Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2018Air plasma treatment of aluminium trihydrate filled poly(methyl methacrylate)
Vovk, M.; Wallenhorst, L.; Kaldun, C.; Meuthen, J.N.; Arendt, A.L.; Sernek, M.; Zigon, J.; Kaufmann, D.E.; Viöl, W.; Dahle, S.
Zeitschriftenaufsatz
2018Force-induced unravelling of DNA origami
Engel, Megan C.; Smith, David M.; Jobst, Markus A.; Sajfutdinow, Martin; Liedl, Tim; Romano, Flavio; Rovigatti, Lorenzo; Louis, Ard A.; Doye, Jonathan P.K.
Zeitschriftenaufsatz
2018Nano- and micro-patterned S-, H- and X-PDMS for cell-based applications: Comparison of wettability, roughness and cell-derived parameters
Scharin-Mehlmann, Marina; Häring, Aaron; Rommel, Mathias; Dirnecker, Tobias; Friedrich, Oliver; Frey, Lothar; Gilbert, Daniel F.
Zeitschriftenaufsatz
2017An end of service life assessment of PMMA lenses from veteran concentrator photovoltaic systems
Miller, D.C.; Khonkar, H.I.; Herrero, R.; Anton, I.; Johnson, D.K.; Hornung, T.; Schmid-Schirling, T.; Vinzant, T.B.; Deutch, S.; To, B.; Sala, G.; Kurtz, S.R.
Zeitschriftenaufsatz
2017Phase transformation in AFM silicon tips
Kopycinska-Müller, Malgorzata; Barth, Martin; Küttner, Martin; Köhler, Bernd
Zeitschriftenaufsatz
2016Mechanical characterization of porous nano-thin films by use of atomic force acoustic microscopy
Kopycinska-Müller, Malgorzata; Clausner, André; Yeap, Kong Boon Oon; Köhler, Bernd; Kuzeyeva, Nataliya; Mahajan, Sukesh; Savage, Travis; Zschech, Ehrenfried; Wolter, Klaus-Jürgen
Zeitschriftenaufsatz
2016Piezo-force and vibration analysis of ZnO nanowire arrays for sensor application
Christian, B.; Volk, J.; Lukács, I.E.; Sautieffc, E.; Sturm, C.; Graillot, A.; Dauksevicius, R.; O'Reilly, E.; Ambacher, O.; Lebedev, V.
Zeitschriftenaufsatz, Konferenzbeitrag
2016Tribological wear analysis and numerical lifetime prediction of glassy carbon tools in fused silica molding
Dukwen, Julia; Friedrichs, Marcel; Liu, Gang; Tang, Minjie; Dambon, Olaf; Klocke, Fritz
Zeitschriftenaufsatz
2015Influence of growth temperature on the defect density for 4H-SiC homoepitaxy
Kaminzky, Daniel; Roßhirt, Katharina; Kallinger, Birgit; Berwian, Patrick; Friedrich, Jochen
Poster
2014Engineering of a bio-functionalized hybrid off-the-shelf heart valve
Hinderer, Svenja; Seifert, Jan; Votteler, Miriam; Shen, Nian; Rheinlaender, Johannes; Schäffer, Tilman E; Schenke-Layland, Katja
Zeitschriftenaufsatz
2012Atomic force microscopy probes with integrated boron doped diamond electrodes: Fabrication and application
Eifert, A.; Smirnov, W.; Frittmann, S.; Nebel, C.E.; Mizaikoff, B.; Kranz, C.
Zeitschriftenaufsatz
2011The creation of a biomimetic interface between boron-doped diamond and immobilized proteins
Hoffmann, R.; Kriele, A.; Obloh, H.; Tokuda, N.; Smirnov, W.; Yang, N.; Nebel, C.E.
Zeitschriftenaufsatz
2011Gate oxide reliability at the nano-scale evaluated by combining cAFM and CVS
Erlbacher, T.; Yanev, V.; Rommel, M.; Bauer, A.J.; Frey, L.
Zeitschriftenaufsatz, Konferenzbeitrag
2010Electrical scanning probe microscopy techniques for the detailed characterization of high-k dielectric layers
Rommel, M.; Yanev, V.; Paskaleva, A.; Erlbacher, T.; Lemberger, M.; Bauer, A.J.; Frey, L.
Konferenzbeitrag
2010Fabrication of metallic SPM tips by combining UV nanoimprint lithography and focused ion beam processing
Jambreck, J.D.; Schmitt, H.; Amon, B.; Rommel, M.; Bauer, A.J.; Frey, L.
