Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2018Development and application of an exchange model for anisotropic water diffusion in the microporous MOF aluminum fumarate
Splith, T.; Fröhlich, D.; Henninger, S.K.; Stallmach, F.
Journal Article
2017What does "normal-normal transmittance" mean for light-scattering materials?
Wilson, H.R.; Bueno, B.; Hanek, J.; Riethmüller, C.; Illg, H.; Deroisy, B.; Kuhn, T.
Presentation
2012Optical and structural properties of Nb2O5-SiO2 mixtures in thin films
Janicki, V.; Sancho-Parramon, J.; Yulin, S.; Flemming, M.; Chuvilin, A.
Journal Article
2011Entwicklung eines 3D-Charakterisierungsmessplatzes mit anschließender Charakterisierung eines autostereoskopischen 3D-Displays
Schuster, Stefan
: Heinen, Gerd (Betreuer); Braehmer, Uwe (Betreuer)
Bachelor Thesis
2010Measuring the internal luminescence quantum efficiency of OLED emitter materials in electrical operation
Flämmich, M.; Danz, N.; Michaelis, D.; Wächter, C.A.; Bräuer, A.H.; Gather, M.C.; Meerholz, K.
Conference Paper
2009Optical modeling of free electron behavior in highly doped ZnO films
Ruske, F.; Pflug, A.; Sittinger, V.; Szyszka, B.; Greiner, D.; Rech, B.
Journal Article
2004Optical characterization of aluminum-doped zinc oxide films by advanced dispersion theories
Pflug, A.; Sittinger, V.; Ruske, M.; Szyszka, B.; Dittmar, G.
Conference Paper, Journal Article
2000A new procedure for the optical characterization of high quality thin films
Bosch, S.; Leinfeller, N.; Quesnel, E.; Duparre, A.; Ferre-Borrull, J.; Günster, S.; Ristau, D.
Conference Paper
2000Optical characterization of materials deposited by different processes: the LaF3 in the UV-visible region
Leinfeller, N.; Quesnel, E.; Duparre, A.; Ferre-Borrull, J.
Conference Paper
2000Optische und elektrische Untersuchungen an GaSb-basierenden Halbleiterdiodenlasern
Mayer, M.
Thesis
1998Output characteristics and optical efficiency of SrS:Ce and ZnS:Mn thin-film electroluminescent devices
Richter, S.; Mauch, R.H.
Journal Article
1997Characterization of thin TiSi2 films by spectroscopic ellipsometry and thermal wave analysis
Kasko, I.; Kal, S.; Ryssel, H.
Conference Paper
1996Apparatus for measuring integrated light scattering of optical components over an extended range of wavelengths
Duparre, A.; Gliech, S.
Conference Paper