Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2020Charged Device Model (CDM) and Capacitive Coupled Transmission Line Pulsing (CC-TLP) Stress Severity Study on RF ICs
Abessolo-Bidzo, Dolphin; Weber, Johannes; Kiriliouk, Victoria; Wolf, Heinrich; Verwoerd, Sheela; Jirutková, Ellen
Konferenzbeitrag
2020Discharge current analysis with charged connector pins
Tamminen, Pasi; Fung, Rita; Wong, Rick; Weber, Johannes; Wolf, Heinrich
Zeitschriftenaufsatz
2020Impact of Alternative CDM Methods on HV ESD Protections Behavior
Biccari, Leonardo di; Boroni, Andrea; Castelnovo, Alessandro; Zullino, Lucia; Cerati, Lorenzo; Wolf, Heinrich; Weber, Johannes; Andreini, Antonio
Konferenzbeitrag
2019Pulsed High Current Characterization of Highly Integrated Circuits and System
Weber, Johannes
: Maurer, Linus
Dissertation
2018Comparison of CDM and CC-TLP robustness for an ultra-high speed interface IC
Weber, Johannes; Fung, Rita; Wong, Richard; Wolf, Heinrich; Gieser, A. Horst; Maurer, Linus
Konferenzbeitrag
2017Charge/discharge effects and ESD prevention at the example of RFID smart card manufacturing
Jacob, Peter; Thiemann, Uwe; Weber, Johannes; Gieser, Horst; Wolf, Heinrich
Konferenzbeitrag
2017Simulation and experimental investigation of slew rate related ESD failures of CDM and CC-TLP
Weber, Johannes; Kaschani, Karim T.; Gieser, Horst; Wolf, Heinrich; Maurer, Linus; Famulok, Nicolai; Moser, Reinhard; Rajagopal, Krishna; Sellmayer, Michael; Sharma, Anmol; Tamm, Heiko
Konferenzbeitrag
2007Investigating the CDM susceptibility of ICs at package and wafer level by capacitive coupled TLP
Wolf, H.; Gieser, H.; Walter, D.
Konferenzbeitrag
2007Investigations with the capacitive coupled TLP on package and wafer-level
Wolf, H.; Gieser, H.
Konferenzbeitrag
2007Survey on very fast TLP and ultra fast repetitive pulsing for characterization in the CDM-domain
Gieser, H.A.; Wolf, H.
Konferenzbeitrag
2006Modellierung von Prüfsystemen und Schutzelementen zur Kompaktsimulation von elektrostatischen Entladungen an integrierten Schaltungen
Wolf, H.
Dissertation
2005Capacitively coupled transmission line pulsing cc-TLP - a traceable and reproducible stress method in the CDM-domain
Wolf, H.; Gieser, H.; Stadler, W.; Wilkening, W.
Zeitschriftenaufsatz
2005Comparing arc-free capacitive coupled transmission line pulsing CC-TLP with standard CDM testing and CDM field failures
Gieser, H.; Wolf, H.; Iberl, F.
Konferenzbeitrag
2003A traceable method for the arc-free characterization and modeling of CDM-testers and pulse metrology chains
Gieser, H.; Wolf, H.; Soldner, W.; Reichl, H.; Andreini, A.; Natarajan, M.I.; Stadler, W.
Konferenzbeitrag
2000Analyzing the switching behavior of ESD-protection transistors by very fast transmission line pulsing
Wolf, H.; Gieser, H.; Wilkening, W.
Zeitschriftenaufsatz
1996ESD monitor circuit. A tool to investigate the susceptibility and failure mechanisms of the charged device model
Egger, P.; Gieser, H.; Kropf, R.; Guggenmos, X.
Zeitschriftenaufsatz
1995CDM-Testervergleich anhand eines Monitor-Schaltkreises
Egger, P.; Kropf, R.; Gieser, H.; Guggenmos, X.
Konferenzbeitrag
1995ESD monitor circuit. A tool to investigate the susceptibility and failure mechanisms of the charged device model
Egger, P.; Gieser, H.; Kropf, R.; Guggenmos, X.
Konferenzbeitrag
1994A CMD-only reproducible field degradation and its reliability aspect
Gieser, H.A.; Egger, P.; Reiner, J.C.; Herrmann, M.R.
Zeitschriftenaufsatz
1994Influence of tester parasitics on "charged devive model"-failure thresholds
Gieser, H.A.; Egger, P.
Konferenzbeitrag
1994Survey on electrostatic susceptibility of integrated circuits
Gieser, H.; Ruge, I.
Konferenzbeitrag