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| 2010 | Atmospheric-pressure plasma amination of polymer surfaces
Klages, C.-P.; Hinze, A.; Willich, P.; Thomas, M. | Journal Article |
| 2009 | 3D-confocal-microscopy: New advantages for non destructive measurements
Jelen, E. | Abstract |
| 2003 | Methoden der analytischen Bewertung und Charakterisierung von Materialoberflächen und Funktionsschichten
Vohrer, U.; Hegemann, D. | Book Article |
| 1995 | Investigation of surface topography, morphology and structure of hard amorphous carbon films by AFM and TEM
Drescher, D.; Kolitsch, A.; Mensch, A.; Scheibe, H.J. | Conference Paper |
| 1995 | Raman characterization of amorphous carbon films
Drescher, D.; Alers, P.; Scheibe, H.J. | Conference Paper |
| 1994 | Development and characterization of microelectrode arrays by means of electrochemical and surface analysis methods.
Wittkampf, M.; Naendorf, B.; Cammann, K.; Rospert, M.; Mokwa, W.; Hagenhoff, B.; Benninghoven, A.; Amrein, M.; Reichelt, R.; Gründig, B. | Conference Paper |
| 1994 | Farbstoffe helfen Oberflächen charakterisieren
Hartwig, A. | Journal Article |
| 1994 | Strategy for applying microanalytical techniques
Willich, P. | Conference Paper |
| 1994 | Untersuchungen zum Kleben von kohlenstoffaserverstärktem Polyetheretherketon
Born, E.; Groß, A.; Vissing, K.D.; Hennemann, O.-D. | Journal Article |
| 1992 | Characterization of metal impurities in silicon-on-insulator material
Frey, L.; Kroninger, F.; Streckfuß, N.; Ryssel, H. | Conference Paper |
| 1992 | Oberflächenanalytik mit Augerelektronenspektroskopie -AES- und Photoelektronenspektroskopie -XPS,ESCA-
Schlett, V. | Book Article |
| 1990 | Detection limits of contamination analysis by nitrogen RBS
Weidhaas, J.; Lang, W. | Conference Proceedings |
| 1988 | Small spot ESCA and scanning XPS investigations compared to scanning auger microanalysis.
Brünger, W.H. | Journal Article |