Fraunhofer-Gesellschaft

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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2005Assessment of layer composition and thickness in AlGaN/GaN HEMT structures by spectroscopic ellipsometry
Baeumler, M.; Müller, S.; Köhler, K.; Wagner, J.
Zeitschriftenaufsatz, Konferenzbeitrag
2003Optical evaluation of spatial carrier concentration fluctuations in doped InP substrates
Baeumler, M.; Diwo, E.; Jantz, W.; Sahr, U.; Müller, G.; Grant, I.
Konferenzbeitrag
2002Photoluminescence topography of sulfur doped 2'' InP grown by the vertical gradient freeze technique
Sahr, U.; Mueller, G.; Grant, I.; Baeumler, M.; Jantz, W.
Konferenzbeitrag
1990Characterization of conducting GaAs multilayers by infrared spectroscopy at oblique incidence
Grosse, P.; Harbecke, B.; Heinz, B.; Maier, M.; Jantz, W.
Zeitschriftenaufsatz
1987Characterization of active layers in GaAs by microwave absorption
Bachem, H.; Jantz, W.; Frey, T.
Zeitschriftenaufsatz