| | |
|---|
| 2019 | Linear Fresnel Collector Mirrors - Measured Systematic Surface Errors and their Impact on the Focal Line
Heimsath, A.; Schöttl, P.; Bern, G.; Nitz, P. | Konferenzbeitrag |
| 2019 | Monitoring of Soiling with the AVUS Instrument - Technical and Economic Assessment
Heimsath, A.; Schmidt, T.; Rohani, S.; Haack, L.; Meyer, R.; Steinmetz, J.; Nitz, P. | Konferenzbeitrag |
| 2019 | Scattering and Specular Reflection of Solar Reflector Materials - Measurements and Method for Determine Solar Weighted Specular Reflectance
Heimsath, A.; Nitz, P. | Zeitschriftenaufsatz |
| 2018 | Development and application of an exchange model for anisotropic water diffusion in the microporous MOF aluminum fumarate
Splith, T.; Fröhlich, D.; Henninger, S.K.; Stallmach, F. | Zeitschriftenaufsatz |
| 2017 | What does "normal-normal transmittance" mean for light-scattering materials?
Wilson, H.R.; Bueno, B.; Hanek, J.; Riethmüller, C.; Illg, H.; Deroisy, B.; Kuhn, T. | Vortrag |
| 2012 | Optical and structural properties of Nb2O5-SiO2 mixtures in thin films
Janicki, V.; Sancho-Parramon, J.; Yulin, S.; Flemming, M.; Chuvilin, A. | Zeitschriftenaufsatz |
| 2011 | Entwicklung eines 3D-Charakterisierungsmessplatzes mit anschließender Charakterisierung eines autostereoskopischen 3D-Displays
Schuster, Stefan
: Heinen, Gerd (Betreuer); Braehmer, Uwe (Betreuer) | Bachelor Thesis |
| 2010 | Measuring the internal luminescence quantum efficiency of OLED emitter materials in electrical operation
Flämmich, M.; Danz, N.; Michaelis, D.; Wächter, C.A.; Bräuer, A.H.; Gather, M.C.; Meerholz, K. | Konferenzbeitrag |
| 2009 | Optical modeling of free electron behavior in highly doped ZnO films
Ruske, F.; Pflug, A.; Sittinger, V.; Szyszka, B.; Greiner, D.; Rech, B. | Zeitschriftenaufsatz |
| 2004 | Optical characterization of aluminum-doped zinc oxide films by advanced dispersion theories
Pflug, A.; Sittinger, V.; Ruske, M.; Szyszka, B.; Dittmar, G. | Konferenzbeitrag, Zeitschriftenaufsatz |
| 2000 | A new procedure for the optical characterization of high quality thin films
Bosch, S.; Leinfeller, N.; Quesnel, E.; Duparre, A.; Ferre-Borrull, J.; Günster, S.; Ristau, D. | Konferenzbeitrag |
| 2000 | Optical characterization of materials deposited by different processes: the LaF3 in the UV-visible region
Leinfeller, N.; Quesnel, E.; Duparre, A.; Ferre-Borrull, J. | Konferenzbeitrag |
| 2000 | Optische und elektrische Untersuchungen an GaSb-basierenden Halbleiterdiodenlasern
Mayer, M. | Diplomarbeit |
| 1998 | Output characteristics and optical efficiency of SrS:Ce and ZnS:Mn thin-film electroluminescent devices
Richter, S.; Mauch, R.H. | Zeitschriftenaufsatz |
| 1997 | Characterization of thin TiSi2 films by spectroscopic ellipsometry and thermal wave analysis
Kasko, I.; Kal, S.; Ryssel, H. | Konferenzbeitrag |
| 1996 | Apparatus for measuring integrated light scattering of optical components over an extended range of wavelengths
Duparre, A.; Gliech, S. | Konferenzbeitrag |