Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Electrical and structural properties of direct current magnetron sputtered amorphous TiAl thin films
Kolkovsky, V.; Schmidt, Jan-Uwe; Döring, S.
Zeitschriftenaufsatz
2019Influence of Glassy Carbon Surface Finishing on its Wear Behavior during Precision Glass Moulding of Fused Silica
Grunwald, Tim; Wilhelm, Dennis Patrick; Dambon, Olaf; Bergs, Thomas
Zeitschriftenaufsatz
2019Thin-film lubrication in the water/octyl β-d-glucopyranoside system: Macroscopic and nanoscopic tribological behavior
Chen, W.; Amann, T.; Kailer, A.; Rühe, J.
Zeitschriftenaufsatz
2018Biomechanical and biomolecular characterization of extracellular matrix structures in human colon carcinomas
Brauchle, Eva; Kasper, Jana; Daum, Ruben; Schierbaum, Nicolas; Falch, Claudius; Kirschniak, Andreas; Schäffer, Tilman E; Schenke-Layland, Katja
Zeitschriftenaufsatz
2017Nanoscale patterning of self-assembled monolayer (SAM)-functionalised substrates with single molecule contact printing
Sajfutdinow, Martin; Uhlig, Katja; Prager, Andrea; Schneider, C.; Abel, Bernd; Smith, David M.
Zeitschriftenaufsatz
2016Adhesion force mapping on wood by atomic force microscopy
Jin, X.; Kasal, B.
Zeitschriftenaufsatz
2016Quantitative comparison of measurement methods for the evaluation of micro- and nanostructures written with 2PP
Harnisch, Emely Marie; König, Niels; Schmitt, Robert
Konferenzbeitrag
2015Dielectrophoretic immobilization of proteins: Quantification by atomic force microscopy
Laux, Eva-Maria; Knigge, Xenia; Bier, Frank F.; Wenger, Christian; Hölzel, Ralph
Zeitschriftenaufsatz
2014Examination of micro- and nanostructures of magnetic and piezoelectric materials in relation to their macroscopic properties by dynamic scanning force microscopy techniques
Batista, Leonardo
Dissertation
2013Adsorption of silver on cellobiose and cellulose studied with MIES, UPS, XPS and AFM
Dahle, S.; Meuthen, J.; Viöl, W.; Maus-Friedrichs, W.
Zeitschriftenaufsatz
2013Adsorption of silver on glucose studied with MIES, UPS, XPS and AFM
Dahle, S.; Meuthen, J.; Viöl, W.; Maus-Friedrichs, W.
Zeitschriftenaufsatz
2012Characterization of grain boundaries in multicrystalline silicon with high lateral resolution using conductive atomic force microscopy
Rumler, Maximilian; Rommel, Mathias; Erlekampf, Jürgen; Azizi, Maral; Geiger, Tobias; Bauer, Anton J.; Meißner, Elke; Frey, Lothar
Zeitschriftenaufsatz
2012Investigation of the influence of laser radiation on material properties of transparent conductive layers
Schaefer, M.; Esser, A.; Schulz-Ruhtenberg, M.; Holtkamp, J.; Gillner, A.
Konferenzbeitrag
2011Current voltage characteristics through grains and grain boundaries of high-k dielectric thin films measured by tunneling atomic force microscopy
Murakami, Katsuhisa; Rommel, Mathias; Yanev, Vasil; Bauer, Anton J.; Frey, Lothar
Konferenzbeitrag
2011High quality AlGaN epilayers grown on sapphire using SiNx interlayers
Forghani, K.; Klein, M.; Lipski, F.; Schwaiger, S.; Hertkorn, J.; Leute, R.A.R.; Scholz, F.; Feneberg, M.; Neuschl, B.; Thonke, K.; Klein, O.; Kaiser, U.; Gutt, R.; Passow, T.
Konferenzbeitrag, Zeitschriftenaufsatz
2010Fabrication of metallic SPM tips by combining UV nanoimprint lithography and focused ion beam processing
Jambreck, J.D.; Schmitt, H.; Amon, B.; Rommel, M.; Bauer, A.J.; Frey, L.
Zeitschriftenaufsatz, Konferenzbeitrag
2010Manufacturing, characterization, and application of nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy
Jambreck, J.D.; Yanev, V.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.
Poster
2010Nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy: Manufacturing, characterization, and application
Jambreck, J.D.; Yanev, V.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.
