Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2018Confined electron and hole states in semiconducting carbon nanotube sub-10 nm artificial quantum dots
Buchs, G.; Bercioux, D.; Mayrhofer, L.; Gröning, O.
Journal Article
2018Extrusion foaming of thermoplastic cellulose acetate sheets with HFO-1234ze and co-blowing agents
Hendriks, Sven; Hopmann, Christian H.; Zepnik, Stefan
Journal Article
2018High-speed quantum efficiency determination of multijunction solar cells
Missbach, T.; Dengler, S.A.; Siefer, G.; Bett, A.W.
Journal Article
2018OLED-on-silicon microdisplays: Technology, devices, applications
Vogel, Uwe; Wartenberg, Philipp; Richter, Bernd; Brenner, Stephan; Fehse, Karsten; Schober, Matthias
Conference Paper
2018Selective silver sintering of semiconductor dies on PCB
Dresel, Fabian; Letz, Sebastian; Zischler, Sigrid; Schletz, Andreas; Novak, Michael
Conference Paper
2017High-speed broadband quantum efficiency determination of solar cells
Missbach, T.; Straub, R.S.L.; Benkhoff, T.M.; Siefer, G.
Journal Article
2017Multi-segment photovoltaic laser power converters and their electrical losses
Kimovec, R.; Helmers, H.; Bett, A.W.; Topic, M.
Conference Paper
2016Drill-down analysis with equipment health monitoring
Krauel, Christopher; Weishäupl, Laura; Pfeffer, Markus
Presentation
2016Inhomogeneous growth of micrometer thick plasma polymerized films
Akhavan, Behnam; Menges, Bernhard; Förch, Renate
Journal Article
2015Energy level of the Si-related DX-center in (AlyGa1-y)1-xInxAs
Heckelmann, S.; Lackner, D.; Bett, A.W.
Journal Article
2015Enhanced pressure response in ZnO nanorods due to spontaneous polarization charge
Seifikar, M.; O'Reilly, E.P.; Christian, B.; Lebedev, V.; Volk, J.; Erdélyi, R.; Lukács, I.E.; Dauksevicious, R.; Gaidys, R.
Conference Paper
2015Imaging defect luminescence measurements of 4H-SiC by UV-PL
Kaminzky, Daniel; Roßhirt, Katharina; Kallinger, Birgit; Berwian, Patrick; Friedrich, Jochen; Oppel, Steffen; Schneider, Adrian; Schütz, Michael
Presentation
2015Imaging defect luminescence of 4H-SiC by UV-photoluminescence
Kaminzky, Daniel; Roßhirt, Katharina; Kallinger, Birgit; Berwian, Patrick; Friedrich, Jochen; Oppel, Steffen; Schneider, Adrian; Schütz, Michael
Presentation
2015Impact of Photon Recycling and Luminescence Coupling in III-V Photovoltaic Devices
Walker, A.; Höhn, O.; Micha, D.; Wagner, L.; Helmers, H.; Dimroth, F.; Bett, A.
Conference Paper
2015Influence of growth temperature on the defect density for 4H-SiC homoepitaxy
Kaminzky, Daniel; Roßhirt, Katharina; Kallinger, Birgit; Berwian, Patrick; Friedrich, Jochen
Poster
2014Focus on quantum efficiency. Editorial
Buchleitner, A.; Burghardt, I.; Cheng, Y.C.; Scholes, G.D.; Schwarz, U.T.; Weber-Bargioni, A.; Wellens, T.
Journal Article
2013Breve introdução à Tecnologia de Salas Limpas: Enfrentando os desafios futuros
Gommel, Udo; Kreck, Guido
Journal Article
2013Opposites attract: An approach to collaborative supply chain management between semiconductor and automotive companies
Aelker, Judith; Meister, Verena; Forster, Christoph; Zapp, Matthias; Bauernhansl, Thomas
Journal Article
2012Future Demands and Challenges for Cleanroom Technology
Gommel, Udo
Presentation
2012Im Spannungsfeld der Absatzmärkte
Forster, Christoph; Zapp, Matthias
Journal Article
2012A short introduction to cleanliness technology: Meeting the future challenges
Gommel, Udo; Kreck, Guido
Conference Paper
2012Traceable measurements of electrical conductivity and Seebeck coefficient of β-Fe0.95Co0.05Si2 and Ge in the temperature range from 300 K to 850 K
Lenz, E.; Haupt, S.; Edler, F.; Ziolkowski, P.; Pernau, H.-F.