Zeitschriftenaufsatz, Konferenzbeitrag
2010Manufacturing, characterization, and application of nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy
Jambreck, J.D.; Yanev, V.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.
Poster
2010Nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy: Manufacturing, characterization, and application
Jambreck, J.D.; Yanev, V.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.
Poster
2009Observation of local internal friction and plasticity onset in nanocrystalline nickel by atomic force acoustic microscopy
Caron, A.; Arnold, W.
Zeitschriftenaufsatz
2008Electrical AFM techniques for the advanced characterization of materials in semiconductor technology
Yanev, V.; Rommel, M.; Spoldi, G.; Beuer, S.; Amon, B.; Petersen, S.; Lugstein, A.; Steiger, A.; Bauer, A.J.; Ryssel, H.
Poster
2007Combinatorial synthesis of thin mixed oxide films and automated study of their piezoelectric properties
Rende, D.; Schwarz, K.; Rabe, U.; Maier, W.F.; Arnold, W.
Konferenzbeitrag, Zeitschriftenaufsatz
2007Combinatorial synthesis of thin mixed oxide-films and examinations of their piezoelectricity by ultrasonic piezo-mode imaging
Rende, D.; Maier, W.F.; Schwarz, K.; Rabe, U.; Arnold, W.
Konferenzbeitrag
2007Verification of grain boundaries in annealed thin ZrO2 films by electrical AFM technique
Yanev, V.; Paskaleva, A.; Weinreich, W.; Lemberger, M.; Petersen, S.; Rommel, M.; Bauer, A.J.; Ryssel, H.
Poster
2006Mikrotribologische Untersuchungen dünner Schichten unter Anwendung rastersondenbasierter Verfahren
Küster, R.
Dissertation
2005Scanning force microscopy for optical surface metrology
Flemming, M.; Roder, K.; Duparre, A.
Konferenzbeitrag
2005Zerstörungsfreie Prüfverfahren für die Elektronik, mikrobearbeitete Strukturen und Baugruppen
Köhler, B.; Schreiber, J.; Bendjus, B.; Herms, M.; Melov, V.G.; Krüger, P.; Meyendorf, N.
Zeitschriftenaufsatz
2004Atomic force microscopy with lateral modulation
Scherer, V.; Reinstädtler, M.; Arnold, W.
Aufsatz in Buch
2004Determination of local stress intensity factor at crack tip using image correlation techniques
Tsai, Y.; Keller, J.; Eylon, D.; Vogel, D.; Michel, B.; Meyendorf, N.
Konferenzbeitrag
2003Silver thick-film contacts on highly doped n-type silicon emitters: Structural and electronic properties of the interface
Ballif, C.; Huljic, D.M.; Willeke, G.; Hessler-Wyser, A.
Zeitschriftenaufsatz
2002Growth of Ag films on PET deposited by magnetron sputtering
Charton, C.; Fahland, M.
Zeitschriftenaufsatz
2002Reliability of thinned silicon ICs
Landesberger, C.; Bollmann, D.; Klink, G.; Bock, H.; Reichl, H.
Konferenzbeitrag
2001Rastersondertechniken
Reschke, S.
Zeitschriftenaufsatz
2000Analysis of peculiar structural defects created in GaAs by diffusion of copper
Frigeri, C.; Weyher, J.; Müller, S.; Hiesinger, P.
Zeitschriftenaufsatz
2000Studies on phase transformations of Cu-phthalocyanine thin films
Berger, O.; Fischer, W.-J.; Adolphi, B.; Tierbach, S.; Melov, V.G.; Schreiber, J.
Zeitschriftenaufsatz
1999DUV light scattering and morphology of ion beam sputtered fluoride coatings
Quesnel, E.; Petit dit Dariel, A.; Duparre, A.; Ferre-Borrull, J.; Steinert, J.
Konferenzbeitrag
1999Hochauflösende Topometrie im Kontext globaler Makrostrukturen
Duparre, A.; Notni, G.; Recknagel, R.-J.; Feigl, T.; Gliech, S.
Zeitschriftenaufsatz
1998Comparative study of surface roughness measured on polysilicon using spectroscopic ellipsometry and atomic force microscopy
Petrik, P.; Biro, L.P.; Fried, M.; Lohner, T.; Berger, R.; Schneider, C.; Gyulai, J.; Ryssel, H.
