Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2018Defects in Epitaxially Grown Silicon Wafers Causing Lifetime Patterns
Drießen, M.; Beu, P.; Heinz, F.D.; Fehrenbach, T.; Gust, E.; Schindler, F.; Janz, S.
Konferenzbeitrag
2018Limiting Effects in Crystalline Silicon for High-Efficiency Solar Cells
Niewelt, T.; Richter, A.; Eberle, R.; Post, R.; Schön, J.; Schindler, F.; Hermle, M.; Kwapil, W.; Schubert, M.
Vortrag
2017Understanding the light-induced degradation at elevated temperatures: Similarities between multicrystalline and floatzone p-type silicon
Niewelt, T.; Schindler, F.; Kwapil, W.; Eberle, R.; Schön, J.; Schubert, M.C.
Konferenzbeitrag
2016Fast in-situ photoluminescence analysis for a recombination parameterization of the fast BO defect component in silicon
Niewelt, T.; Mägdefessel, S.; Schubert, M.C.
Zeitschriftenaufsatz
2015Defect Luminescence Scanner (DLS): Scientific and industrial-scale defect analysis
Oppel, Steffen; Schneider, Adrian; Schütz, Michael; Kaminzky, Daniel; Kallinger, Birgit; Weber, Jonas; Krieger, Michael
Vortrag
2015Defect removal after low temperature annealing of boron implantations by emitter etch-back for silicon solar cells
Müller, R.; Moldovan, A.; Schiller, C.; Benick, J.
Zeitschriftenaufsatz
2015Diffusion and segregation model for the annealing of silicon solar cells implanted with phosphorus
Wolf, F. Alexander; Martinez-Limia, Alberto; Grote, Daniela; Stichtenoth, Daniel; Pichler, Peter
Zeitschriftenaufsatz
2015Identification of the most relevant metal impurities in mc n-type silicon for solar cells
Schön, J.; Schindler, F.; Kwapil, W.; Knörlein, M.; Krenckel, P.; Riepe, S.; Warta, W.; Schubert, M.C.
Zeitschriftenaufsatz, Konferenzbeitrag
2015Imaging defect luminescence of 4H-SiC by UV-photoluminescence
Kaminzky, Daniel; Roßhirt, Katharina; Kallinger, Birgit; Berwian, Patrick; Friedrich, Jochen; Oppel, Steffen; Schneider, Adrian; Schütz, Michael
Vortrag
2015Quality control of SiC materials by optical detection of defects
Kallinger, Birgit; Kaminzky, Daniel; Roßhirt, Katharina; Berwian, Patrick; Friedrich, Jochen; Oppel, Steffen
Vortrag
2014Self-organized pattern formation in laser-induced multiphoton ionization
Buschlinger, Robert; Nolte, Stefan; Peschel, Ulf
Zeitschriftenaufsatz
2014Silicon carbide in power electronics: Overcoming the obstacle of bipolar degradation
Kallinger, Birgit; Ehlers, Christian; Berwian, Patrick; Friedrich, Jochen; Rommel, Mathias
Vortrag
2013Experimental verification of the model by Klapper for 4H-SiC homoepitaxy on vicinal substrates
Kallinger, Birgit; Polster, Sebastian; Berwian, Patrick; Friedrich, Jochen; Danilewsky, A.N.
Zeitschriftenaufsatz
2013Material limitations due to crucible impurities in multicrystalline silicon for high efficiency solar cells
Schindler, F.; Michl, B.; Schön, J.; Kwapil, W.; Warta, W.; Schubert, M.C.
Konferenzbeitrag
2013Surface open corrosive wall thinning effects
Pérez Blanco, Isabel Christina; Dobmann, Gerd
Konferenzbeitrag
2012Macroporous silicon chips for laterally resolved, multi-parametric analysis of epithelial barrier function
Michaelis, S.; Rommel, C.E.; Endell, J.; Göring, P; Wehrspohn, R.; Steinem, C.; Janshoff, A.; Galla, H.; Wegener, J.
Zeitschriftenaufsatz
2012Pseudo-spin filter in metallic single-walled carbon nanotubes
Bercioux, D.; Mayrhofer, L.
Konferenzbeitrag
2011Defects formed by pulsed laser annealing: Electrical properties and depth profiles in n-type silicon measured by deep level transient spectroscopy
Schindele, D.; Pichler, P.; Lorenz, J.; Oesterlin, P.; Ryssel, H.
Zeitschriftenaufsatz, Konferenzbeitrag
2011Influence of powder morphology on properties of ceramic injection moulding feedstocks
Mannschatz, Anne; Müller, Axel; Moritz, Tassilo
Konferenzbeitrag, Zeitschriftenaufsatz
2011Threading dislocations in n- and p-type 4H-SiC material analyzed by etching and synchrotron x-ray topography
Kallinger, B.; Polster, S.; Berwian, P.; Friedrich, J.; Müller, G.; Danilewsky, A.N.; Wehrhahn, A.; Weber, A.-D.
Zeitschriftenaufsatz
2002Review on the non-destructive characterization and application of doped and undoped polycrystalline diamond films
Werner, M.; Köhler, T.; Mietke, S.; Wörner, E.; Johnston, C.; Fecht, H.-J.
Konferenzbeitrag
1999A study of defects in LEC GaAs after copper diffusion
Frigeri, C.; Weyher, J.L.; Müller, S.; Hiesinger, P.
Konferenzbeitrag
1996Luminescence properties of SrS:Ce thin films
Hüttl, B.; Velthaus, K.-O.; Troppenz, U.; Kreissl, J.; Mauch, R.H.
Konferenzbeitrag
1996Luminescence properties of SrS:Ce3+, Cl thin films
Hüttl, B.; Velthaus, K.O.; Troppenz, U.; Mauch, R.H.
Konferenzbeitrag, Zeitschriftenaufsatz
1991The consequences of dislocations and thermal degradation on the quality of InGaAsP/InP epitaxial layers
Sartorius, B.; Reier, F.; Wolfram, P.
Konferenzbeitrag, Zeitschriftenaufsatz
1987Luminescence microscopy for quality control of material and processing
Satorius, B.; Franke, D.; Schlak, M.
Konferenzbeitrag, Zeitschriftenaufsatz