Journal Article, Conference Paper
2011(Bi,Sb)2Te3-PbTe chalcogenide alloys: Impact of the cooling rate and sintering parameters on the microstructures and thermoelectric performances
Jacquot, A.; Thomas, J.; Schumann, J.; Jägle, M.; Böttner, H.; Gemming, T.; Schmidt, J.; Ebling, D.
Journal Article
2011A more reliable supply of semiconductor components
Forster, Christoph; Zapp, Matthias
Journal Article
2011Reduzierung von Beschaffungsrisiken bei Halbleiterbauteilen
Zapp, Matthias; Forster, Christoph
Journal Article
2010Analysis of polar GaN surfaces with photoelectron and high resolution electron energy loss spectroscopy
Lorenz, P.; Haensel, T.; Gutt, R.; Koch, R.J.; Schaefer, J.A.; Krischok, S.
Journal Article, Conference Paper
2009Werkstofftrends: Werkstoffe der Mikrosystemtechnik
Weimert, B.; Reschke, S.; Kohlhoff, J.; Grüne, M.
Journal Article
2008Optically pumped GaSb-based VECSELs
Schulz, N.; Rattunde, M.; Rösener, B.; Manz, C.; Köhler, K.; Wagner, J.
Conference Paper
2008Werkstofftrends: Thermoelektrika
Reschke, S.; Grüne, M.; Kohlhoff, J.
Journal Article
2007Barrier- and in-well pumped GaSb-based 2.3 µm VECSELs
Wagner, J.; Schulz, N.; Rattunde, M.; Ritzenthaler, C.; Manz, C.; Wild, C.; Köhler, K.
Journal Article
2007High-speed asynchronous optical sampling for high-sensitivity detection of coherent phonons
Dekorsy, T.; Taubert, R.; Hudert, F.; Schrenk, G.; Bartels, A.; Cerna, R.; Kotaidis, A.; Plech, A.; Köhler, K.; Schmitz, J.; Wagner, J.
Conference Paper, Journal Article
2007InGaAs/AlAsSb quantum cascade detectors operating in the near infrared
Giorgetta, F.R.; Baumann, E.; Hofstetter, D.; Manz, C.; Yang, Q.K.; Köhler, K.; Graf, M.
Journal Article
2006Neue Halbleiter
Ruhlig, K.
Journal Article
2006Tool supported capability management for semiconductor high volume equipment integration
Erdmann, B.; Dreiss, P.
Conference Paper
2005Current gaps in production planning frameworks for real-time semiconductor enterprises
Fricke, P.; Fischmann, C.; Seidelmann, J.
Conference Paper
2005Grid system for solving computing bottlenecks in semiconductor industries at the example of an AMHS
Knoll, G.; Wesemann, M.; Sturm, R.
Conference Paper
2005High-power high-brightness tapered diode lasers and amplifiers
Kelemen, M.T.; Weber, J.; Mikulla, M.; Weimann, G.
Conference Paper
2005Requirements engineering für die Automatisierung
Reddig, K.
Conference Paper
2005Tutorial: The new specification template and procedures for writing SEMI information and control standards
Bricker, D.; Carrubba, M.; Crandell, B.; Dreiss, P.; Ghiselli, J.; Muckenhirn, R.; Rist, L.; Walsh, D.
Conference Paper
2004Architecture of a flexible scheduling component
Wiechers, O.; Zehtaban, M.
Conference Paper
2004Authorization and authentification standard (overview and status)
Dreiss, P.; Bichlmeier, J.
Conference Paper
2004Design of the core scheduling component for a flexible scheduling tool
Zehtaban, M.; Seidelmann, J.; Wiechers, O.
Conference Paper
2004Diagnostic data acquisition (DDA) data collection management standards (overview and status)
Dreiss, P.; Willmann, R.
Conference Paper
2004EDA demonstration
Dreiss, P.; Kender, E.
Conference Paper
2004FabSCORE
Janssen, D.; Peissner, M.; Schlegel, T.; Schuntermann, J.
Conference Paper
2004High-power, high-brightness GaInSb/AlGaAsSb quantum-well diode-lasers emitting at 1.9µm
Pfahler, C.; Manz, C.; Kaufel, G.; Kelemen, M.T.; Mikulla, M.; Wagner, J.