Zeitschriftenaufsatz
1998Scatter investigation of UV-films. Facing the trend towards shorter wavelength
Duparre, A.; Kaiser, N.
Konferenzbeitrag
1998Wide scale surface measurement using white light interferometry and atomic force microscopy
Recknagel, R.-J.; Feigl, T.; Duparre, A.; Notni, G.
Konferenzbeitrag
1997Adhesion Mechanism of Aluminum, Aluminum Oxide, and Silicon Oxide on Biaxially Oriented Polypropylene (BOPP), Poly(ethyleneterephthalate) (PET), and Poly(vinyl Chloride) (PVC)
Bichler, C.; Langowski, H.-C.; Moosheimer, U.; Seifert, B.
Zeitschriftenaufsatz
1997Characterization of vapor phase deposited organic molecules on silicon surfaces
Dieckhoff, S.; Höper, R.; Schlett, V.; Gesang, T.; Possart, W.; Hennemann, O.-D.; Günster, J.; Kempter, V.
Zeitschriftenaufsatz
1997Progress in the layer thickness determination of AlGaAs/GaAs heterostructures using selective etching and AFM imaging of the (110) cleavage planes
Müller, S.; Weyher, J.L.; Dian, R.; Jantz, W.
Zeitschriftenaufsatz
1997Structural and optical properties of AlGaN/GaN quantum well structures grown by MOCVD on sapphire
Niebuhr, R.; Bachem, K.H.; Behr, D.; Hoffmann, C.; Kaufmann, U.; Lu, Y.; Santic, B.; Wagner, J.; Arlery, M.; Rouviere, J.L.; Jürgensen, H.
Konferenzbeitrag
1996Adhesion and film structure of cyanurates on solids
Possart, W.; Dieckhoff, S.; Gesang, T.; Schlett, V.; Hennemann, O.-D.
Konferenzbeitrag
1996Combination of selective etching and AFM imaging for the thickness analysis of AlGaAs/GaAs heterostructures
Müller, S.; Weyer, J.L.; Köhler, K.; Jantz, W.; Frigeri, C.
Konferenzbeitrag
1995AFM - Abbildung feinster Strukturen
Gesang, T.; Höper, R.; Possart, W.; Hennemann, O.-D.
Zeitschriftenaufsatz
1995Formation of surface defects on polymer lenses depending on moisture absorption
Schulz, U.; Jakobs, S.; Anton, B.; Kaiser, N.
Konferenzbeitrag
1995Imaging elastic sample properties with an atomic force microscope operating in the Tapping Mode
Höper, R.; Gesang, T.; Possart, W.; Hennemann, O.-D.; Boseck, S.
Zeitschriftenaufsatz
1995Investigation of surface topography, morphology and structure of hard amorphous carbon films by AFM and TEM
Drescher, D.; Kolitsch, A.; Mensch, A.; Scheibe, H.J.
Konferenzbeitrag
1995Kraftmikroskopische Untersuchungen an Ultrapräzisionsbearbeiteten Oberflächen
Scherer, Volker
Diplomarbeit
1995Organic film formation investigated by atomic force microscopy on the nanometer scale
Gesang, T.; Höper, R.; Dieckhoff, S.; Schlett, V.; Possart, W.; Hennemann, O.-D.
Zeitschriftenaufsatz
1995Quantitative Erfassung von Oberflächentopographien
Gesang, T.; Höper, R.; Possart, W.; Hennemann, O.-D.
Zeitschriftenaufsatz
1994Investigation of heteroepitaxial diamond films by scanning tunneling and atomic force microscopy
Jiang, X.; Schiffmann, K.I.
Zeitschriftenaufsatz
1994Nucleation and initial growth phase of diamond thin films on (100) silicon
Jiang, X.; Klages, C.-P.; Schiffmann, K.I.
Zeitschriftenaufsatz
1993Atomic-force-microscopic study of heteroepitaxial diamond nucleation on (100) silicon
Jiang, X.; Schiffmann, K.I.; Westphal, A.; Klages, C.-P.
Zeitschriftenaufsatz
1993Investigation of fabrication parameters for the electron-beam induced deposition of contamination tips used in atomic force microscopy
Schiffmann, K.I.
Zeitschriftenaufsatz
1992Influence of a RF plasma on the nucleation of aluminium using n-trimethy lamine-alane -TMAA- as precursor
Bringmann, U.; Klages, C.-P.; Weber, A.; Schiffmann, K.I.
Konferenzbeitrag