Poster
2010Semiconducting to metallic-like boron doping of nanocrystalline diamond films and its effect on osteoblastic cells
Kromka, A.; Grausova, L.; Bacáková, L.; Vacik, J.; Rezek, B.; Vanecek, M.; Williams, O.A.; Haenen, K.
Zeitschriftenaufsatz, Konferenzbeitrag
2009Correlation of microscopic and macroscopic electrical characteristics of high-k ZrSixO2-x thin films using tunneling atomic force microscopy
Weinreich, W.; Wilde, L.; Kücher, P.; Lemberger, M.; Yanev, V.; Rommel, M.; Bauer, A.J.; Erben, E.; Heitmann, J.; Schröder, U.; Oberbeck, L.
Konferenzbeitrag, Zeitschriftenaufsatz
2009FEM-simulations of vibrations and resonances of stiff AFM cantilevers
Geng, K.; Rabe, U.; Hirsekorn, S.
Konferenzbeitrag
2008AFM testing of the nanomechanical behaviour of MEMS micromembranes
Ekwinski, G.; Goehlich, A.; Trieu, H.-K.; Rymuza, Z.; Koszewski, A.
Zeitschriftenaufsatz
2008Combinatorial fabrication of thin film-libraries and evaluation of their piezoelectricity by ultrasonic piezo-mode imaging
Rende, D.; Schwarz, K.; Rabe, U.; Maier, W.F.; Arnold, W.
Zeitschriftenaufsatz
2008Mapping of elastic stiffness in an alpha+beta titanium alloy using atomic force acoustic microscopy
Kumar, A.; Rabe, U.; Arnold, W.
Konferenzbeitrag, Zeitschriftenaufsatz
2008Novel carbon-cage-based ultralow-k materials: Modeling and first experiments
Zagorodniy, K.; Chumakov, D.; Täschner, C.; Lukowiak, A.; Stegmann, H.; Schmeißer, D.; Geisler, H.; Engelmann, H.-J.; Hermann, H.; Zschech, Ehrenfried
Zeitschriftenaufsatz
2007Calibration of atomic force microscope for nanoscale friction measurements
Masalska, A.; Kolanek, K.; Woszczyna, M.; Zawierucha, P.; Ritz, Y.; Zschech, Ehrenfried
Konferenzbeitrag
2007Near-field acoustical imaging using lateral bending mode of atomic force microscope cantilevers
Caron, A.; Rabe, U.; Rödel, J.; Arnold, W.
Konferenzbeitrag
2007Nonlinear contact resonance spectroscopy in atomic force microscopy
Rupp, D.; Rabe, U.; Hirsekorn, S.; Arnold, W.
Zeitschriftenaufsatz
2007Visibility of buried structures in atomic force acoustic microscopy
Striegler, A.; Pathuri, N.; Köhler, B.; Bendjus, B.
Konferenzbeitrag
2006Investigation of ceramics and ferroelectric materials by atomic force acoustic microscopy
Arnold, W.
Konferenzbeitrag
2006Structure and thermoelectric properties of boron doped nanocrystalline Si0.8Ge0.2 thin film
Takashiri, M.; Borca-Tasciuc, T.; Jacquot, A.; Miyazaki, K.; Cheng, G.
Zeitschriftenaufsatz
2006Surface characterization with nanometer lateral resolution using the vibration modes of atomic force microscope cantilevers
Rabe, U.; Arnold, W.; Caron, A.; Hirsekorn, S.; Schwarz, K.
Konferenzbeitrag
2005Atomic force microscopy at ultrasonic frequencies
Arnold, W.; Caron, A.; Hirsekorn, S.; Kopycinska-Müller, M.; Rabe, U.; Reinstädtler, M.
Konferenzbeitrag
2005Investigating ultra-thin lubricant layers using resonant friction force microscopy
Reinstädtler, M.; Rabe, U.; Goldade, A.; Bhushan, B.; Arnold, W.
Zeitschriftenaufsatz, Konferenzbeitrag
2004Atomic force microscopy with lateral modulation
Scherer, V.; Reinstädtler, M.; Arnold, W.
Aufsatz in Buch
2004Investigating ultra-thin lubricant layers using lateral atomic force acoustic microscopy
Reinstädtler, M.; Rabe, U.; Hirsekorn, S.; Arnold, W.; Goldade, A.V.; Kasai, T.; Bhushan, B.
