzbeitrag
2008Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems
Dammann, M.; Pletschen, W.; Waltereit, P.; Bronner, W.; Quay, R.; Müller, S.; Mikulla, M.; Ambacher, O.; Wel, P.J. van der; Murad, S.; Rödle, T.; Behtash, R.; Bourgeois, F.; Riepe, K.; Fagerlind, M.; Sveinbjörnsson, E.Ö.
Konferenzbeitrag
2008Reliability investigation of an automotive oil pan equipped with active noise reduction
Nuffer, J.; Pfeiffer, T.; Flaschenträger, D.
Konferenzbeitrag
2008Reliability-based generation and view synthesis in layered depth video
Müller, K.; Smolic, A.; Dix, K.; Kauff, P.; Wiegand, T.
Konferenzbeitrag
2008Structural durability of welded constructions - safety and reliability aspects in fatigue life assessment of offshore tubular structures
Sonsino, C.M.
Konferenzbeitrag
2008Structural health monitoring of fiber components
Lehmann, M.; Büter, A.; Hanselka, H.; Haase, K.-H.
Konferenzbeitrag
2008A uniform, reproducible and reliable GaN HEMT technology with breakdown voltages in excess of 160 V delivering more than 60% PAE at 80 V
Waltereit, P.; Bronner, W.; Quay, R.; Dammann, M.; Müller, S.; Kiefer, R.; Walcher, H.; Raay, F. van; Kappeler, O.; Mikulla, M. et al.
Konferenzbeitrag
2007Comparison of test methods for strength characterization of thin solar wafer
Schönfelder, S.; Bohne, A.; Bagdahn, J.
Konferenzbeitrag
2007Development of safe and reliable embedded systems using dynamic adaptation
Adler, Rasmus; Schneider, Daniel; Trapp, Mario
Konferenzbeitrag
2007Examination of reliability of piezoelektric cantilever beams
Platz, R.
Konferenzbeitrag
2007Fracture strength of SOI springs in MEMS micromirrors
Hsu, S.-T.; Wolter, A.; Owe, W.-D.; Schenk, H.
Konferenzbeitrag
2007High temperature reliability of organic light emitting diodes
Lesiuk, P.
Diplomarbeit
2007Life-span investigations of piezoceramic patch sensors and actuators
Gall, M.; Thielicke, B.
Konferenzbeitrag
2007Lötbarkeit und Zuverlässigkeit bleifreier Leiterplatten-Oberflächen
Pape, U.
Vortrag
2007Non-destructive failure analysis and modeling of encapsulated miniature SMD ceramic chip capacitors under thermal and mechanical loading
Wunderle, B.; Braun, T.; May, D.; Mazloum, A.; Bouazza, M.; Walter, H.; Wittier, O.; Schacht, R.; Becker, K.-F.; Schneider-Ramelow, M.; Michel, B.; Reichl, H.
Konferenzbeitrag
2007Reliability investigation of piezoelectric macro fibre composite (MFC) actuators
Nuffer, J.; Schönecker, A.; Brückner, B.; Kohlrautz, D.; Michelis, P.; Adarraga, O.; Wolf, K.
Konferenzbeitrag
2007Reliabilty prediction with the aid of bayesian statistics
Kempf, Michael
Konferenzbeitrag
2006A bayesian approach assessing the availability of technical systems under different operating conditions throughout their life cycle
Mannuß, O.; Schneider, S.; Kempf, M.; Westkämper, E.
Konferenzbeitrag
2006Characterization of reliability
Nuffer, J.; Hanselka, H.
Aufsatz in Buch
2006Condition - Monitoring - System für die Strukturüberwachung
Schubert, L.; Frankenstein, B.
Konferenzbeitrag
2006Drop simulation and stress analysis of MEMS devices
Hauck, T.; Li, G.; McNeill, A.; Knoll, H.; Ebert, M.; Bagdahn, J.
Konferenzbeitrag
2006Dynamische Adaption für die Entwicklung verlässlicher Softwaresysteme im Automobil
Trapp, M.; Schäfer, C.; Robinson-Mallett, C.
Konferenzbeitrag
2006Fracture mechanical life-time investigation of glass-frit bonded MEMS sensors
Petzold, M.; Dresbach, C.; Ebert, M.; Bagdahn, J.; Wiemer, M.; Glien, K.; Graf, J.; Müller-Fiedler, R.; Höfer, H.
