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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2018Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology
Dammann, Michael; Baeumler, Martina; Brueckner, Peter; Kemmer, Tobias; Konstanzer, Helmer; Graff, Andreas; Simon-Najasek, Michél; Quay, Rüdiger
Zeitschriftenaufsatz
2005Reliability of 50 nm low-noise metamorphic HEMTs and LNAs
Dammann, M.; Leuther, A.; Tessmann, A.; Massler, H.; Mikulla, M.; Weimann, G.
Zeitschriftenaufsatz
2000Effect of drain voltage on channel temperature and reliability of pseudomorphic InP-based HEMTs
Dammann, M.; Chertouk, M.; Jantz, W.; Köhler, K.; Marsetz, W.; Schmidt, K.; Weimann, G.
Zeitschriftenaufsatz
1993Quantitative analysis of Be diffusion in delta-doped AlInAs and GaInAs during MBE growth
Passenberg, W.; Harde, P.
Konferenzbeitrag