Konferenzbeitrag
2004Materials characterization of micro-devices
Schreiber, J.; Bendjus, B.; Köhler, B.; Melov, V.; Baumbach, T.
Konferenzbeitrag
2004Phenomena in microwear experiments on metal-free and metal-containing diamond-like carbon coatings: Friction, wear, fatigue and plastic
Schiffmann, K.
Zeitschriftenaufsatz
2004Quantitative measurement of elastic constants of anisotropic materials by atomic force acoustic microscopy
Arnold, W.; Hirsekorn, S.; Kopycinska-Müller, M.; Reinstädtler, M.; Rabe, U.
Konferenzbeitrag
2004Ultrasonic modes in atomic force microscopy
Kopycinska-Müller, M.; Reinstädtler, M.; Rabe, U.; Caron, A.; Hirsekorn, S.; Arnold, W.
Konferenzbeitrag
2003Characterizing CaF2 for VUV optical components: Roughness, surface scatter, and bulk scatter
Hultaker, A.; Benkert, N.; Gliech, S.; Duparre, A.
Konferenzbeitrag
2003Methology to evaluate light scatter mechanisms of VUV substrates and coatings
Duparre, A.; Gliech, S.; Hultaker, A.
Aufsatz in Buch
2002Atomic force microscopy at ultrasonic frequencies
Arnold, W.; Hirsekorn, S.; Kopycinska, M.; Rabe, U.; Reinstädtler, M.; Scherer, V.
Konferenzbeitrag
2001Measurements of elastic properties of ultra-thin diamond-like carbon coatings using atomic force acoustic microscopy
Amelio, S.; Goldade, A.; Rabe, U.; Scherer, V.; Bhushan, B.; Arnold, W.
Zeitschriftenaufsatz
2001Ultrasonic radiation in dynamic force microscopy
Hirsekorn, S.; Rabe, U.; Arnold, W.
Zeitschriftenaufsatz
2000Analysis of peculiar structural defects created in GaAs by diffusion of copper
Frigeri, C.; Weyher, J.; Müller, S.; Hiesinger, P.
Zeitschriftenaufsatz
2000Measurement of Young's Modulus of Nanocrystalline Ferrites with Spinel Structures by Atomic Force Acoustic Microscopy
Kester, E.; Rabe, U.; Presmanes, L.; Tailhades, P.; Arnold, W.
Zeitschriftenaufsatz
2000Quantitative contact spectroscopy by atomic force acoustic microscopy
Amelio, S.; Rabe, U.; Kester, E.; Hirsekorn, S.; Arnold, W.
Konferenzbeitrag
2000X-ray study of the roughness of surfaces and interfaces
Kozhevnikov, I.V.; Asadchikov, V.E.; Bukreeva, I.N.; Duparre, A.
Konferenzbeitrag
1999Characterization of oxide etching and wafer cleaning using vapor phase anhydrous hydrofluoric acid and ozone
Bauer, A.J.; Froeschle, B.; Beichele, M.; Ryssel, H.
Konferenzbeitrag
1999Comparative study of the roughness of optical surfaces and thin films by x-ray scattering and atomic force microscopy
Asadchikov, V.E.; Duparre, A.; Jakobs, S.; Karabekov, Y.; Kozhevnikov, I.V.
Zeitschriftenaufsatz
1999Comparative study of the roughness of optical surfaces and thin films using atomic force microscopy, x-ray scattering, and light scattering methods
Kozhevnikov, I.V.; Asadchikov, V.E.; Duparre, A.; Gilev, O.N.; Havronin, N.A.; Krivonosov, Y.S.; Ostashev, V.I.; Steinert, J.
Konferenzbeitrag
1999Lateral Force Microscopy using Acoustic Friction Force Microscopy
Scherer, V.; Arnold, W.; Bhushan, B.
Zeitschriftenaufsatz
1999On the Contrast in Eddy Current Microscopy using Atomic Force Microscopes
Hirsekorn, S.; Rabe, U.; Boub, A.; Arnold, W.
Konferenzbeitrag
1999Probing Linear and Non-linear Tip-Sample Interaction Forces by Atomic Force Acoustic Microscopy
Rabe, U.; Arnold, W.; Kester, E.