Konferenzbeitrag
2006Intermetallic compound formation In Au/Al thermosonic wire bonding during high temperature annealing at 150 °C as a function of wire material
Klengel, R.; Knoll, H.; Petzold, M.; Wohnig, M.; Schräpler, L.
Konferenzbeitrag
2006Methoden zur Zuverlässigkeitsqualifizierung neuer Technologien in der Aufbau- und Verbindungstechnik
Wilde, J.; Schneider-Ramelow, M.; Petzold, M.
: Scheel, W.
Buch
2006Physical domain modeling for the development of dependable embedded systems
Domis, D.J.; Schäfer, C.; Trapp, M.
Konferenzbeitrag
2006Technologies and reliability of modern embedded flash cells
Sikora, A.; Pesl, F.-P.; Unger, W.; Paschen, U.
Zeitschriftenaufsatz
2006Untersuchung der Zuverlässigkeit hochtemperaturgeeigneter Baugruppen
Pape, U.; Nowottnick, M.; Rittner, M.; Neher, W.
Konferenzbeitrag
2006Vibration control with adaptive structures
Hanselka, H.; Melz, T.; Drossel, W.-G.; Sporn, D.; Schönecker, A.; Poigné, A.
Konferenzbeitrag
2006Zuverlässigkeit stoffschlüssiger Fügeverbindungen für Hochtemperatur-Elektronikbaugruppen
Nowottnick, M.
Habilitationsschrift
2005Bewertung der Ergebnisse und Simulation der Zuverlässigkeit
Nowottnick, M.; Pape, U.; Neher, W.
Aufsatz in Buch
2005Condition monitoring of automotive electronic systems with life cycle units
Middendorf, A.; Griese, H.; Hulsken, G.; Neß, O.; Reichl, H.; Schrank, K.
Konferenzbeitrag, Zeitschriftenaufsatz
2005A coplanar X-band AlGaN/GaN power amplifier MMIC on s.i. SiC substrate
Raay, F. van; Quay, R.; Kiefer, R.; Benkhelifa, F.; Raynor, B.; Pletschen, W.; Kuri, M.; Massler, H.; Müller, S.; Dammann, M.; Mikulla, M.; Schlechtweg, M.; Weimann, G.
Zeitschriftenaufsatz
2005Embroidering electrical interconnects with conductive yarn for the integration of flexible electronic modules into fabric
Linz, Torsten; Kallmayer, C.
Konferenzbeitrag
2005Globalization in automotive industry and product reliability
Grubisic, V.
Konferenzbeitrag
2005Making reliability statements for technical systems under different environmental conditions - an application of Bayesian networks
Schneider, S.; Kempf, M.
Konferenzbeitrag
2005Mechanical failure behavior of glass frit bondet structures
Ebert, M.; Dresbach, C.; Krombholz, A.; Bagdahn, J.; Glien, K.; Graf, J.; Müller-Fiedler, R.; Hofer, H.
Konferenzbeitrag
2005Niedrigtemperaturmontage hochintegrierter elektronischer Baugruppen durch selektive Mikrowellenerwärmung
Pape, U.; Nowottnick, M.; Diehm, R.
Poster
2005NON-destructive strength testing of anodic bonded glass-silicon wafer compounds
Knechtel, R.; Knaup, M.; Bagdahn, J.; Wiemer, M.
Konferenzbeitrag
2005Reliability of wafer bonding in microsystem technologies
Bagdahn, J.
Konferenzbeitrag
2005Sensor modules for structural health monitoring and reliability of components
Kröning, M.; Berthold, A.; Meyendorf, N.
Konferenzbeitrag
2005Software reliability growth prediction - state of the art
Apel, S.
Bericht
2004Fuel cell based drive trains in public transport
Jonas, K.; Schneider, M.; Klingner, M.
Konferenzbeitrag
2004Performance and thermo-mechanical reliability of micro-channel coolers - a parametric study
Wunderle, B.; Schacht, R.; Wittler, O.; Michel, B.; Reichl, H.
Konferenzbeitrag
2004Qualität im Automobil: Systematische Definition nichtfunktionaler Anforderungen
Doerr, J.; Olsson, T.; Schmid, K.
Konferenzbeitrag
2004Reliability of active systems - an essential design aspect for commercial success
Büter, A.; Melz, T.; Hanselka, H.
