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2020 | Comparison of structural colors achieved by laser-induced periodic surface structures and direct laser interference patterning Soldera, Marcos; Fortuna, Franco; Teutoburg-Weiss, Sascha; Milles, Stephan; Taretto, Kurt; Lasagni, Andrés-Fabián | Zeitschriftenaufsatz |
2020 | Review and Recent Development in Combining Photoluminescence- and Electroluminescence-Imaging with Carrier Lifetime Measurements via Modulated Photoluminescence at Variable Temperatures Höffler, H.; Schindler, F.; Brand, A.; Herrmann, D.; Eberle, R.; Post, R.; Kessel, A.; Greulich, J.; Schubert, M.C. | Konferenzbeitrag |
2019 | Linear Fresnel Collector Mirrors - Measured Systematic Surface Errors and their Impact on the Focal Line Heimsath, A.; Schöttl, P.; Bern, G.; Nitz, P. | Konferenzbeitrag |
2019 | Monitoring of Soiling with the AVUS Instrument - Technical and Economic Assessment Heimsath, A.; Schmidt, T.; Rohani, S.; Haack, L.; Meyer, R.; Steinmetz, J.; Nitz, P. | Konferenzbeitrag |
2019 | Scattering and Specular Reflection of Solar Reflector Materials - Measurements and Method for Determine Solar Weighted Specular Reflectance Heimsath, A.; Nitz, P. | Zeitschriftenaufsatz |
2018 | Development and application of an exchange model for anisotropic water diffusion in the microporous MOF aluminum fumarate Splith, T.; Fröhlich, D.; Henninger, S.K.; Stallmach, F. | Zeitschriftenaufsatz |
2017 | What does "normal-normal transmittance" mean for light-scattering materials? Wilson, H.R.; Bueno, B.; Hanek, J.; Riethmüller, C.; Illg, H.; Deroisy, B.; Kuhn, T. | Vortrag |
2012 | Optical and structural properties of Nb2O5-SiO2 mixtures in thin films Janicki, V.; Sancho-Parramon, J.; Yulin, S.; Flemming, M.; Chuvilin, A. | Zeitschriftenaufsatz |
2011 | Entwicklung eines 3D-Charakterisierungsmessplatzes mit anschließender Charakterisierung eines autostereoskopischen 3D-Displays Schuster, Stefan : Heinen, Gerd (Betreuer); Braehmer, Uwe (Betreuer) | Bachelor Thesis |
2010 | Measuring the internal luminescence quantum efficiency of OLED emitter materials in electrical operation Flämmich, M.; Danz, N.; Michaelis, D.; Wächter, C.A.; Bräuer, A.H.; Gather, M.C.; Meerholz, K. | Konferenzbeitrag |
2009 | Optical modeling of free electron behavior in highly doped ZnO films Ruske, F.; Pflug, A.; Sittinger, V.; Szyszka, B.; Greiner, D.; Rech, B. | Zeitschriftenaufsatz |
2004 | Optical characterization of aluminum-doped zinc oxide films by advanced dispersion theories Pflug, A.; Sittinger, V.; Ruske, M.; Szyszka, B.; Dittmar, G. | Konferenzbeitrag, Zeitschriftenaufsatz |
2000 | A new procedure for the optical characterization of high quality thin films Bosch, S.; Leinfeller, N.; Quesnel, E.; Duparre, A.; Ferre-Borrull, J.; Günster, S.; Ristau, D. | Konferenzbeitrag |
2000 | Optical characterization of materials deposited by different processes: the LaF3 in the UV-visible region Leinfeller, N.; Quesnel, E.; Duparre, A.; Ferre-Borrull, J. | Konferenzbeitrag |
2000 | Optische und elektrische Untersuchungen an GaSb-basierenden Halbleiterdiodenlasern Mayer, M. | Diplomarbeit |
1998 | Output characteristics and optical efficiency of SrS:Ce and ZnS:Mn thin-film electroluminescent devices Richter, S.; Mauch, R.H. | Zeitschriftenaufsatz |
1997 | Characterization of thin TiSi2 films by spectroscopic ellipsometry and thermal wave analysis Kasko, I.; Kal, S.; Ryssel, H. | Konferenzbeitrag |
1996 | Apparatus for measuring integrated light scattering of optical components over an extended range of wavelengths Duparre, A.; Gliech, S. | Konferenzbeitrag |