Zeitschriftenaufsatz
1999Scanning probe method investigation of carbon nanotubes produced by high energy ion irradiation of graphite
Biro, L.P.; Mark, G.I.; Gyulai, J.; Rozlosnik, N.; Kurti, J.; Szabo, B.; Frey, L.; Ryssel, H.
Zeitschriftenaufsatz
1999Surface roughness characterization of smooth optical films deposited by ion plating
Jakobs, S.; Duparre, A.; Huter, M.; Pulker, H.K.
Zeitschriftenaufsatz
1999Wide-scale surface characterization by combination of scanning force microscopy, white light interferometry, and light scattering
Gliech, S.; Duparre, A.; Recknagel, R.-J.; Notni, G.
Konferenzbeitrag
1999X-ray and AFM studies of ultrthin films for EUV and soft X-ray applications
Asadchikov, V.E.; Duparre, A.; Kozhevnikov, I.V.; Krivonosov, Y.S.; Sagitov, S.I.
Konferenzbeitrag
1998Active Friction Control Using Ultrasonic Vibration
Scherer, V.; Arnold, W.
Konferenzbeitrag
1998AFM helps engineer low-scatter thin films
Duparre, A.; Kaiser, N.
Zeitschriftenaufsatz
1998Analysis of the High-Frequency Response of Atomic Force Microscope Cantilevers
Rabe, U.; Arnold, W.; Turner, J.
Zeitschriftenaufsatz
1998Messung von Mikrostrukturen in einem großen Skalenbereich durch Kombination von Weißlichtinterferometrie und Rasterkraftmikroskopie
Recknagel, R.-J.; Feigl, T.; Duparre, A.; Notni, G.
Konferenzbeitrag
1998Microscopic characterization of machined high-performance ceramics using acoustical, optical and mechanical NDT
Scherer, V.; Arnold, W.; Fassbender, S.; Weides, G.
Konferenzbeitrag
1998Microwear experiments on metal containing amorphous hydrocarbon hard coatings by AFM. Wear mechanisms and models for the load and time dependence
Schiffmann, K.I.
Zeitschriftenaufsatz
1998A model for particle growth in arc deposited amorphous carbon films
Drescher, D.; Koskinen, J.; Scheive, H.J.; Mensch, A.
Zeitschriftenaufsatz
1998Selective etching of III-V materials
Weyher, J.L.
Konferenzbeitrag
1998Transfer of Mechanical Vibration from a Sample to an AFM-Cantilever - A Theoretical Description
Hirsekorn, S.
Zeitschriftenaufsatz
1997Influence of substrate surface and film roughness on the quality of optical coatings for the UV spectral region
Duparre, A.; Jakobs, S.; Kaiser, N.
Konferenzbeitrag
1997Interpretation of atomic force microscope (AFM) signals from surface charge on insulators
Wintle, H.J.
Zeitschriftenaufsatz
1997Local Elasticity and Lubrication Measurements Using Atomic Force and Friction Force Microscopy at Ultrasonic Frequencies
Arnold, W.; Bhushan, B.; Rabe, U.; Scherer, V.
Zeitschriftenaufsatz
1997Materials Characterization Using High-Frequency Atomic Force Microscopy and Friction Force Microscopy
Meissner, O.; Arnold, W.; Janser, K.; Rabe, U.; Scherer, V.
Konferenzbeitrag
1997New method based on atomic force microscopy for in-depth characterization of damage in Si irradiated with 209 MeV Kr
Biro, L.P.; Gyulai, J.; Havancsak, K.; Didyk, A.Y.; Bogen, S.; Frey, L.; Ryssel, H.
Zeitschriftenaufsatz
1997Untersuchung von metallhaltigen amorphen Kohlenwasserstoff-Nanokompositen mittels Rastersondenmikroskopie und Röntgenkleinwinkelstreuung
Fryda, M.; Goerigk, G.; Schiffmann, K.I.
Zeitschriftenaufsatz, Konferenzbeitrag
1996Acoustic microscopy with resolution in the NM-range
Rabe, U.; Arnold, W.; Janser, K.
Konferenzbeitrag
1996Analysis of interface and volume inhomogenities in a multilayer system by light scattering methods
Pichlmaier, S.; Hehl, K.; Schuhmann, U.; Duparre, A.; Gliech, S.
Konferenzbeitrag
1996Combination of surface characterization techniques for investigating optical thin-film components
Duparre, A.; Jakobs, S.