Konferenzbeitrag
2003A coplanar 94 GHz low-noise amplifier MMIC using 0.07 µm metamorphic cascode HEMTs
Tessmann, A.; Leuther, A.; Schwörer, C.; Massler, H.; Kudszus, S.; Reinert, W.; Schlechtweg, M.
Konferenzbeitrag
2003Fatigue of polycrystalline silicon under long-term cyclic loading
Bagdahn, J.; Sharpe, W.N.
Zeitschriftenaufsatz
2003Metamorphic HEMT technologies for millimeter-wave low-noise applications
Tessmann, A.; Leuther, A.; Massler, H.; Reinert, W.; Schwörer, C.; Dammann, M.; Walther, M.; Schlechtweg, M.; Weimann, G.
Konferenzbeitrag
2003Reliability and degradation mechanism of AlGaAs/InGaAs and InAlAs/InGaAs HEMTs
Dammann, M.; Leuther, A.; Benkhelifa, F.; Feltgen, T.; Jantz, W.
Zeitschriftenaufsatz
2003Reliability of piezoceramic patch sensors under cyclic mechanical loading
Thielicke, B.; Gesang, T.; Wierach, P.
Zeitschriftenaufsatz
2003Von Störungen und Ausfällen zur Zuverlässigkeit
Stender, S.
Konferenzbeitrag
2002Flip chip molding - highly reliable flip chip encapsulation
Braun, T.; Becker, K.F.; Koch, M.; Bader, V.; Aschenbrenner, R.; Reichl, H.
Konferenzbeitrag
2002High-field step-stress and long term stability of PHEMTs with different gate and recess lengths
Cova, P.; Menozzi, R.; Dammann, M.; Feltgen, T.; Jantz, W.
Zeitschriftenaufsatz
2002High-reliability MOCVD-grown quantum dot laser
Sellin, R.L.; Ribbat, C.; Bimberg, D.; Rinner, F.; Konstanzer, H.; Kelemen, M.T.; Mikulla, M.
Zeitschriftenaufsatz
2002Mechanical and electrical failures and reliability of micro scanning mirrors
Gaumont, E.; Wolter, A.; Schenk, H.; Georgelin, G.; Schmoger, M.
Konferenzbeitrag
2002Numerical and experimental verification of structural durability for safety components - analogy motorcar/train
Büter, A.; Fischer, G.; Störzel, K.; Weber, C.
Konferenzbeitrag
2002Reliability assessment of flip-chip assemblies with lead-free solder joints
Schubert, A.; Dudek, R.; Walter, H.; Jung, E.; Gollhardt, A.; Michel, B.; Reichl, H.
Konferenzbeitrag
2002Reliability of metamorphic HEMTs for power applications
Dammann, M.; Benkhelifa, F.; Meng, M.; Jantz, W.
Zeitschriftenaufsatz
2002Simultaneous flip chip underfill and encapsulation
Becker, K.F.; Braun, T.; Adams, T.
Zeitschriftenaufsatz
2001Fatigue Design, Testing and Relability of Ceramic Components by the Example of Intake and Exhaust Valves
Sonsino, C.M.
Konferenzbeitrag
2000Analysis of HBT behavior after strong electrothermal stress
Palankovski, V.; Selberherr, S.; Quay, R.; Schultheis, R.
Konferenzbeitrag
2000Digital signatures for interactive web services
Hirsch, C.
Bericht
2000Effect of drain voltage on channel temperature and reliability of pseudomorphic InP-based HEMTs
Dammann, M.; Chertouk, M.; Jantz, W.; Köhler, K.; Marsetz, W.; Schmidt, K.; Weimann, G.
Zeitschriftenaufsatz
2000Reliability of InAlAs/InGaAs HEMTs grown on GaAs substrate with metamorphic buffer
Dammann, M.; Chertouk, M.; Jantz, W.; Köhler, K.; Weimann, G.
Zeitschriftenaufsatz
2000Strength analysis of a micromechanical acceleration sensor by fracture mechanical approaches
Bagdahn, J.; Petzold, M.; Seidel, H.
Konferenzbeitrag
1999Disparity/segmentation analysis: Matching with an adaptive window and depth-driven segmentation
Izquierdo, E.
