Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Influence of Glassy Carbon Surface Finishing on its Wear Behavior during Precision Glass Moulding of Fused Silica
Grunwald, Tim; Wilhelm, Dennis Patrick; Dambon, Olaf; Bergs, Thomas
Journal Article
2019Inline application of digital holography [Invited]
Fratz, Markus; Beckmann, Tobias; Anders, Joachim; Bertz, Alexander; Bayer, Markus; Gießler, Thomas; Nemeth, Christian; Carl, Daniel
Journal Article
2016Quantitative comparison of measurement methods for the evaluation of micro- and nanostructures written with 2PP
Harnisch, Emely Marie; König, Niels; Schmitt, Robert
Conference Paper
2003Absolute distance measurement with miniaturized fiber-optic white light interferometer
Bosbach, C.; Depiereux, F.; Pfeifer, T.
Conference Paper
2002Extending the capabilities of scanning probe microscopy for microroughness analysis in surface engineering
Ferre-Borrull, J.; Steinert, J.; Duparre, A.
Journal Article
2002Fiber-optic interferometer for absolute distance measurements with high measuring frequency
Depiereux, F.; Bosbach, C.; Pfeifer, T.
Conference Paper
2002New concepts for a fiber based white light interferometer for absolute distance measurements
Depiereux, F.; Bosbach, C.; Michelt, B.; Pfeifer, T.
Conference Paper
1999Multi-type surface and thin film characterization using light scattering, scanning force microscopy and white light interferometry
Duparre, A.; Notni, G.
Conference Paper
1999Wide-scale surface characterization by combination of scanning force microscopy, white light interferometry, and light scattering
Gliech, S.; Duparre, A.; Recknagel, R.-J.; Notni, G.
Conference Paper
1998Analysis of white light interferograms using wavelet methods
Recknagel, R.-J.; Notni, G.
Journal Article
1998Messung von Mikrostrukturen in einem großen Skalenbereich durch Kombination von Weißlichtinterferometrie und Rasterkraftmikroskopie
Recknagel, R.-J.; Feigl, T.; Duparre, A.; Notni, G.
Conference Paper
1998Wide scale surface measurement using white light interferometry and atomic force microscopy
Recknagel, R.-J.; Feigl, T.; Duparre, A.; Notni, G.
Conference Paper
1997Measurement and analysis of microtopography using wavelet methods
Recknagel, R.-J.; Notni, G.
Conference Paper