Zeitschriftenaufsatz
1996Dependence of the surface morphology and scattering of optical coatings on film material, substrate roughness, and deposition process
Jakobs, S.; Feigl, T.; Duparre, A.
Konferenzbeitrag
1996Optical scattering and surface microstructure of thin films for laser application
Duparre, A.; Kiesel, A.; Gliech, S.
Zeitschriftenaufsatz
1996Roughness analysis of optical films and substrates by atomic force microscopy
Duparre, A.; Ruppe, C.
Zeitschriftenaufsatz
1996Vibrations of free and surface-coupled atomic force microscope cantilevers. Theory and experiment
Rabe, U.; Arnold, W.; Janser, K.
Zeitschriftenaufsatz
1995AFM investigations of the initial stages of prepolymer film growth on aluminium
Gesang, T.; Höper, R.; Dieckhoff, S.; Fanter, D.; Hartwig, A.; Possart, W.; Hennemann, O.-D.
Zeitschriftenaufsatz
1995The atomic force microscope as a near-filed probe for ultrasound
Rabe, U.; Arnold, W.; Dvorak, M.
Zeitschriftenaufsatz
1995Atomic force microscopy on cross-section of optimal coatings: a new method
Duparre, A.; Ruppe, C.; Pischow, K.A.; Adamik, M.; Barna, P.B.
Zeitschriftenaufsatz
1995Comparative film thickness determination by atomic force microscopy and ellipsometry for ultrathin prepolymer films
Gesang, T.; Fanter, D.; Höper, R.; Possart, W.; Hennemann, O.-D.
Zeitschriftenaufsatz
1995Imaging elastic sample properties with an atomic force microscope operating in the Tapping Mode
Höper, R.; Gesang, T.; Possart, W.; Hennemann, O.-D.; Boseck, S.
Zeitschriftenaufsatz
1995Measurement of microtopography and surface properties of micromchined surfaces employing atomic force microscopy and near-field acoustic microscopy
Scherer, V.; Rabe, U.; Arnold, W.
Konferenzbeitrag
1995Prepolymer film growth by adsorption out of solution on silicon and aluminium. An atomic force microscope study
Gesang, T.; Höper, R.; Dieckhoff, S.; Hartwig, A.; Possart, W.; Hennemann, O.-D.
Zeitschriftenaufsatz
1994Atomic force microscopy at MHz frequencies
Arnold, W.; Rabe, U.
Zeitschriftenaufsatz
1994Charakterisierung ultrapräzisionsbearbeiteter Materialien mittels Rastersonden-Mikroskopie
Rabe, U.; Arnold, W.; Scherer, V.; Riemer, O.; Preuß, W.; Brinksmeier, E.
Konferenzbeitrag
1994Charakterisierung ultrapräzisionsbearbeiteter Materialien mittels Rastersonden-Mikroskopie (ASPE)
Rabe, U.; Arnold, W.; Scherer, V.; Fechner, R.; Schindler, A.; Riemer, O.; Preuß, W.; Brinksmeier, E.
Konferenzbeitrag
1994Generic detrending of surface profiles
Duparre, A.; Rothe, H.; Jakobs, S.
Zeitschriftenaufsatz
1994Investigation of heteroepitaxial diamond films by scanning tunneling and atomic force microscopy
Jiang, X.; Schiffmann, K.I.
Zeitschriftenaufsatz
1994Roughness and scattering measurements on thin films for UV/VIS applications
Duparre, A.; Kiesel, A.; Kaiser, N.; Truckenbrodt, H.; Schuhmann, U.
Konferenzbeitrag
1994Single-shell carbon nanotubes imaged by atomic force microscopy.
Höper, R.; Workman, R.K.; Chen, D.; Sarid, D.; Yadav, T.; Withers, J.C.; Loutfy, R.O.
Zeitschriftenaufsatz
1993Atomic-force-microscopic study of heteroepitaxial diamond nucleation on (100) silicon
Jiang, X.; Schiffmann, K.I.; Westphal, A.; Klages, C.-P.
Zeitschriftenaufsatz
1993Investigation of fabrication parameters for the electron-beam induced deposition of contamination tips used in atomic force microscopy
Schiffmann, K.I.
Zeitschriftenaufsatz
1992Diamond membrane based X-ray masks
Löchel, B.; Huber, H.-L.; Klages, C.-P.; Schäfer, L.; Bluhm, A.
Konferenzbeitrag