Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Numerical simulations of melt pool dynamics in powder-bed additive manufacturing processes
Bierwisch, C.
Conference Paper
2018Influence of surface state on properties of Ni-Mn-Ga actuator elements
Böhm, Andrea; Schneider, Jörg; Drossel, Welf-Guntram; Pagounis, Emmanouel; Laufenberg, Markus
Conference Paper
2018UV-blocking properties of Zn/ZnO coatings on wood deposited by cold plasma spraying at atmospheric pressure
Wallenhorst, L.M.; Gurău, L.; Gellerich, A.; Militz, H.; Ohms, G.; Viöl, W.
Journal Article
2017Surface roughness and foam morphology of cellulose acetate sheets foamed with 1,3,3,3-tetrafluoropropene
Hopmann, Christian H.; Hendriks, Sven; Spicker, Claudia; Zepnik, Stefan; Lück, Frank van
Journal Article
2016Adhesion force mapping on wood by atomic force microscopy
Jin, X.; Kasal, B.
Journal Article
2016Coatings with a High Surface Roughness Prepared by a Co-sputtering Method Using Dual Rotatable Magnetrons
Preußner, Thomas; Junghähnel, Manuela; Hartung, Ullrich; Kopte, Torsten
Conference Paper
2016Illumination aspects of sparse line arrays for 3D terahertz imaging
Baccouche, Bessem; Mohammadzadeh, Shiva; Keil, Andreas; Kahl, Matthias; Haring Bolivar, Peter; Loeffler, Torsten; Jonuscheit, Joachim; Sauer-Greff, Wolfgang; Urbansky, Ralph; Friederich, Fabian
Conference Paper
2016Optimization of cutting processes for magnetic shape memory actuator elements
Böhm, Andrea; Schneider, Jörg; Drossel, Welf-Guntram; Pagounis, E.; Laufenberg, M.
Conference Paper
2014Co-sputtering of rugate filters of reduced loss and roughness
Taeschner, Kerstin; Bartzsch, Hagen; Herffurth, Tobias; Schröder, Sven; Duparre, Angela; Frach, Peter
Conference Paper
2014Influence of surface roughness on the optical mode profile of GaN-based violet ridge waveguide laser diodes
Holc, K.; Jakob, A.; Weig, T.; Köhler, K.; Ambacher, O.; Schwarz, U.T.
Conference Paper
2014Influence of surface roughness on the optical mode profile of GaN-based violet ridge waveguide laser diodes
Holc, K.; Jakob, A.; Weig, T.; Köhler, K.; Ambacher, O.; Schwarz, U.T.
Conference Paper
2014New cutting processes for single crystalline Ni-Mn-Ga actuator elements
Böhm, Andrea; Groß, Stefan; Schneider, Jörg; Drossel, Welf-Guntram; Pagounis, Emmanouel; Laufenberg, Markus
Conference Paper
2013Assessment criteria for superhydrophobic surfaces with stochastic roughness
Duparré, Angela; Coriand, Luisa
Book Article
2013Structural properties of as deposited and annealed ZrO2 influenced by atomic layer deposition, substrate, and doping
Weinreich, W.; Wilde, L.; Müller, J.; Sundqvist, J.; Erben, E.; Heitmann, J.; Lemberger, M.; Bauer, A.J.
Journal Article
2012Influence of cutting technology on properties of Ni-Mn-Ga single crystalline actuator elements
Böhm, Andrea; Groß, Stefan; Schneider, Jörg; Drossel, Welf-Guntram; Pagounis, E.; Laufenberg, M.
Conference Paper
2010Characterization of thickness variations of thin dielectric layers at a nanoscale using Scanning Capacitance Microscopy
Yanev, V.; Rommel, M.; Bauer, A.J.; Frey, L.
Poster
2010Influence of annealing parameters on surface roughness, mobility, and contact resistance of aluminum implanted 4H SiC
Schmitt, H.; Häublein, V.; Bauer, A.J.; Frey, L.
Poster
2008Reactive magnetron sputter technologies for precision optical and antireflective coatings on glass and polymer substrates
Bartzsch, H.; Frach, P.; Lau, K.; Weber, J.
Conference Paper
2005The ultrasmoothness of diamond-like carbon surfaces
Moseler, M.; Gumbsch, P.; Casiraghi, C.; Ferrari, A.C.; Robertson, J.
