Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2018Detailed characterisation of focused ion beam induced lateral damage on silicon carbide samples by electrical scanning probe microscopy and transmission electron microscopy
Stumpf, Florian; Abu Quba, A.A.; Singer, Philip; Rumler, Maximilian; Cherkashin, Nikolay; Schamm-Chardon, Sylvie; Cours, Robin; Rommel, Mathias
Journal Article
2017Investigation of high-k dielectric stacks by C-AFM: Advantages, limitations, and possible applications
Rommel, Mathias; Paskaleva, Albena
Book Article
2016Structure and friction properties of laser-patterned amorphous carbon films
Komlenok, Maksim Sergeevich; Arutyunyan, Natalia R.; Kononenko, Vitali Victorovich; Zavedeev, Evgeny V.; Frolov, Vadim D.; Chouprik, Anastasia A.; Baturin, Andrey S.; Scheibe, Hans-Joachim; Pimenov, Sergei M.
Journal Article, Conference Paper
2014Polarization-Resolved Near-Field Mapping of Plasmonic Aperture Emission by a Dual-SNOM System
Klein, Angela E.; Janunts, Norik; Steinert, Michael; Tünnermann, Andreas; Pertsch, Thomas
Journal Article
2011Manufacturing, characterization, and application of nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy
Jambreck, J.D.; Yanev, V.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.
Journal Article, Conference Paper
2010Characterization of thickness variations of thin dielectric layers at a nanoscale using Scanning Capacitance Microscopy
Yanev, V.; Rommel, M.; Bauer, A.J.; Frey, L.
Poster
2010Comprehensive study of focused ion beam induced lateral damage in silicon by scanning probe microscopy techniques
Rommel, M.; Spoldi, G.; Yanev, V.; Beuer, S.; Amon, B.; Jambreck, J.; Petersen, S.; Bauer, A.J.; Frey, L.
Journal Article
2010Electrical scanning probe microscopy techniques for the detailed characterization of high-k dielectric layers
Rommel, M.; Yanev, V.; Paskaleva, A.; Erlbacher, T.; Lemberger, M.; Bauer, A.J.; Frey, L.
Conference Paper
2010Fabrication of metallic SPM tips by combining UV nanoimprint lithography and focused ion beam processing
Jambreck, J.D.; Schmitt, H.; Amon, B.; Rommel, M.; Bauer, A.J.; Frey, L.
Journal Article, Conference Paper
2010Manufacturing, characterization, and application of nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy
Jambreck, J.D.; Yanev, V.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.
Poster
2010Nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy: Manufacturing, characterization, and application
Jambreck, J.D.; Yanev, V.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.
Poster
2009DNA-sensing with nano-textured diamond electrodes
Yang, N.; Uetsuka, H.; Nebel, C.E.
Journal Article, Conference Paper
2009Fabrication of metallic SPM tips by combining UV nanoimprint lithography and focused ion beam processing
Jambreck, J.D.; Schmitt, H.; Amon, B.; Rommel, M.; Bauer, A.J.; Frey, L.
Poster
2006Atomic force acoustic microscopy
Rabe, U.
Book Article
2004Characterization of materials with nanoscopic filler particles by AFM techniques
Vogel, D.; Keller, J.; Michel, B.
Conference Paper
2002Werkstofftrends: Rastersondentechniken
Reschke, S.; Kohlhoff, J.; Kretschmer, T.
Journal Article
1994Atomic force microscopy at MHz frequencies
Arnold, W.; Rabe, U.
Journal Article
1994Charakterisierung ultrapräzisionsbearbeiteter Materialien mittels Rastersonden-Mikroskopie (ASPE)
Rabe, U.; Arnold, W.; Scherer, V.; Fechner, R.; Schindler, A.; Riemer, O.; Preuß, W.; Brinksmeier, E.
Conference Paper
1993SPM investigation of metal/carbon-multilayer surfaces prepared by pulsed laser deposition -PLD-.
Dietsch, R.; Eichler, H.; Mai, H.; Pompe, W.
Conference Proceedings