Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2020Charged Device Model (CDM) and Capacitive Coupled Transmission Line Pulsing (CC-TLP) Stress Severity Study on RF ICs
Abessolo-Bidzo, Dolphin; Weber, Johannes; Kiriliouk, Victoria; Wolf, Heinrich; Verwoerd, Sheela; Jirutková, Ellen
Konferenzbeitrag
2020Discharge current analysis with charged connector pins
Tamminen, Pasi; Fung, Rita; Wong, Rick; Weber, Johannes; Wolf, Heinrich
Zeitschriftenaufsatz
2020Impact of Alternative CDM Methods on HV ESD Protections Behavior
Biccari, Leonardo di; Boroni, Andrea; Castelnovo, Alessandro; Zullino, Lucia; Cerati, Lorenzo; Wolf, Heinrich; Weber, Johannes; Andreini, Antonio
Konferenzbeitrag
2020Modifikation von Silikonen mit elektrisch leitfähigen Füllstoffen zur Ableitung elektrischer oder elektrostatischer Ladungen
Langer, Maurice; Klotzbach, Annett; Wanielik, Adrian; Leicht, Heinrich; Kraus, Eduard; Baudrit, Benjamin; Hochrein, Thomas
Zeitschriftenaufsatz
2019Pulsed High Current Characterization of Highly Integrated Circuits and System
Weber, Johannes
: Maurer, Linus
Dissertation
2019Secondary Discharge during System Level ESD Tests
Wolf, Heinrich; Weber, Johannes; Gieser, Horst
Konferenzbeitrag
2018Comparison of CDM and CC-TLP robustness for an ultra-high speed interface IC
Weber, Johannes; Fung, Rita; Wong, Richard; Wolf, Heinrich; Gieser, A. Horst; Maurer, Linus
Konferenzbeitrag
2018ESD robustness of IoT devices: Are we going to face new challenges?
Wolf, Heinrich
Vortrag
2017Charge/discharge effects and ESD prevention at the example of RFID smart card manufacturing
Jacob, Peter; Thiemann, Uwe; Weber, Johannes; Gieser, Horst; Wolf, Heinrich
Konferenzbeitrag
2017Simulation and experimental investigation of slew rate related ESD failures of CDM and CC-TLP
Weber, Johannes; Kaschani, Karim T.; Gieser, Horst; Wolf, Heinrich; Maurer, Linus; Famulok, Nicolai; Moser, Reinhard; Rajagopal, Krishna; Sellmayer, Michael; Sharma, Anmol; Tamm, Heiko
Konferenzbeitrag
2009Pulsed behavior of polymer protection devices
Bonfert, D.; Gieser, H.; Bock, K.; Svasta, P.; Ionescu, C.
Konferenzbeitrag
2007Implementation aspects of the EU directive on energy end-use efficiency and energy services in Germany
Schlomann, B.; Eichhammer, W.; Gruber, E.
Konferenzbeitrag
2007Investigations with the capacitive coupled TLP on package and wafer-level
Wolf, H.; Gieser, H.
Konferenzbeitrag
2007Survey on very fast TLP and ultra fast repetitive pulsing for characterization in the CDM-domain
Gieser, H.A.; Wolf, H.
Konferenzbeitrag
2006Modellierung von Prüfsystemen und Schutzelementen zur Kompaktsimulation von elektrostatischen Entladungen an integrierten Schaltungen
Wolf, H.
Dissertation
2005Capacitively coupled transmission line pulsing cc-TLP - a traceable and reproducible stress method in the CDM-domain
Wolf, H.; Gieser, H.; Stadler, W.; Wilkening, W.
Zeitschriftenaufsatz
2005Comparing arc-free capacitive coupled transmission line pulsing CC-TLP with standard CDM testing and CDM field failures
Gieser, H.; Wolf, H.; Iberl, F.
Konferenzbeitrag
2003A traceable method for the arc-free characterization and modeling of CDM-testers and pulse metrology chains
Gieser, H.; Wolf, H.; Soldner, W.; Reichl, H.; Andreini, A.; Natarajan, M.I.; Stadler, W.
Konferenzbeitrag
2002ESD in silicon integrated circuits
Anderson, W.; Gieser, H.; Ramaswamy, S.
: Amerasekera, E.A.; Duvvury, C.
Buch
1996ESD monitor circuit. A tool to investigate the susceptibility and failure mechanisms of the charged device model
Egger, P.; Gieser, H.; Kropf, R.; Guggenmos, X.
Zeitschriftenaufsatz
1995Aufbau eines Rechteckimpuls-Generators nach dem Transmission-Line-Prinzip mit verschiedenen Pulsdauern und Belastung von Halbleiter-Schutzstrukturen
Mußhoff, C.; Wolf, H.; Gieser, H.
Konferenzbeitrag
1995CDM-Testervergleich anhand eines Monitor-Schaltkreises
Egger, P.; Kropf, R.; Gieser, H.; Guggenmos, X.
Konferenzbeitrag
1995ESD monitor circuit. A tool to investigate the susceptibility and failure mechanisms of the charged device model
Egger, P.; Gieser, H.; Kropf, R.; Guggenmos, X.
Konferenzbeitrag
1994Analysis of HBM ESD testers and specifications using a fourth-order lumped element model
Verhaege, K.; Roussel, P.J.; Groeseneken, G.; Maes, H.E.; Gieser, H.; Russ, C.; Egger, P.; Guggenmos, X.; Kuper, F.G.
Zeitschriftenaufsatz
1994A CMD-only reproducible field degradation and its reliability aspect
Gieser, H.A.; Egger, P.; Reiner, J.C.; Herrmann, M.R.
Zeitschriftenaufsatz
1994Compact electro-thermal simulation of ESD-protection elements
Russ, C.; Gieser, H.; Egger, P.; Irl, S.
Zeitschriftenaufsatz
1994ESD protection elements during HBM stress tests - further numerical and experimental results
Russ, C.; Gieser, H.; Verhaege, K.
Konferenzbeitrag
1994ESD protection elements during HBM stress tests - further numerical and experimental results
Russ, C.; Gieser, H.; Verhaege, K.
Konferenzbeitrag
1994Influence of tester parasitics on "charged devive model"-failure thresholds
Gieser, H.A.; Egger, P.
Konferenzbeitrag
1994Survey on electrostatic susceptibility of integrated circuits
Gieser, H.; Ruge, I.
Konferenzbeitrag