Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2020An interlaboratory study of the reproducibility of on-wafer S-parameter measurements from 140 GHz to 220 GHz
Clarke, R.; Shang, Xiaobang; Ridler, Nick M.; Lozar, Roger; Probst, Thorsten; Arz, Uwe
Konferenzbeitrag
2020Measurement Uncertainties in I-V Calibration of Multi-Junction Solar Cells for Different Solar Simulators and Reference Devices
Reichmuth, S.K.; Siefer, G.; Schachtner, M.; Mühleis, M.; Hohl-Ebinger, J.; Glunz, S.W.
Zeitschriftenaufsatz
2019A reference test setup to support research and development of HPEM testing schemes
Pusch, Thorsten; Willenbockel, Martin; Hurtig, Tomas; Suhrke, Michael; Ruge, Sven; Jörres, Benjamin; Jöster, Michael
Konferenzbeitrag
2018Improving the error behavior of DRAM by exploiting its Z-channel property
Kraft, Kira; Sudarshan, Chirag; Mathew, Deepak M.; Weis, Christian; Wehn, Norbert; Jung, Matthias
Konferenzbeitrag
2016A framework for uncertainty propagation in 3D shape measurement using laser triangulation
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, Jürgen; Dachsbacher, C.; Wörn, H.
Konferenzbeitrag
2016Performance characterization in automated optical inspection using CAD models and graphical simulations
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, Jürgen; Dachsbacher, C.; Wörn, H.
Konferenzbeitrag
2015A detailed study on TEM waveguides' field distribution and efficiency
Hamann, David; Garbe, Heyno; Pusch, Thorsten; Suhrke, Michael
Konferenzbeitrag
2015Eine Heuristik zur effizienten Bayes'schen Optimierung einer multispektralen Kamera
Taphanel, M.; Beyerer, Jürgen
Zeitschriftenaufsatz
2014Concept for simultaneous measurement of Seebeck coefficient, electrical conductivity and thermal conductivity
Nissila, J.; Jacquot, A.; Barb, Y.; Jägle, M.; Leppanen, M.; Manninen, A.
Konferenzbeitrag
2013Pattern coding strategies for deflectometric measurement systems
Höfer, S.; Roschani, M.; Werling, Stefan
Konferenzbeitrag
2012Physical characterization and performance evaluation of an x-ray micro-computed tomography system for dimensional metrology applications
Hiller, Jochen; Maisl, Michael; Reindl, Leonard M.
Zeitschriftenaufsatz
2002Assessment of the measurement uncertainty of interferometers by means of simulation
Bai, A.; Bitte, F.; Pfeifer, T.
Zeitschriftenaufsatz
2000Interferometer calibration: An approach with the virtual interferometer
Bitte, F.; Mischo, H.; Pfeifer, T.
Konferenzbeitrag
1999Error sources, measurement uncertainties and calibration techniques in high-precision metrology
Bitte, F.; Mischo, H.; Pfeifer, T.
Konferenzbeitrag
1991Progress in the measurement of multi-junction devices at ISE
Bücher, K.; Heidler, K.; Müller-Bierl, B.; Schönecker, A.
Konferenzbeitrag