Journal Article
2004Investigations on sticking temperature and wear of mold materials and wear of coatings
Rieser, D.; Manns, P.; Spieß, G.; Kleer, G.
Conference Paper
2002Multiscale degradations of storage ring FEL optics
Gatto, A.; Feigl, T.; Kaiser, N.; Garzella, D.; Ninno, G. de; Couprie, M.E.; Marsi, M.; Trovo, M.; Walker, R.; Grewe, M.; Wille, K.; Paoloni, S.; Reita, V.; Roger, J.P.; Boccara, C; Torchio, P.; Albrand, G.; Amra, C.
Journal Article
2001Investigation of the surface micro-roughness of fluoride films by spectroscopic ellipsometry
Tikhonravov, A.V.; Trubetskov, M.K.; Krasilnikova, A.V.; Masetti, E.; Duparre, A.; Quesnel, E.; Ristau, D.
Journal Article
2001Surface characterization of optical components for the DUV, VUV und EUV
Duparre, A.; Kozhevnikov, I.; Gliech, S.; Steinert, J.; Notni, G.
Journal Article
2000Advanced Methods for surface and subsurface defect characterization of optical components
Steinert, J.; Gliech, S.; Wuttig, A.; Duparre, A.; Truckenbrodt, H.
Conference Paper
1999ArF radiation resistance of optical coatings on CaF2 in relation to the surface finish of the substrate
Thielsch, R.; Heber, J.; Duparre, A.; Kaiser, N.; Mann, K.R.; Eva, E.
Conference Paper
1999Comparative study of the roughness of optical surfaces and thin films by x-ray scattering and atomic force microscopy
Asadchikov, V.E.; Duparre, A.; Jakobs, S.; Karabekov, Y.; Kozhevnikov, I.V.
Journal Article
1999Comparative study of the roughness of optical surfaces and thin films using atomic force microscopy, x-ray scattering, and light scattering methods
Kozhevnikov, I.V.; Asadchikov, V.E.; Duparre, A.; Gilev, O.N.; Havronin, N.A.; Krivonosov, Y.S.; Ostashev, V.I.; Steinert, J.
Conference Paper
1999Multi-type surface and thin film characterization using light scattering, scanning force microscopy and white light interferometry
Duparre, A.; Notni, G.
Conference Paper
1999Surface roughness and subsurface damage characterization of fused silica substrates
Wuttig, A.; Steinert, J.; Duparre, A.; Truckenbrodt, H.
Conference Paper
1999Surface roughness characterization of smooth optical films deposited by ion plating
Jakobs, S.; Duparre, A.; Huter, M.; Pulker, H.K.
Journal Article
1999Wide-scale surface characterization by combination of scanning force microscopy, white light interferometry, and light scattering
Gliech, S.; Duparre, A.; Recknagel, R.-J.; Notni, G.
Conference Paper
1999X-ray and AFM studies of ultrthin films for EUV and soft X-ray applications
Asadchikov, V.E.; Duparre, A.; Kozhevnikov, I.V.; Krivonosov, Y.S.; Sagitov, S.I.
Conference Paper
1998AFM and light scattering measurements of optical thin films for applications in the UV spectral region
Jakobs, S.; Duparre, A.; Truckenbrodt, H.
Journal Article
1998AFM helps engineer low-scatter thin films
Duparre, A.; Kaiser, N.
Journal Article
1998Interfacial roughness and related scatter in UV-optical coatings
Jacobs, S.; Duparre, A.; Truckenbrodt, H.
Journal Article
1998Messung von Mikrostrukturen in einem großen Skalenbereich durch Kombination von Weißlichtinterferometrie und Rasterkraftmikroskopie
Recknagel, R.-J.; Feigl, T.; Duparre, A.; Notni, G.
Conference Paper
1998Surface finish and optical quality of CaF2 for UV-lithography applications
Duparre, A.; Tielsch, R.; Kaiser, N.; Jakobs, S.; Mann, K.; Eva, E.
Conference Paper
1997Characterization of SiO2 protective coatings on polycarbonate
Jakobs, S.; Schulz, U.; Duparre, A.; Kaiser, N.
Journal Article
1997Concepts for standardization of total scatter measurements at 633 nm
Kadkhoda, M.; Strink, P.; Ristau, D.; Duparre, A.; Gliech, S.; Reng, N.; Greif, M.; Schuhmann, R.; Goldner, M.
