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| 2020 | Demonstration and analysis of an extended adaptive general four-component decomposition
Wang, Yu; Yu, Weidong; Liu, Xiuqing; Wang, Chunle; Kuijper, Arjan; Guthe, Stefan | Zeitschriftenaufsatz |
| 2020 | Light scattering characterization of single-layer nanoporous SiO2 antireflection coating in visible light
Sekman, Y.; Felde, N.; Ghazaryan, L.; Szeghalmi, A.; Schröder, S. | Zeitschriftenaufsatz |
| 2020 | Non-disruptive Supercontinuum based scattering analyses of cartilage and collagen before and after apoptosis and necrosis
Baselt, Tobias; Taudt, Christopher; Kabardiadi-Virkovski, Alexander; Prade, Ina; Lasagni, Andrés-Fabián; Hartmann, Peter | Konferenzbeitrag |
| 2019 | Development of an experimental setup and a study for the comparison between optical properties and the subjective perception of a quality of a display surface
Puder, Theresa; Rudek, Florian; Taudt, Christopher; Kabardiadi-Virkovski, Alexander; Hartmann, Peter | Konferenzbeitrag |
| 2019 | Multiwavelength holography: Height measurements despite axial motion of several wavelengths during exposure
Schiller, Annelie; Beckmann, Tobias; Fratz, Markus; Bertz, Alexander; Carl, Daniel; Buse, Karsten | Zeitschriftenaufsatz |
| 2017 | Optical properties of hydrogels filled with dispersed nanoparticles
Samaryk, Volodymyr; Varvarenko, Sergiy; Nosova, Nataliya; Fihurka, Nataliia; Musyanovych, Anna; Landfester, Katharina; Popadyuk, Nadiya; Voronov, Stanislav | Zeitschriftenaufsatz |
| 2016 | Thermoresponsive (star) block copolymers from one-pot sequential RAFT polymerizations and their self-assembly in aqueous solution
Herfurth, Christoph; Laschewsky, Andre; Noirez, Laurence; Lospichl, Benjamin von; Gradzielski, Michael | Zeitschriftenaufsatz |
| 2014 | ESLPV: Enhanced subsurface light propagation volumes
Koa, Ming di; Johan, Henry | Zeitschriftenaufsatz, Konferenzbeitrag |
| 2014 | In situ and ex situ characterization of optical surfaces by light scattering techniques
Trost, Marcus; Herffurth, Tobias; Schröder, Sven; Duparré, Angela; Beier, Matthias; Risse, Stefan; Tünnermann, Andreas; Böwering, Norbert | Zeitschriftenaufsatz |
| 2014 | Light scattering characterization of optical components – BRDF, BTDF and scatter losses
Schröder, Sven; Finck, Alexander von; Katsir, Dina; Zeitner, Uwe; Duparré, Angela | Konferenzbeitrag |
| 2014 | Measuring isotropic subsurface light transport
Happel, Kathrin; Dörsam, Edgar; Urban, Philipp | Zeitschriftenaufsatz |
| 2013 | Angle and wavelength resolved light scattering measurement of optical surfaces and thin films
Schröder, Sven; Unglaub, David; Fink, Alexander von; Hauptvogel, Matthias; Trost, Marcus; Herffurth, Tobias; Duparré, Angela; Stover, John | Konferenzbeitrag |
| 2013 | Light scattering of interference coatings from the IR to the EUV spectral regions
Schröder, Sven; Trost, Marcus; Herffurth, Tobias; Finck, Alexander von; Duparré, Angela | Zeitschriftenaufsatz |
| 2013 | Roughness, optical and wetting properties of nanostructured thin films
Schröder, Sven; Coriand, Luisa; Duparré, Angela | Konferenzbeitrag |
| 2013 | Using light scattering to investigate damage-relevant imperfections of surfaces, coatings, and bulk materials
Schröder, Sven; Trost, Marcus; Herffurth, Tobias; Duparré, Angela | Konferenzbeitrag |
| 2012 | Optical performance of LPP multilayer collector mirrors