Zeitschriftenaufsatz
1999Fabrication and characterization of high power diode lasers
Jandeleit, J.; Wiedmann, N.; Ostlender, A.; Brandenburg, W.; Loosen, P.; Poprawe, R.
Konferenzbeitrag
1999Moderne Entwicklungsprozesse sichern Wirtschaftlichkeit und Zuverlässigkeit
Sonsino, C.M.
Konferenzbeitrag
1999Passivated 0,15 mu m InAlAs/InGaAs HEMTs with 500 GHz f(max). HF performance, thermal stability and reliability
Chertouk, M.; Dammann, M.; Massler, M.; Köhler, K.; Weimann, G.
Konferenzbeitrag
1999Probabilistic fracture mechanics approach to pressure vessel reliability evaluation
Cioclov, D.; Kröning, M.
Konferenzbeitrag
1999Reliability of passivated 0.15 mu m InAlAs/InGaAs HEMT's with pseudomorphic channel
Dammann, M.; Chertouk, M.; Jantz, W.; Köhler, K.; Schmidt, K.H.; Weimann, G.
Konferenzbeitrag
1999Sicherheit und Zuverlässigkeit durch präventive Anlagensimulation
Putz, M.; Naumann, B.; Noack, S.
Konferenzbeitrag
1999Towards the re-use of electronic products-quality assurance for the re-use of electronics
Potter, H.; Griese, H.; Middendorf, A.; Fotheringham, G.; Reichl, H.
Konferenzbeitrag
1998Advantages of Al-free GaInP/InGaAs PHEMTs for power applications
Chertouk, M.; Bürkner, S.; Bachem, K.H.; Pletschen, W.; Kraus, S.; Braunstein, J.; Tränkle, G.
Zeitschriftenaufsatz
1998Comparison of procedures for experimental and theoretical durability approval of a truck axle
Dini, A.; Rupp, A.
Bericht
1998Effect of atmosphere on reliability of passivated 0.15 mu m InAlAs/InGaAs HEMTs
Dammann, M.; Chertouk, M.; Jantz, W.; Köhler, K.; Schmidt, K.H.; Weimann, G.
Zeitschriftenaufsatz
1998Fatigue design and testing of components
Sonsino, C.M.
Konferenzbeitrag
1998Fatigue design and testing of components
Sonsino, C.M.
Konferenzbeitrag
1998Fatigue design. Testing, quality reliability and safety on the example of automotive PM' components
Sonsino, C.M.
Konferenzbeitrag
1998Früherkennung sicherheitsrelevanter Betriebszustände in Chemieanlagen mit neuronalen Netzen
Neumann, J.; Deerberg, G.; Schlüter, S.
Konferenzbeitrag
1998GaInP/GaInAs/GaAs-MODFETs with pseudomorphic GaInP barriers, device concept and device properties
Pletschen, W.; Bachem, K.H.; Chertouk, M.; Bürkner, S.; Braunstein, J.
Konferenzbeitrag
1998Realisierung von Transaktionen innerhalb von C/S-Systemen am Beispiel eines Workflow-Management-Systems
Messer, B.
Konferenzbeitrag
1998Service-like durability approval of wheelsets
Fischer, G.; Grubisic, V.
Konferenzbeitrag
1997Kosten/Nutzen-Analyse von GQM-basiertem Messen und Bewerten. Eine replizierte Fallstudie
Gresse, C.; Hoisl, B.; Rombach, H.D.; Ruhe, G.
Konferenzbeitrag
1997Long-range high-reliability telemetry in unlicensed frequency bands
Mayer, F.; Perthold, R.
Konferenzbeitrag
1997Materials mechanics and mechanical reliability of flip chip assemblies on organics substrates
Schubert, A.; Dudek, R.; Michel, B.; Reichl, H.; Jiang, H.
Konferenzbeitrag
1997Materials mechanics and mechanical reliability of flip chip assemblies on organics substrates
Schubert, A.; Dudek, R.; Vogel, D.; Michel, B.; Reichl, H.
Zeitschriftenaufsatz
1997Methodology for effective design evaluation and durability approval of car suspension components
Grubisic, V.; Fischer, G.
Bericht
1997Probabilistic Assessment of Failure Risk in Load-Bearing Components
Cioclov, D.; Kröning, M.; Schmitz, V.
Konferenzbeitrag
1997Schädigungsproportionale Beschreibung von Lastfolgen mit veränderlichen Mittellasten. Das Trennverfahren
Oppermann, H.