Conference Paper
1997Non-contact testing of optical surfaces by multiple-wavelength light scattering measurement
Duparre, A.; Gliech, S.
Conference Paper
1997Quality assessment from supersmooth to rough surfaces by multiple-wavelength light scattering measurement
Duparre, A.; Gliech, S.
Conference Paper
1996Analysis of interface and volume inhomogenities in a multilayer system by light scattering methods
Pichlmaier, S.; Hehl, K.; Schuhmann, U.; Duparre, A.; Gliech, S.
Conference Paper
1996Apparatus for measuring integrated light scattering of optical components over an extended range of wavelengths
Duparre, A.; Gliech, S.
Conference Paper
1996Combination of surface characterization techniques for investigating optical thin-film components
Duparre, A.; Jakobs, S.
Journal Article
1996Dependence of the surface morphology and scattering of optical coatings on film material, substrate roughness, and deposition process
Jakobs, S.; Feigl, T.; Duparre, A.
Conference Paper
1996Fabrication of waveguide tapers by semitransparent mask photolithography
Wengelink, J.; Engel, H.
Conference Paper, Journal Article
1996Investigation of macroscopic uniformity during CH4/H2 reactive ion etching of InP and improvement using a guard ring
Janiak, K.; Niggebrugge, U.
Conference Paper
1996Optical scattering and surface microstructure of thin films for laser application
Duparre, A.; Kiesel, A.; Gliech, S.
Journal Article
1996Roughness analysis of optical films and substrates by atomic force microscopy
Duparre, A.; Ruppe, C.
Journal Article
1995Diamantschichten mit kontrollierter Rauhigkeit - Untersuchung der funktionellen Eigenschaften rauher Diamantschichten
Bluhm, A.; Matthee, T.; Sattler, M.; Schäfer, L.
Conference Paper
1995Light scattering of thin dielectric films
Duparre, A.
Book Article
1994Charakterisierung der Rauheit optischer Funktionsflächen - Methodenvergleich
Neubert, J.; Duparre, A.; Kaiser, N.; Notni, G.; Gerold, F.; Risse, S.
Conference Paper
1994Fully automated angle resolved scatterometer
Neubert, J.; Seifert, T.
Conference Paper
1994Interface and volume inhomogenities in optical thin films investigated by light scattering methods
Duparre, A.; Gliech, S.; Hehl, K.; Pichlmaier, U.; Schuhmann, U.
Conference Paper
1994Roughness and scattering measurements on thin films for UV/VIS applications
Duparre, A.; Kiesel, A.; Kaiser, N.; Truckenbrodt, H.; Schuhmann, U.
Conference Paper
1993Real-time detection of surface damage by direct assessment of the BRDF
Rothe, H.; Duparre, A.; Truckenbrodt, H.; Timm, M.
Conference Paper
1992Diamond membranes for X-ray masks
Löchel, B.; Schliwinski, H.-J.; Huber, H.-L.; Trube, J.; Klages, C.-P.; Lüthje, H.; Schäfer, L.
Conference Paper
1992Influence of a RF plasma on the nucleation of aluminium using n-trimethy lamine-alane -TMAA- as precursor
Bringmann, U.; Klages, C.-P.; Weber, A.; Schiffmann, K.I.
Conference Paper
1992Light scattering from the volume of optical thin films: theory and experiment
Duparre, A.; Kassam, S.; Hehl, K.; Bussemer, P.; Neubert, J.
Journal Article
1992Polycrystalline diamond for optical thin films
Müller-Sebert, W.; Wild, C.; Koidl, P.; Herres, N.; Eckermann, T.; Wagner, J.
Journal Article
1992Roughness and defect characterization of optical surfaces by light scattering measurements
Truckenbrodt, H.; Duparre, A.; Schuhmann, U.
Conference Paper
1991Growth and properties of diamond films prepared by MPCVD using different oxygen-containing source gases
Schäfer, L.; Klages, C.-P.
Journal Article, Conference Paper
1989Influence of steel roughness on internal and external corrosion of tinplate cans
Hollaender, J.
Journal Article
1989Interferometric methods for surface metrology
Broermann, E.; Pfeifer, T.; Tutsch, R.
Conference Proceedings
1988Influence of steel roughness on internal and external corrosion of tinplate cans
Hollaender, J.
Conference Paper