Feigl, Torsten; Perske, Marco; Pauer, Hagen; Fiedler, Tobias; Yulin, Sergiy; Trost, Marcus; Schroeder, Sven; Duparré, Angela; Kaiser, Norbert; Tünnermann, Andreas; Böwering, Norbert; Ershov, Alex; Hoffmann, Kay; La Fontaine, Bruno; Cummings, Kevin D. | Konferenzbeitrag |
| 2012 | Roughness characterization of EUV multilayer coatings and ultra-smooth surfaces by light scattering
Trost, Marcus; Schröder, Sven; Lin, C.C.; Duparré, Angela; Tünnermann, Andreas | Konferenzbeitrag |
| 2011 | Efficient specification and characterization of surface roughness for extreme ultraviolet optics
Schröder, S.; Trost, M.; Feigl, T.; Duparre, A.; Harvey, J.E. | Konferenzbeitrag |
| 2011 | Impact of surface roughness on scatter losses and the scattering distribution of surfaces and thin film coatings
Schröder, S.; Herffurth, T.; Duparre, A. | Konferenzbeitrag |
| 2011 | Roughness characterization of large EUV mirror optics by laser light scattering
Trost, M.; Schröder, S.; Feigl, T.; Duparre, A.; Tünnermann, A. | Konferenzbeitrag |
| 2008 | Roughness evolution and scatter losses of multilayers for 193 nm optics
Schröder, S.; Duparre, A.; Tünnermann, A. | Zeitschriftenaufsatz |
| 2008 | Streulichtfotometrisches Messverfahren für den zeitlichen Verlauf der PM10- und PM2,5-Konzentration in der Außenluft
Dunkhorst, W.; Lödding, H.; Koch, W. | Zeitschriftenaufsatz |
| 2005 | Scatter analysis of optical components from 193 nm to 13.5 nm
Schröder, S.; Kamprath, M.; Gliech, S.; Duparre, A. | Konferenzbeitrag |
| 2005 | Surface texture investigation of ultra-precision optical components
Schröder, S.; Ratteit, J.; Gliech, S.; Duparre, A. | Konferenzbeitrag |
| 2005 | Ultra low-loss low-efficiency diffraction gratings
Clausnitzer, T.; Kley, E.-B.; Tünnermann, A.; Bunkowski, A.; Burmeister, O.; Danzmann, K.; Schnabel, R.; Duparre, A. | Zeitschriftenaufsatz |
| 2003 | Characterization procedures for nanorough ultrahydrophobic surfaces with controlled optical matter
Flemming, M.; Reihs, K.; Duparre, A. | Konferenzbeitrag |
| 2003 | Characterizing CaF2 for VUV optical components: Roughness, surface scatter, and bulk scatter
Hultaker, A.; Benkert, N.; Gliech, S.; Duparre, A. | Konferenzbeitrag |
| 2003 | Methology to evaluate light scatter mechanisms of VUV substrates and coatings
Duparre, A.; Gliech, S.; Hultaker, A. | Aufsatz in Buch |
| 2003 | System for angle-resolved and total light scattering, transmittance, and reflectance measurements of optical components at 157 nm and 193 nm
Gliech, S.; Geßner, H.; Duparre, A. | Konferenzbeitrag |
| 2003 | VULSTAR: A laser based system for measuring light scattering, transmittance, and reflectance at 157 nm and 193 nm
Duparre, A.; Gliech, S.; Benkert, N. | Aufsatz in Buch |
| 2003 | VUV light scattering measurements of substrates and thin film coatings
Hultaker, A.; Gliech, S.; Benkert, N.; Duparre, A. | Konferenzbeitrag |
| 2002 | Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components
Duparre, A.; Ferre-Borrull, J.; Gliech, S.; Notni, G.; Steinert, J.; Bennett, J.M. | Zeitschriftenaufsatz |
| 2001 | Surface characterization of optical components for the DUV, VUV und EUV
Duparre, A.; Kozhevnikov, I.; Gliech, S.; Steinert, J.; Notni, G. | Zeitschriftenaufsatz |
| 2000 | Advanced Methods for surface and subsurface defect characterization of optical components
Steinert, J.; Gliech, S.; Wuttig, A.; Duparre, A.; Truckenbrodt, H. | Konferenzbeitrag |
| 2000 | DUV/VUV light scattering measurement of optical components for lithography applications
