Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2000Residual strain in annealed GaAs single crystal wafers measured by scanning infrared polariscopy and x-ray diffraction
Herms, M.; Fukuzawa, M.; Melov, V.G.; Schreiber, J.; Yamada, M.
Conference Paper
2000Residual strain in annealed GaAs single crystal wafers measured by scanning infrared polariscopy and x-ray diffraction and topography
Herms, M.; Fukuzawa, M.; Melov, V.G.; Schreiber, J.; Möck, P.; Yamada, M.
Journal Article
1999Photoelastic Characterization of Residual Strain in GaAs Wafers Annealed in Holders of Different Geometry
Herms, M.; Fukuzawa, M.; Yamada, M.; Klöber, J.; Zychowitz, G.; Niklas, J.
Journal Article
1999Residual Strain in Semi-Insulating InP Wafers Treated by Multiple-Step Wafer Annealing
Fukuzawa, M.; Herms, M.; Uchida, M.; Oda, O.; Yamada, M.
Journal Article