Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2016A conceptual model to understand the correlation between topography and wetting of polypropylene- and polyethylene-based wood-plastic composites
Calvimontes, A.; Bellmann, C.; Schirp, C.; Schirp, A.
Journal Article
2016Effect of electron beam treatment in air on surface properties of ultra-high-molecular-weight polyethylene
Grubova, Irina Y.; Surmeneva, Maria A.; Shugurov, V.V.; Koval, N.N.; Selezneva, Irina I.; Lebedev, S.M.; Surmenev, Roman A.
Journal Article
2015Adapted surface properties of hot forging tools using plasma technology for an effective wear reduction
Paschke, H.; Yilkiran, T.; Lippold, L.; Brunotte, K.; Weber, M.; Bräuer, G.; Behrens, B.-A.
Conference Paper, Journal Article
2015Neue Konzepte zur Verschleißreduzierung bei Werkzeugen der Warmmassivumformung
Paschke, H.; Weber, M.; Yilkiran, T.
Journal Article
2015Relation between light trapping and surface topography of plasma textured crystalline silicon wafers
Souren, F.M.M.; Rentsch, J.; Sanden, M.C.M. van de
Journal Article
2011TCAD challenges and some Fraunhofer solutions
Lorenz, J.
Conference Paper
2008Flexible robot-based inline quality monitoring using picture-giving sensors
Sung, C.-K.; Jacubasch, A.; Müller, T.
Conference Paper
2003Laser structuring and modification of surfaces for chemical and medical micro components
Bremus-Köbberling, E.; Gillner, A.
Conference Paper
2003Nondestructive topographic resistivity evaluation of semi-insulating SiC substrates
Stibal, R.; Müller, S.; Jantz, W.; Pozina, G.; Magnusson, B.; Ellison, A.
Journal Article
2002Strengthening of ceramics by shot peening
Pfeiffer, W.; Frey, T.
Conference Paper, Journal Article
2002Topographic electrical characterization of semi-insulating GaAs, InP and SiC substates
Stibal, R.; Müller, S.; Jantz, W.
Conference Paper
2000Optimizing edge topography of alternating phase shift masks using rigorous mask modelling
Friedrich, C.; Mader, L.; Erdmann, A.; List, S.; Gordon, R.; Kalus, C.; Griesinger, U.; Pforr, R.; Mathuni, J.; Ruhl, G.; Maurer, W.
Conference Paper
1999Contactless mapping of mesoscopic resistivity variations in semi-insulating substrates
Stibal, R.; Wickert, M.; Hiesinger, P.; Jantz, W.
Journal Article
1999High resolution EL2 and resistivity topography of Si GaAs wafers
Wickert, M.; Stibal, R.; Hiesinger, P.; Jantz, W.; Wagner, J.; Jurisch, M.; Kretzer, U.; Weinert, B.
Conference Paper
1995Investigation of surface topography, morphology and structure of hard amorphous carbon films by AFM and TEM
Drescher, D.; Kolitsch, A.; Mensch, A.; Scheibe, H.J.
Conference Paper
1993Contactless resistivity mapping of semi-insulating substrates.
Jantz, W.; Stibal, R.
Journal Article
1991Ambient and low temperature photoluminescence topography of GaAs substrates, epitaxial and implanted layers.
Wang, Z.M.; As, D.J.; Jantz, W.; Windscheif, J.
Journal Article
1991Quality assessment of liquid encapsulated Czochralski grown semi-insulating GaAs substrates.
Jantz, W.
Book Article