Gliech, S.; Steinert, J.; Flemming, M.; Duparre, A. | Konferenzbeitrag |
| 2000 | InP-based pin TWA photoreceivers with low group delay scatter over 40 GHz bandwidth
Bach, H.-G.; Schlaak, W.; Mekonnen, G.G.; Seeger, A.; Steingrüber, R.; Schramm, C.; Jacumeit, G.; Ziegler, R.; Umbach, A.; Unterborsch, G.; Passenberg, W.; Ebert, W.; Eckardt, T. | Konferenzbeitrag |
| 1999 | Application and cost analysis of scatterometry for integrated metrology
Benesch, N.; Schneider, C.; Pfitzner, L.; Ryssel, H. | Konferenzbeitrag |
| 1999 | Comparative study of the roughness of optical surfaces and thin films using atomic force microscopy, x-ray scattering, and light scattering methods
Kozhevnikov, I.V.; Asadchikov, V.E.; Duparre, A.; Gilev, O.N.; Havronin, N.A.; Krivonosov, Y.S.; Ostashev, V.I.; Steinert, J. | Konferenzbeitrag |
| 1999 | DUV light scattering and morphology of ion beam sputtered fluoride coatings
Quesnel, E.; Petit dit Dariel, A.; Duparre, A.; Ferre-Borrull, J.; Steinert, J. | Konferenzbeitrag |
| 1999 | Ion-assisted deposition of oxide materials at room temperature by use of different ion sources
Niederwald, H.S.; Laux, S.; Kennedy, M.; Schallenberg, U.; Duparre, A.; Kaiser, N.; Ristau, D. | Zeitschriftenaufsatz |
| 1999 | Light scattering and atomic force microscopic investigations on magnetron sputtered oxide single layers and multilayers for micromechanical laser mirrors
Kupfer, H.; Richter, F.; Schlott, P.; Duparre, A.; Gliech, S. | Konferenzbeitrag |
| 1999 | Multi-type surface and thin film characterization using light scattering, scanning force microscopy and white light interferometry
Duparre, A.; Notni, G. | Konferenzbeitrag |
| 1999 | Surface roughness and subsurface damage characterization of fused silica substrates
Wuttig, A.; Steinert, J.; Duparre, A.; Truckenbrodt, H. | Konferenzbeitrag |
| 1999 | Surface roughness characterization of smooth optical films deposited by ion plating
Jakobs, S.; Duparre, A.; Huter, M.; Pulker, H.K. | Zeitschriftenaufsatz |
| 1999 | Wide-scale surface characterization by combination of scanning force microscopy, white light interferometry, and light scattering
Gliech, S.; Duparre, A.; Recknagel, R.-J.; Notni, G. | Konferenzbeitrag |
| 1998 | AFM and light scattering measurements of optical thin films for applications in the UV spectral region
Jakobs, S.; Duparre, A.; Truckenbrodt, H. | Zeitschriftenaufsatz |
| 1998 | AFM helps engineer low-scatter thin films
Duparre, A.; Kaiser, N. | Zeitschriftenaufsatz |
| 1998 | Interfacial roughness and related scatter in UV-optical coatings
Jacobs, S.; Duparre, A.; Truckenbrodt, H. | Zeitschriftenaufsatz |
| 1998 | Scatter investigation of UV-films. Facing the trend towards shorter wavelength
Duparre, A.; Kaiser, N. | Konferenzbeitrag |
| 1997 | Characterization of SiO2 protective coatings on polycarbonate
Jakobs, S.; Schulz, U.; Duparre, A.; Kaiser, N. | Zeitschriftenaufsatz |
| 1997 | Concepts for standardization of total scatter measurements at 633 nm
Kadkhoda, M.; Strink, P.; Ristau, D.; Duparre, A.; Gliech, S.; Reng, N.; Greif, M.; Schuhmann, R.; Goldner, M. | Konferenzbeitrag |
| 1997 | Influence of substrate surface and film roughness on the quality of optical coatings for the UV spectral region
Duparre, A.; Jakobs, S.; Kaiser, N. | Konferenzbeitrag |
| 1997 | Non-contact testing of optical surfaces by multiple-wavelength light scattering measurement
