Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2016Calculated efficiencies of three-material low stress coatings for diffractive x-ray transmission optics
Kubec, Adam; Braun, Stefan; Gawlitza, Peter; Menzel, Maik; Leson, Andreas
Konferenzbeitrag
2016Universal lab-on-a-chip platform for complex, perfused 3D cell cultures
Sonntag, Frank; Schmieder, Florian; Ströbel, Joachim; Grünzner, Stefan; Busek, Mathias; Steege, Tobias; Polk, Christoph; Klotzbach, Udo; Günther, K.
Konferenzbeitrag
2015Analysis of distinct scattering of extreme ultraviolet phase and amplitude multilayer defects with an actinic dark-field microscope
Bahrenberg, L.; Herbert, S.; Tempeler, J.; Maryasov, A.; Hofmann, O.; Danylyuk, S.; Lebert, R.; Loosen, P.; Juschkin, L.
Konferenzbeitrag
2015Characterization of Mo/Si mirror interface roughness for different Mo layer thickness using resonant diffuse EUV scattering
Haase, Anton; Soltwitsch, Victor; Scholze, Frank; Braun, Stefan
Konferenzbeitrag
2015Nanostructured SiGe thin films obtained through MIC processing
Lindorf, M.; Rohrmann, H.; Katona, G.L.; Beke, D.L.; Pernau, Hans-Fridtjof; Albrecht, M.
Zeitschriftenaufsatz, Konferenzbeitrag
2014Fabrication of customizable wedged multilayer Laue lenses by adding a stress layer
Niese, Sven; Krüger, Peter; Kubec, Adam; Laas, Roman; Gawlitza, Peter; Melzer, Kathleen; Braun, Stefan; Zschech, Ehrenfried
Zeitschriftenaufsatz
2014A hard x-ray split-and-delay unit for the HED experiment at the European XFEL
Roling, Sebastian; Appel, Karen; Braun, Stefan; Buzmakov, Alexey; Chubar, Oleg; Gawlitza, Peter; Samoylova, Liubov; Siemer, Björn; Schneidmiller, Evgeni; Sinn, Harald; Siewert, Frank; Tschentscher, Thomas; Wahlert, Frank; Wöstmann, Michael; Yurkov, Mikhail; Zacharias, Helmut
Konferenzbeitrag
2014Microporous polymeric 3D scaffolds templated by the layer-by-layer self-assembly
Paulraj, Thomas; Feoktistovab, Natalia A.; Velk, Natalia; Uhlig, Katja; Duschl, Claus; Volodkin, Dimitry
Zeitschriftenaufsatz
2013Inline multilayer thickness sensing by using terahertz time-domain spectroscopy in reflection geometry
Krimi, S.; Klier, J.; Herrmann, M.; Jonuscheit, J.; Beigang, R.
Konferenzbeitrag