Fraunhofer-Gesellschaft

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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2007High speed rotation hardening of steel shafts and holes with high power diode lasers
Claus, G.; Seifert, M.
Konferenzbeitrag
2003SIMS depth profiling of InGaAsN/InAlAs quantum wells on InP
Maier, M.; Serries, D.; Geppert, T.; Köhler, K.; Güllich, H.; Herres, N.
Zeitschriftenaufsatz
2002Kernresonanz in Aufsatztechnik
Wolter, B.; Dobmann, G.; Surkova, N.; Kohl, F.
Zeitschriftenaufsatz
1997Beryllium diffusion in short-period Al(x)Ga(1-x)As/AlAs-superlattices and vertically compact laser structures grown by molecular beam epitaxy
Gaymann, A.; Maier, M.; Bronner, W.; Grün, N.; Köhler, K.
Zeitschriftenaufsatz
1993A case study for XPD in the presence of a compositional depth profile - interface formation between metals -Ag, Al- and HgCdTe.
Seelmann-Eggebert, M.; Carey, G.P.; Klauser, R.; Richter, H.J.
Zeitschriftenaufsatz
1993Monolayer-resolved x-ray-excited Auger-electron diffraction from single-plane emission in GaAs
Seelmann-Eggebert, M.; Fasel, U.; Larkins, E.C.; Osterwalder, J.
Zeitschriftenaufsatz
1992Effect of cleanings on the composition of HgCdTe surfaces.
Seelmann-Eggebert, M.; Carey, G.; Krishnamurthy, V.; Helms, C.R.
Zeitschriftenaufsatz
1988Depth-compositional analyses -angle-resolved x-ray photoelectron spectroscopy- of degradations on etched mercury cadmium telluride.
Seelmann-Eggebert, M.; Richter, H.J.
Zeitschriftenaufsatz
1987Depth profile analysis of hydrogenated carbon layers on silicon and germanium by XPS, AES and SIMS
Sander, P.; Wiedmann, L.; Benninghoven, A.; Sah, R.E.
Konferenzbeitrag