Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2018Deposition of micro crystalline silicon films using microwave plasma enhanced chemical vapor deposition
Altmannshofer, Stephan; Miller, Bastian; Holleitner, Alexander W.; Boudaden, Jamila; Eisele, Ignaz; Kutter, Christoph
Journal Article
2010Diamond/AlN thin films for optical applications
Knöbber, F.; Bludau, O.; Williams, O.A.; Sah, R.E.; Kirste, L.; Baeumler, M.; Leopold, S.; Pätz, D.; Nebel, C.E.; Ambacher, O.; Cimalla, V.; Lebedev, V.
Conference Paper
2009Dispersion-model-free determination of optical constants: Application to materials for organic thin film devices
Flämmich, M.; Danz, N.; Michaelis, D.; Bräuer, A.; Gather, M.C.; Kremer, J.H.-W.M; Meerholz, K.
Journal Article
2004Optical characterization of ferroelectric Strontium-Bismuth-Tantalate (SBT) thin films
Schmidt, C.; Petrik, P.; Schneider, C.; Fried, M.; Lohner, T.; Barsony, I.; Gyulai, J.; Ryssel, H.
Conference Paper, Journal Article
2004Oxidation behaviour of thin silver films deposited on plastic web characterized by spectroscopic ellipsometry (SE)
Sahm, H.; Charton, C.; Thielsch, R.
Conference Paper, Journal Article
2001Dielectric function spectra of GaN, AlGaN, and GaN/AlGaN heterostructures
Wagner, J.; Obloh, H.; Kunzer, M.; Maier, M.; Köhler, K.
Journal Article
2000Anodic oxidation of GaSb in Acid-glycol-water electrolytes
Sulima, O.; Bett, A.; Wagner, J.
Journal Article
2000GaAsN interband transitions involving localized and extended states probed by resonant Raman scattering and spectrosopic ellipsometry
Wagner, J.; Köhler, K.; Ganser, P.; Herres, N.
Journal Article
2000Piezoelectric field and confinement effects on the dielectric function spectrum of InGaN/GaN quantum wells
Ramakrishnan, A.; Wagner, J.; Kunzer, M.; Obloh, H.; Köhler, K.
Journal Article
2000Spectroscopic ellipsometry analysis of InGaN/GaN and AlGaN/GaN heterostructures using a parametric dielectric function model
Wagner, J.; Ramakrishnan, A.; Obloh, H.; Kunzer, M.; Köhler, K.; Johs, B.
Conference Paper
1998In situ spectroscopic ellipsometry for advanced process control in vertical furnaces
Lehnert, W.; Berger, R.; Schneider, C.; Pfitzner, L.; Ryssel, H.; Stehle, J.L.; Piel, J.-P.; Neumann, W.
Conference Paper
1998Interfacial intermixing and arsenic incorporation in thin InP barriers embedded in In(0.53)Ga(0.47)As
Wagner, J.; Peter, M.; Winkler, K.; Bachem, K.H.
Journal Article
1998Noncontacting measurement of thickness of thin titanium silicide films using spectroscopic ellipsometry
Kal, S.; Kasko, I.; Ryssel, H.
Journal Article
1998Spectroscopic ellipsometry characterization of (InGa)N on GaN
Wagner, J.; Ramakrishnan, A.; Behr, D.; Obloh, H.; Kunzer, M.; Bachem, K.H.
Journal Article
1998Spectroscopic ellipsometry for characterization of InAs/Ga(1-x)In(x)Sb superlattices
Wagner, J.; Schmitz, J.; Herres, N.; Fuchs, F.; Walther, M.
Journal Article
1997Characterization of thin TiSi2 films by spectroscopic ellipsometry and thermal wave analysis
Kasko, I.; Kal, S.; Ryssel, H.
Conference Paper
1997Study of composition and critical-point broadening in InAs/Ga(1-x)In(x)Sb superlattices using spectroscopic ellipsometry
Wagner, J.; Schmitz, J.; Herres, N.; Tränkle, G.; Koidl, P.
Journal Article
1996Critical point broadening in the dielectric function of thin AlAs barriers on GaAs
Wagner, J.; Weimar, U.; Gaymann, A.; Köhler, K.
Conference Paper
1993Evaluation of thin MgF2 films by spectroscopic ellipsometry
Kaiser, N.; Zuber, A.; Kaiser, U.
Journal Article