Conference Paper
2004Influence of Mg doping profile on the electroluminescence properties of GaInN multiple quantum well light emitting diodes
Stephan, T.; Köhler, K.; Maier, M.; Kunzer, M.; Schlotter, P.; Wagner, J.
Conference Paper
2004Infrared semiconductor lasers for sensing and diagnostics
Wagner, J.; Mann, C.; Rattunde, M.; Weimann, G.
Journal Article
2004Linearisation issues in microwave amplifiers
O`Droma, M.S.; Portilla, J.; Bertran, E.; Donati, S.; Brazil, T.J.; Rupp, M.; Quay, R.
Conference Paper
2004Lot release planning for customer oriented manufacturing
Löffler, B.
Conference Paper
2004Using simulation as test tool in semiconductor industries
Wiechers, O.; Zehtaban, M.; Seidelmann, J.
Conference Paper
2003High-brightness 1040 nm tapered diode laser
Kelemen, M.T.; Weber, J.; Rinner, F.; Rogg, J.; Mikulla, M.; Weimann, G.
Conference Paper
20022K PL topography of silicon doped VGf-GaAs wafers
Baeumler, M.; Maier, M.; Herres, N.; Bünger, T.; Stenzenberger, J.; Jantz, W.
Journal Article
2002Beam quality and linewidth enhancement factor of ridge-waveguide tapered diode lasers
Kelemen, M.T.; Weber, J.; Rogg, J.; Rinner, F.; Mikulla, M.; Weimann, G.
Conference Paper
2002High-power high-brightness ridge-waveguide tapered diode lasers at 940 nm
Kelemen, M.T.; Rinner, F.; Rogg, J.; Wiedmann, N.; Kiefer, R.; Walther, M.; Mikulla, M.; Weimann, G.
Conference Paper
2002Nanoscopic measurements of surface recombination velocity and diffusion length in a semiconductor quantum well
Malyarchuk, V.; Tomm, J.; Lienau, C.; Rinner, F.; Baeumler, M.
Journal Article
2002Near-diffraction-limited high power diode laser tunable from 895 to 960 nm
Kelemen, M.T.; Rinner, F.; Rogg, J.; Kiefer, R.; Mikulla, M.; Weimann, G.
Conference Paper
2001Organic Contamination Workshop 2001. Proceedings
Pfitzner, L.; Bügler, J.; Frickinger, J.
Conference Proceedings
2001Werkstofftrends: Halbleitermaterialien
Kretschmer, T.; Reschke, S.; Kohlhoff, J.
Journal Article
2000Deposition and characterization of nanocrystalline diamond films prepared by ion bombardement-assisted method
Gu, C.Z.; Jiang, X.
Journal Article
2000Grundlagen der Reinraumtechnik und Personalverhalten - Trends in der reinen Produktion
Gaugel, T.
Conference Paper
2000Medien in der Reinstproduktion - Reinstflüssigkeiten
Ernst, C.; Matuscheck, P.
Conference Paper
1999Chemically-assisted ion-beam etching of (AlGa)As/GaAs. Lattice damage and removal by in-situ Cl2 treatment
Daleiden, J.; Kiefer, R.; Klußmann, S.; Kunzer, M.; Manz, C.; Walther, M.; Braunstein, J.; Weimann, G.
Journal Article
1999Grundlagen der Reinraumtechnik und Personalverhalten - Trends in der reinen Produktion
Gaugel, T.
Conference Paper
1999The Quality Chain for (U)HP Media and Joint Media in its Meaning
Dorner, J.; Matuscheck, P.; Ernst, C.
Conference Paper
1999A View to the Future - A Modular Simulation Kit for Cost-Efficient Fab-Wide Planning and the Simulation of Automated Material Handling Systems in the Semiconductor Industry
Bader, U.; Besler, A.; Schließer, J.; Dorner, J.
Conference Paper
1999X-ray Reflectivity Investigation of Thin P-Type Porous Silicon Layers
Buttard, D.; Dolino, G.; Bellet, D.; Baumbach, T.; Rieutord, F.
Journal Article
1998Coupled simulation of gas flow and heat transfer in an RTP-system with rotating wafer
Poscher, S.; Theiler, T.
