Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Large-Area Layer Counting of Two-Dimensional Materials Evaluating the Wavelength Shift in Visible-Reflectance Spectroscopy
Hutzler, Andreas; Matthus, Christian D.; Dolle, Christian; Rommel, Mathias; Jank, Michael P.M.; Spiecker, Erdmann; Frey, Lothar
Journal Article
2019Seamless and Non-repetitive 4D Texture Variation Synthesis and Real-time Rendering for Measured Optical Material Behavior
Ritz, Martin; Breitfelder, Simon; Santos, Pedro; Kuijper, Arjan; Fellner, Dieter W.
Journal Article
2017Angle-dependent reflectance of isotextured silicon
Alapont Sabater, A.; Greulich, J.; Tucher, N.; Bläsi, B.; Glunz, S.W.
Conference Paper
2016Trichromatic reflectance capture using a tunable light source: Setup, characterization and reflectance estimation
Tanksale, Tejas Madan; Urban, Philipp
Conference Paper
2015Angle resolved specular reflectance measured with VLABS
Heimsath, A.; Schmid, T.; Nitz, P.
Journal Article, Conference Paper
2015Specularity of concentrator mirrors for CPV measured with VLABS
Schmid, T.; Heimsath, A.; Hornung, T.; Nitz, P.
Conference Paper
2014CultLab3D - On the Verge of 3D Mass Digitization
Santos, Pedro; Ritz, Martin; Tausch, Reimar; Schmedt, Hendrik; Monroy-Rodriguez, Rafael; Stefano, Antonio; Posniak, Oliver; Fuhrmann, Constanze; Fellner, Dieter W.
Conference Paper
2014Printing gloss effects in a 2.5D system
Baar, Teun; Samadzadegan, Sepideh; Brettel, Hans; Urban, Philipp; Segovia, Maria V. Ortiz
Conference Paper
2009Dispersion-model-free determination of optical constants: Application to materials for organic thin film devices
Flämmich, M.; Danz, N.; Michaelis, D.; Bräuer, A.; Gather, M.C.; Kremer, J.H.-W.M; Meerholz, K.
Journal Article
2009Wideband antireflection coatings by combining interference multilayers with structured top layers
Schulz, U.
Journal Article
2008Extreme-ultraviolet-induced oxidation of Mo/Si multilayers
Benoit, N.; Schroeder, S.; Yulin, S.; Feigl, T.; Duparre, A.; Kaiser, N.; Tünnermann, A.
Journal Article
2008Scattering of EUV optics - substrate, coating, and degradation effects
Schröder, S.; Tünnermann, A.; Benoit, N.; Feigl, T.; Duparre, A.
Conference Paper
2005Nanostructure and optical properties of fluoride films for high-quality DUV/VUV optical components
Schröder, S.; Uhlig, H.; Duparre, A.; Kaiser, N.
Conference Paper
2003System for angle-resolved and total light scattering, transmittance, and reflectance measurements of optical components at 157 nm and 193 nm
Gliech, S.; Geßner, H.; Duparre, A.
Conference Paper
2003VULSTAR: A laser based system for measuring light scattering, transmittance, and reflectance at 157 nm and 193 nm
Duparre, A.; Gliech, S.; Benkert, N.
Book Article
2003VUV light scattering measurements of substrates and thin film coatings
Hultaker, A.; Gliech, S.; Benkert, N.; Duparre, A.
Conference Paper
2001Interaktive Erweiterung und Beleuchtungsrekonstruktion von Fotos mit Radiosity
Grosch, T.
: Kresse, W. (Prüfer)
Thesis
1992Direct measurement of the hemispherical transmittance and reflectance of diffuse irradiation
Dengler, J.; Diegmann, V.; Platzer, W.J.
Conference Paper
1989Adjustable redistribution of the laser intensity between two adjoining metal surfaces.
Schulz, W.; Behler, K.
Conference Paper