Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2004Photocatalytic properties of doped TiO2 and of Ti-based mixed oxide thin films prepared by reactive pulse magnetron sputtering
Vergöhl, M.; Frach, P.; Neumann, F.; Hunsche, B.; Glöß, D.
Conference Paper
2004Uniformity analysis and design optimization of multi-layer thin film filter used in fiber optics communication system
Yang, M.; Liu, J.; Chen, Q.; Zhang, B.
Conference Paper
2001Procedure to characterize microroughness of optical thin films: Application to ion-beam-sputtered vacuum-ultraviolet coatings
Ferre-Borrull, J.; Duparre, A.; Quesnel, E.
Journal Article
1999Beschichtung von Kunststoffen für die Optik und Optoelektronik
Schulz, U.; Kaiser, N.
Journal Article
1999Multi-type surface and thin film characterization using light scattering, scanning force microscopy and white light interferometry
Duparre, A.; Notni, G.
Conference Paper
1998AFM and light scattering measurements of optical thin films for applications in the UV spectral region
Jakobs, S.; Duparre, A.; Truckenbrodt, H.
Journal Article
1998Interfacial roughness and related scatter in UV-optical coatings
Jacobs, S.; Duparre, A.; Truckenbrodt, H.
Journal Article
1998Scatter investigation of UV-films. Facing the trend towards shorter wavelength
Duparre, A.; Kaiser, N.
Conference Paper
1997248 nm laser interaction studies on LaF3/MgF2 optical coatings by cross sectional transmission electron microscopy
Kaiser, N.; Czigany, Z.; Adamik, M.
Conference Paper
1997Characterization of SiO2 protective coatings on polycarbonate
Jakobs, S.; Schulz, U.; Duparre, A.; Kaiser, N.
Journal Article
1997Concepts for standardization of total scatter measurements at 633 nm
Kadkhoda, M.; Strink, P.; Ristau, D.; Duparre, A.; Gliech, S.; Reng, N.; Greif, M.; Schuhmann, R.; Goldner, M.
Conference Paper
1997Influence of substrate cleaning on LIDT of 355 nm HR coatings
Kaiser, N.; Schallenberg, U.B.; Dijon, J.; Garrec, P.
Conference Paper
1997Investigation of the absorption induced damage in ultraviolet dielectric thin films
Welsch, E.; Ettrich, K.; Blaschke, H.; Schäfer, D.; Kaiser, N.; Thomsen-Schmidt, P.
Journal Article
1996248 nm laser interaction studies on LaF3/MgF2 optical coatings by mass spectroscopy and x-ray photoelectron spectroscopy
Kaiser, N.; Bodemann, A.; Raupach, L.; Weißbrodt, P.; Hacker, E.
Conference Paper
1996Analysis of interface and volume inhomogenities in a multilayer system by light scattering methods
Pichlmaier, S.; Hehl, K.; Schuhmann, U.; Duparre, A.; Gliech, S.
Conference Paper
1996Comparison between 355 nm and 1064 nm damage of high grade dielectric mirror coatings
Kaiser, N.; Bodemann, A.; Kozlowski, M.; Pierce, E.; Stolz, C.
Conference Paper
1996Dependence of the surface morphology and scattering of optical coatings on film material, substrate roughness, and deposition process
Jakobs, S.; Feigl, T.; Duparre, A.
Conference Paper
1996Determination of the refractive indices of highly biaxialanisotropic coatings using guided modes
Kaiser, N.; Jänchen, H.; Endelema, D.; Flory, F.
Journal Article
1996Excimer laser interaction with dielectric thin films
Kaiser, N.; Welsch, E.; Ettrich, K.; Blaschke, H.
Journal Article
1996Interaction of UV-laser-radiation with dielectric thin films
Kaiser, N.; Welsch, E.; Ettrich, K.; Blaschke, H.; Schäfer, D.; Thomsen-Schmidt, P.
Journal Article
1996Interference coatings for the ultraviolet spectral region
Kaiser, N.
Journal Article
1996Laser conditioning of LaF3/MgF2 dielectric coatings at 248 nm
Kaiser, N.; Eva, E.; Mann, K.; Henking, R.; Ristau, D.; Anton, B.; Weißbrodt, P.; Mademann, D.; Raupach, L.; Hacker, E.
Journal Article
1996Optical coatings for UV photolithography systems
Kaiser, N.; Bauer, H.H.; Heller, M.