Journal Article
1998Grundlagen der Reinraumtechnik und Personalverhalten - Trends in der reinen Produktion
Gommel, U.
Conference Paper
1997Grundlagen der Reinraumtechnik und Personalverhalten - Trends in der reinen Produktion
Gommel, U.
Conference Paper
1997A new approach for semiconductor models basing on SPICE model equations
Leitner, T.
Conference Paper
1997Progress in the layer thickness determination of AlGaAs/GaAs heterostructures using selective etching and AFM imaging of the (110) cleavage planes
Müller, S.; Weyher, J.L.; Dian, R.; Jantz, W.
Journal Article
1996Dickschicht-Feuchtesensor auf der Basis halbleitenden MnWO4-Metalloxids. Teil 1. Aufbau und Charakterisierung des Feuchtesensors
Qu, W.; Meyer, J.-U.; Haeusler, A.
Journal Article
1995Analysis of contamination - a must for ultraclean technology
Ryssel, H.; Streckfuß, N.; Aderhold, W.; Berger, R.; Falter, T.; Frey, L.
Conference Paper
1995Electric-field effects on above-barrier states in GaAs/Al(x)Ga(1-x)As superlattice
Nakayama, M.; Ando, M.; Tanaka, I.; Nishimura, H.; Schneider, H.; Fujiwara, K.
Journal Article
1995On the role of interface properties in the degradation of metalorganic vapor phase epitaxially grown Fe profiles in InP
Roehle, H.; Schroeter-Janssen, H.; Harde, P.; Franke, D.
Conference Paper
1995Synthese von -FeSi2-Schichten durch PLD
Panzner, M.; Mai, H.; Schöneich, B.; Witke, T.; Lenk, A.; Selle, B.; Lange, H.; Henrion, W.; Grötzschel, R.; Theresiak, A.
Conference Paper
1994Applications of single-beam photothermal analysis
Schork, R.; Krügel, S.; Schneider, C.; Pfitzner, L.; Ryssel, H.
Journal Article
1994Assessment of clustering induced internal strain in AlInAs on InP grown by molecular beam epitaxy
Hase, A.; Kunzel, H.; Zahn, D.R.T.; Richter, W.
Journal Article
1994Determination of band-edge offset by weak field hall measurement on MBE PbSe/PbEuSe multi-quantum well structures on KCl
Shi, Z.; Lambrecht, A.; Tacke, M.
Journal Article
1994Luminescence of a quantum-confined dense electron-hole plasma from PbSe nanostructures
Herrmann, K.H.; Tomm, J.W.; Haertel, S.; Hoerstel, W.; Möllmann, K.-P.; Heimbrodt, W.; Tacke, M.; Böttner, H.
Journal Article
1994Neue Keramische Werkstoffe
Krell, A.; Pippel, E.; Reetz, T.; Sorge, G.; Woltersdorf, J.
: Michalowsky, L.; Herrmann, M.
Book
1994Nuclear microprobe application to semiconductor process development - silicide formation and multi-layered structure
Takai, M.; Katayama, Y.; Lohner, T.; Kinomura, A.; Ryssel, H.; Tsien, P.H.; Satou, M.; Chayahara, A.; Burte, E.P.
Journal Article
1994Practical aspects of ion beam analysis of semiconductor structures
Frey, L.; Pichler, P.; Kasko, I.; Thies, I.; Lipp, S.; Streckfuß, N.; Gong, L.
Journal Article
1994Valence band hybridizing in europium-alloyed lead selenide
Tomm, J.W.; Möllmann, K.-P.; Peuker, F.; Herrmann, K.H.; Böttner, H.; Tacke, M.
Journal Article
1993The electrical characteristics of Pb1-xEuxSe homojunctions.
Xu, J.; Halford, B.; Tacke, M.
Journal Article
1993Low-temperature MBE of AlGaInAs lattice-matched to InP
Künzel, H.; Böttcher, J.; Gibis, R.; Hoenow, H.; Heedt, C.
Conference Paper, Journal Article
1993MBE growth and properties of high quality Al(Ga)InAs/GaInAs MQW structures
Kunzel, H.; Bottcher, J.; Hase, A.; Shramm, C.
Conference Paper, Journal Article
1993Monolithic integrated wavelength duplexer-receiver on InP
Bornholdt, C.; Trommer, D.; Unterborsch, G.; Bach, H.-G.; Venghaus, H.; Weinert, C.M.