Duparre, A.; Gliech, S. | Konferenzbeitrag |
| 1996 | Analysis of interface and volume inhomogenities in a multilayer system by light scattering methods
Pichlmaier, S.; Hehl, K.; Schuhmann, U.; Duparre, A.; Gliech, S. | Konferenzbeitrag |
| 1996 | Apparatus for measuring integrated light scattering of optical components over an extended range of wavelengths
Duparre, A.; Gliech, S. | Konferenzbeitrag |
| 1996 | Combination of surface characterization techniques for investigating optical thin-film components
Duparre, A.; Jakobs, S. | Zeitschriftenaufsatz |
| 1996 | Dependence of the surface morphology and scattering of optical coatings on film material, substrate roughness, and deposition process
Jakobs, S.; Feigl, T.; Duparre, A. | Konferenzbeitrag |
| 1996 | Optical scattering and surface microstructure of thin films for laser application
Duparre, A.; Kiesel, A.; Gliech, S. | Zeitschriftenaufsatz |
| 1996 | Polarizerless electro-optic IR shutter based on a cholesteric scattering effect
Stieb, A.E. | Zeitschriftenaufsatz |
| 1996 | Roughness analysis of optical films and substrates by atomic force microscopy
Duparre, A.; Ruppe, C. | Zeitschriftenaufsatz |
| 1995 | Light scattering of thin dielectric films
Duparre, A. | Aufsatz in Buch |
| 1994 | Charakterisierung der Rauheit optischer Funktionsflächen - Methodenvergleich
Neubert, J.; Duparre, A.; Kaiser, N.; Notni, G.; Gerold, F.; Risse, S. | Konferenzbeitrag |
| 1994 | Interface and volume inhomogenities in optical thin films investigated by light scattering methods
Duparre, A.; Gliech, S.; Hehl, K.; Pichlmaier, U.; Schuhmann, U. | Konferenzbeitrag |
| 1994 | Roughness and scattering measurements on thin films for UV/VIS applications
Duparre, A.; Kiesel, A.; Kaiser, N.; Truckenbrodt, H.; Schuhmann, U. | Konferenzbeitrag |
| 1993 | Bulk and surface light scattering from transparent silica aerogel
Platzer, W.J.; Bergkvist, M. | Zeitschriftenaufsatz |
| 1993 | Laterally and depth resolved photothermal absorption measurements on ZrO2 and MgF2 single-layer films
Reichling, M.; Welsch, E.; Duparre, A.; Matthias, E. | Konferenzbeitrag |
| 1993 | Optical reflection and angle-resolved light scattering from textured polycrystalline diamond films.
Locher, R.; Wild, C.; Müller-Sebert, W.; Kohl, R.; Koidl, P. | Zeitschriftenaufsatz |
| 1993 | Overcoming the influence of rayleigh backscattering in a coherent communication system
Hilbk, U.; Hermes, T.H.; Meissner, P.; Westphal, F.-J. | Konferenzbeitrag |
| 1993 | Real-time detection of surface damage by direct assessment of the BRDF
Rothe, H.; Duparre, A.; Truckenbrodt, H.; Timm, M. | Konferenzbeitrag |
| 1993 | Relation between light scattering and the microstructure of optical thin films
Duparre, A.; Kassam, S. | Zeitschriftenaufsatz |
| 1993 | Scattering losses of oxide and fluoride coatings for lasers
Duparre, A.; Uhlig, H.; Kassam, S. | Konferenzbeitrag |
| 1992 | Light scattering from the volume of optical thin films: theory and experiment
Duparre, A.; Kassam, S.; Hehl, K.; Bussemer, P.; Neubert, J. | Zeitschriftenaufsatz |
| 1992 | Roughness and defect characterization of optical surfaces by light scattering measurements
Truckenbrodt, H.; Duparre, A.; Schuhmann, U. | Konferenzbeitrag |
| 1991 | Grundlagen der Streulichtpartikelmeßtechnik
Ernst, C. | Konferenzbeitrag |
| 1986 | Comparison of two methods for the determination of particle deposition on surfaces
Hollaender, W.; Morawietz, G. | Konferenzbeitrag |