Conference Paper
1996Perpendicular-incidence photometric ellipsometry of biaxial anisotropic thin films
Kaiser, N.; Zuber, A.; Jänchen, H.
Journal Article
1996Roughness analysis of optical films and substrates by atomic force microscopy
Duparre, A.; Ruppe, C.
Journal Article
1996Shift-free narrowband filters for the UV-B region
Kaiser, N.; Uhlig, H.; Schallenberg, U.B.
Conference Paper
1995High damage threshold Al2O3/SiO2 dielectric coatings for excimer lasers
Kaiser, N.; Schallenberg, U.; Uhlig, H.; Anton, B.; Kaiser, U.; Mann, K.; Eva, E.
Journal Article
1995Laser conditioning of LaF3/MgF2 dielectric coatings for excimer lasers
Kaiser, N.; Anton, B.; Jänchen, H.; Mann, K.; Eva, E.; Fischer, C.; Henking, R.; Ristau, D.; Weißbrodt, P.; Mademann, D.; Raupach, L.; Hacker, E.
Conference Paper
1995A new insight into defect-induced laser damage in UV multilayer coatings
Kaiser, N.; Reichling, M.; Bodemann, A.
Conference Paper
1994C-adsorption behaviour of thin fluoride films
Kaiser, N.; Kaiser, U.
Journal Article
1994Graded reflectance mirror design with unconventional profile for excimer laser
Kaiser, N.; Schallenberg, U.; Uhlig, H.
Journal Article
1994Micrometer resolved inspection of defects and laser damage sites in UV high-reflecting coatings by photothermal displacement microscopy
Kaiser, N.; Bodemann, A.; Reichling, M.; Welsch, E.
Journal Article
1994Morphology investigations by atomic force microscopy of thin films and substrates for excimer laser mirrors
Kaiser, N.; Duparre, A.; Jakobs, S.
Conference Paper
1994Photothermal microscopy of defects and laser damage morphology in Al2O3/SiO2 dielectric mirror coatings for 248 nm
Kaiser, N.; Reichling, M.; Bodemann, A.; Welsch, E.
Conference Paper
1994Photothermische Mikroskopie zeigt verborgene Defekte in UV-Hochleistungsoptiken
Reichling, M.; Kaiser, N.; Bodemann, A.
Journal Article
1994Resistance of coated optics to UV laser irradiation
Kaiser, N.
Conference Paper
1994Variable-angle spectroscopic ellipsometry for deep UV characterization of dielectric coatings
Kaiser, N.; Zuber, A.; Stehle, J.L.
Conference Paper
1994Very high damage threshold Al2O3/SiO2 dielectric coatings for excimer lasers
Kaiser, N.; Uhlig, H.; Schallenberg, U.B.; Anton, B.; Kaiser, U.; Mann, K.; Eva, E.
Conference Paper
1993Evaluation of thin MgF2 films by spectroscopic ellipsometry
Kaiser, N.; Zuber, A.; Kaiser, U.
Journal Article
1993Investigation of inhomogenities and impurities in fluoride coatings for high power excimer lasers
Kaiser, N.; Kaiser, U.; Weißbrodt, P.; Mademann, D.; Hacker, E.
Conference Paper
1993Investigation of thin fluoride films for optical applications by surface analytical methods and electron microscopy
Kaiser, N.; Kaiser, U.; Weißbrodt, P.; Mademann, D.; Hacker, E.; Raupach, L.
Journal Article
1993Laterally and depth resolved photothermal absorption measurements on ZrO2 and MgF2 single-layer films
Reichling, M.; Welsch, E.; Duparre, A.; Matthias, E.
Conference Paper
1993Marketing potential of optical coatings
Kaiser, N.
Journal Article
1993Narrowband interference filters for use in UV-B spectra region
Kaiser, N.; Uhlig, H.
Conference Paper
1993Relation between light scattering and the microstructure of optical thin films
Duparre, A.; Kassam, S.
Journal Article
1993Scattering losses of oxide and fluoride coatings for lasers
Duparre, A.; Uhlig, H.; Kassam, S.
Conference Paper
1992Structure of thin fluoride films deposited on amorphous substrates
Kaiser, N.; Kaiser, U.; Weißbrodt, P.; Mademann, U.; Hacker, E.; Müller, H.
Journal Article