Journal Article
1993Optisches Prozessieren
Eyer, A.; Räuber, A.
Conference Paper
1992Chemical transport reactions during crystal growth of PbTe and PbSe via vapour phase influenced by AgI.
Stöber, D.; Hildmann, B.O.; Böttner, H.; Schelb, S.; Binnewies, M.; Bachem, K.H.
Journal Article
1992Gold and platinum diffusion. The key to the understanding of intrinsic point defect behaviour in silicon
Zimmermann, H.; Ryssel, H.
Journal Article
1992Information processing in semiconductor manufacturing
 
Conference Proceedings
1992Laser induced sputtering of insulators
Panzner, M.; Pompe, W.; Schöneich, B.; Völlmar, S.
Journal Article, Conference Paper
1992Shallow p-n junctions produced by laser doping with boron silicate glass
Bollmann, D.; Buchner, R.; Haberger, K.; Neumayer, G.
Conference Paper
1992Some band structure related optical and photoelectrical properties of Pb1-xEuxSe 0 < x < 0.2
Herrmann, K.H.; Möllmann, K.-P.; Tomm, J.W.; Böttner, H.; Lambrecht, A.; Tacke, M.
Journal Article
1992Temperature dependence of RoA product for PbSe photodiodes fabricated by MBE and diffusion.
Tacke, M.; Xu, J.
Journal Article
1992Ultrafast dephasing in GaAs and GaAs/AlGaAs quantum wells
Leo, K.; Haring Bolivar, P.; Maidorn, G.; Kurz, H.; Köhler, K.
Conference Paper
1992Ultrafast electron dynamics at semiconductor surfaces and interfaces studied with subpicosecond laser photoemission.
Haight, R.; Baeumler, M.; Silberman, J.A.; Kirchner, P.D.
Journal Article
1991Application of localized Zn diffusion across heterointerfaces for the realization of a compact high-speed bipolar driver circuit on InGaAsP/InP
Weber, R.; Paraskevopoulos, A.; Schroeter-Janssen, H.; Bach, H.G.
Journal Article
1991Hohes Automatisierungspotential in der Chip-Produktion. Kommunikation als Schwachstelle, Fertigungszellen sollen Automatisierungsgrad im Reinraum erhöhen
Schäfer, W.; Wohnhas, S.
Journal Article
1991In-situ measurement of planarization of wafer topography
Bollmann, D.; Haberger, K.
Conference Paper
1991An integrated laser driver circuit based on implanted collector InGaAs/InAlAs HBTs
Su, L.M.; Kunzel, H.; Bach, H.G.; Schlaak, W.; Grote, N.
Conference Paper
1991Ist deutsches Halbleiterfertigungsequipment noch konkurrenzfähig
Frühauf, W.
Journal Article
1991Metallization of integrated circuits by laser evaporation of metal sandwich layers
Bollmann, D.; Haberger, K.; Pielmeier, R.
Conference Paper
1991Partikelmessungen in Gasen
Dorner, J.; Müller, B.
Conference Paper
1991Polarisation diversity waveguide network integrated on InP for a coherent optical receiver front-end
Heidrich, H.; Hamacher, M.; Albrecht, P.; Engel, H.; Hoffmann, D.; Imhof, D.; Nolting, H.-P.; Reier, F.; Weinert, C.M.
Conference Paper
1991Raman characterization of semiconducting materials and related structures.
Prevot, B.; Wagner, J.
Journal Article
1991Shallow p-n junctions produced by laser doping with Boron and Phosphorus Silicate glass
Bollmann, D.; Stock, G.; Neumayer, G.; Haberger, K.
Conference Paper
1990Den Gigachip im Visier
Dorner, J.; Geißinger, J.
Conference Paper
1990Doping and diffusion behaviour of Fe in MOVPE grown InP layers
Franke, D.; Harde, P.; Wolfram, P.; Grote, N.
Journal Article
1990Economical feasibility study of local cleanrooms as an alternative for conventional cleanrooms in semiconductor manufacturing
Kahlden, T. von
Conference Paper
1990In situ etching depth monitoring for reactive ion etching of InGaAs(P)/InP heterostructures by ellipsometry
Muller, R.
Journal Article
1990Incorporation behaviour of manganese in MBE grown Ga0.47In0.53As
Kunzel, H.; Bochnia, R.; Gibis, R.; Harde, P.; Passenberg, W.