Buch
1996An Instrument for Measuring the Success of the Requirements Engineering Process in Information Systems Development
Emam, K. el; Madhavji, N.H.
Zeitschriftenaufsatz
1996Reliability investigations of different bumping processes for flip chip and TAB applications
Jung, E.; Klöser, J.; Nave, J.; Engelmann, G.; Dietrich, L.; Zakel, E.; Reichl, H.
Konferenzbeitrag
1996Trends of photonic communications networks
Baack, C.
Zeitschriftenaufsatz
1995Flip chip soldering on printed wining boards using vapor phase reflow
Jung, E.; Eldring, J.; Ostmann, A.; Zakel, E.; Reichl, H.; Klöser, J.
Konferenzbeitrag
1995A novel resistor system for AlN
Kretzschmar, C.; Otschik, P.; Schoene, F.; Jaenicke-Rößler, K.
Konferenzbeitrag
1995Reliability governing factors of various dielectrics
Otschik, P.; Kretzschmar, C.; Keitel, U.
Konferenzbeitrag
1994A CMD-only reproducible field degradation and its reliability aspect
Gieser, H.A.; Egger, P.; Reiner, J.C.; Herrmann, M.R.
Konferenzbeitrag
1994Schadensanalyse des Dielektrikums - DP5704
Otschik, P.; Kretschmar, C.; Obenaus, P.
Buch
1993Mehrlagenmetallisierung für hochintegrierte mikroelektronische Schaltungen
Vogt, H.
Habilitationsschrift
1993Reliability assurance of railroad wheels by ultrasonic stress analysis
Schneider, E.; Bruche, D.; Frotscher, H.; Herzer, H.-R.
Konferenzbeitrag
1993Tasks of Non-Destructive Testing
Dobmann, G.; Kröning, M.
Konferenzbeitrag
1992Motion compensated interpolation for advanced standards conversion and noise reduction
Ernst, M.
Konferenzbeitrag
1992Surface remelting and alloying of Al-based alloys with CO2 laser radiation
Kreutz, E.W.; Rozsnoki, M.; Pirch, N.
Konferenzbeitrag
1992Testability of expert systems in system development and application
Hoenen, M.; Kloth, M.; Steven, E.
Zeitschriftenaufsatz
1991Procjena vijeka trajanja za automobilske komponente
Grubisic, V.
Konferenzbeitrag
1990Improving quality and reliability - a challenge for environmental engineering.
Schubert, H.
Zeitschriftenaufsatz
1990A new explanation for the degradation of gold-aluminium bonds
Haag, F.J.
Konferenzbeitrag
1990Reliability of interfaces in newly designed ceramic-ceramic and metal-ceramic systems
Schönholz, R.; Kleer, G.; Döll, W.
Buch
1990Umweltsimulation sichert Qualität und Zuverlässigkeit
Schubert, H.
Zeitschriftenaufsatz
1990Zuverlässigkeitsuntersuchungen von Aluminium-Drahtbonds auf Gold Dickschichtleiterbahnen
Haag, J.F.
Konferenzbeitrag
1988Thermal degradation effects in InP
Sartorius, B.; Schlak, M.; Rosenzweig, M.; Parschke, K.
Zeitschriftenaufsatz
1987An age-wear dependent model of failure
Giglmayr, J.
Zeitschriftenaufsatz
1986Application of coherent systems in the subscriber loop
Bachus, E.-J.; Heydt, G.
Konferenzbeitrag
1984A common approach to the analysis and optimization of bus systems and loss systems
Giglmayr, J.
Konferenzbeitrag
1982Monitoring aids in an experimental broadband communication system
Burmeister, M.; Donner, H.; Kliem, H.; Kreutzer, H.W.; Schmidt, F.
Konferenzbeitrag
1982Subscriber stations in service integrated optical broad band communications systems
Buenning, H.; Kreutzer, H.W.; Schmidt, F.
Zeitschriftenaufsatz
1980Optical-fiber system with distributed access
Herold, W.E.; Ohnsorge, H.
Zeitschriftenaufsatz
1980Switching systems for integrated communication
Nobis, R.; Saniter, J.; Schaffner, H.
Konferenzbeitrag
1979Estimation of the reliability of hierarchical communication networks
Mrozynski, G.
Zeitschriftenaufsatz