Journal Article
1990Influence of the BaF2 substrate preparation on the structural perfection of epitaxially grown IV-VI compounds.
Clemens, H.; Voiticek, A.; Holzinger, A.; Bauer, G.
Journal Article
1990Laser evaporation of metal sandwich layers for improved IC metallization
Bollmann, D.; Haberger, K.; Pielmeier, R.
Journal Article
1990Leitsysteme für die Halbleiterfertigung. Praxisnahe Forschungsförderung am IPA
Sauter, K.-D.
Journal Article
1990A luminescence study in the Pb(1-x)Eu(x)Se system
Böttner, H.; Herrmann, K.H.; Lambrecht, A.; Tacke, M.; Tomm, J.W.
Journal Article
1990New manufacturing concepts for the production of integrated circuits
Warnecke, H.-J.; Frühauf, W.; Schmutz, W.
Conference Paper
1990Nondestructive thickness mapping of epitaxial InGaAsP/InP layers
Sartorius, B.; Brandstattner, M.
Conference Paper
1990Optimization of extremely highly p-doped In0.53Ga0.47As:Be contact layers grown by MBE
Passenberg, W.; Harde, P.; Kunzel, H.; Trommer, D.
Conference Paper
1990Strong asymmetry of non-resonant optical four-wave mixing in PbSe and PbSnSe
Dorbath, K.; Häfele, H.G.; Tacke, M.
Journal Article
1990Ultra flat P-N junctions formed by solid source laser doping
Stock, G.; Bollmann, D.; Buchner, R.; Neumayer, G.; Haberger, K.
Conference Paper
1990Ultra flat P-N junctions formed by solid source laser doping
Stock, G.; Bollmann, D.; Buchner, R.; Neumayer, G.; Haberger, K.
Conference Paper
1990Untersuchungen über Regelparameter in einer Lithographiezelle
Pfitzner, L.; Ryssel, H.; Temmel, G.; Zielonka, G.
Conference Paper
1989Endpoint detection for CH4/H2 reactive ion etching of InGaAsP heterostructures by mass spectrometry
Schmid, H.; Fidorra, F.; Grutzmacher, D.
Conference Paper
1989Entwicklung von Prozessmodulen und in-situ-Meßmethoden für ein Flexibles Fotolithografisches Prozeßzentrum
Temmel, G.; Zielonka, G.; Olbrich, H.; Mann, R.; Pfitzner, L.; Ryssel, H.
Conference Paper
1989Origin and penetration depth of thermal degradation in InP
Sartorius, B.; Pfanner, K.
Journal Article
1988Partikelfrei handeln - Handhabungssysteme in reinen Räumen
Seitz, D.; Geissinger, J.
Journal Article
1987Dielectrics for passivation of planar InP/InGaAs diodes
Unterborsch, G.; Bach, H.G.; Schmitt, F.; Schmidt, R.; Schlaak, W.
Conference Paper, Journal Article
1987Plasma mass spectrometric analysis and control of reactive ion etching of InP and related compounds
Schmid, H.
Conference Paper
1987Self-aligned low-loss totally reflecting waveguide mirrors in InGaAsP/InP
Niggebrugge, U.; Albrecht, P.; Doldissen, W.; Nolting, H.-P.; Schmid, H.
Conference Paper
1986Electro-optic modulators in GaInAsP/InP
Krauser, J.; Albrecht, P.; Bornholdt, C.; Doldissen, W.; Niggebrugge, U.; Nolting, H.-P.; Schlak, M.
Conference Paper
1986A novel process for reactive ion etching on InP, using CH4/H2
Niggebrugge, U.; Klug, M.; Garus, G.
Conference Paper
1986Reactive ion beam etching of InP with N2 and N2/O2 mixtures
Katzschner, W.; Niggebrügge, U.; Löffler, R.; Schroeter-Janssen, H.
Journal Article
1985A novel npn InGaAs bipolar transistor with a wide gap cadmium oxide (CdO) emitter
Su, L.M.; Grote, N.; Bach, H.G.; Doldissen, W.; Rosenzweig, M.
Conference Paper
1984Ion beam milling of InP with an Ar/O2-gas mixture
Katzchner, W.; Steckenborn, A.; Löffler, R.; Grote, N.
Journal Article