Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Development of an experimental setup and a study for the comparison between optical properties and the subjective perception of a quality of a display surface
Puder, Theresa; Rudek, Florian; Taudt, Christopher; Kabardiadi-Virkovski, Alexander; Hartmann, Peter
Conference Paper
2019Multiwavelength holography: Height measurements despite axial motion of several wavelengths during exposure
Schiller, Annelie; Beckmann, Tobias; Fratz, Markus; Bertz, Alexander; Carl, Daniel; Buse, Karsten
Journal Article
2017Optical properties of hydrogels filled with dispersed nanoparticles
Samaryk, Volodymyr; Varvarenko, Sergiy; Nosova, Nataliya; Fihurka, Nataliia; Musyanovych, Anna; Landfester, Katharina; Popadyuk, Nadiya; Voronov, Stanislav
Journal Article
2016Thermoresponsive (star) block copolymers from one-pot sequential RAFT polymerizations and their self-assembly in aqueous solution
Herfurth, Christoph; Laschewsky, Andre; Noirez, Laurence; Lospichl, Benjamin von; Gradzielski, Michael
Journal Article
2014ESLPV: Enhanced subsurface light propagation volumes
Koa, Ming di; Johan, Henry
Journal Article, Conference Paper
2014In situ and ex situ characterization of optical surfaces by light scattering techniques
Trost, Marcus; Herffurth, Tobias; Schröder, Sven; Duparré, Angela; Beier, Matthias; Risse, Stefan; Tünnermann, Andreas; Böwering, Norbert
Journal Article
2014Light scattering characterization of optical components – BRDF, BTDF and scatter losses
Schröder, Sven; Finck, Alexander von; Katsir, Dina; Zeitner, Uwe; Duparré, Angela
Conference Paper
2014Measuring isotropic subsurface light transport
Happel, Kathrin; Dörsam, Edgar; Urban, Philipp
Journal Article
2013Angle and wavelength resolved light scattering measurement of optical surfaces and thin films
Schröder, Sven; Unglaub, David; Fink, Alexander von; Hauptvogel, Matthias; Trost, Marcus; Herffurth, Tobias; Duparré, Angela; Stover, John
Conference Paper
2013Light scattering of interference coatings from the IR to the EUV spectral regions
Schröder, Sven; Trost, Marcus; Herffurth, Tobias; Finck, Alexander von; Duparré, Angela
Journal Article
2013Roughness, optical and wetting properties of nanostructured thin films
Schröder, Sven; Coriand, Luisa; Duparré, Angela
Conference Paper
2013Using light scattering to investigate damage-relevant imperfections of surfaces, coatings, and bulk materials
Schröder, Sven; Trost, Marcus; Herffurth, Tobias; Duparré, Angela
Conference Paper
2012Optical performance of LPP multilayer collector mirrors
Feigl, Torsten; Perske, Marco; Pauer, Hagen; Fiedler, Tobias; Yulin, Sergiy; Trost, Marcus; Schroeder, Sven; Duparré, Angela; Kaiser, Norbert; Tünnermann, Andreas; Böwering, Norbert; Ershov, Alex; Hoffmann, Kay; La Fontaine, Bruno; Cummings, Kevin D.
Conference Paper
2012Roughness characterization of EUV multilayer coatings and ultra-smooth surfaces by light scattering
Trost, Marcus; Schröder, Sven; Lin, C.C.; Duparré, Angela; Tünnermann, Andreas
Conference Paper
2011Efficient specification and characterization of surface roughness for extreme ultraviolet optics
Schröder, S.; Trost, M.; Feigl, T.; Duparre, A.; Harvey, J.E.
Conference Paper
2011Impact of surface roughness on scatter losses and the scattering distribution of surfaces and thin film coatings
Schröder, S.; Herffurth, T.; Duparre, A.
Conference Paper
2011Roughness characterization of large EUV mirror optics by laser light scattering
Trost, M.; Schröder, S.; Feigl, T.; Duparre, A.; Tünnermann, A.
Conference Paper
2008Roughness evolution and scatter losses of multilayers for 193 nm optics
Schröder, S.; Duparre, A.; Tünnermann, A.
Journal Article
2008Streulichtfotometrisches Messverfahren für den zeitlichen Verlauf der PM10- und PM2,5-Konzentration in der Außenluft
Dunkhorst, W.; Lödding, H.; Koch, W.
Journal Article
2005Scatter analysis of optical components from 193 nm to 13.5 nm
Schröder, S.; Kamprath, M.; Gliech, S.; Duparre, A.
Conference Paper
2005Surface texture investigation of ultra-precision optical components
Schröder, S.; Ratteit, J.; Gliech, S.; Duparre, A.
Conference Paper
2005Ultra low-loss low-efficiency diffraction gratings
Clausnitzer, T.; Kley, E.-B.; Tünnermann, A.; Bunkowski, A.; Burmeister, O.; Danzmann, K.; Schnabel, R.; Duparre, A.
Journal Article
2003Characterization procedures for nanorough ultrahydrophobic surfaces with controlled optical matter
Flemming, M.; Reihs, K.; Duparre, A.
Conference Paper
2003Characterizing CaF2 for VUV optical components: Roughness, surface scatter, and bulk scatter
Hultaker, A.; Benkert, N.; Gliech, S.; Duparre, A.
Conference Paper
2003Methology to evaluate light scatter mechanisms of VUV substrates and coatings
Duparre, A.; Gliech, S.; Hultaker, A.
Book Article
2003System for angle-resolved and total light scattering, transmittance, and reflectance measurements of optical components at 157 nm and 193 nm
Gliech, S.; Geßner, H.; Duparre, A.
Conference Paper
2003VULSTAR: A laser based system for measuring light scattering, transmittance, and reflectance at 157 nm and 193 nm
Duparre, A.; Gliech, S.; Benkert, N.
Book Article
2003VUV light scattering measurements of substrates and thin film coatings
Hultaker, A.; Gliech, S.; Benkert, N.; Duparre, A.
Conference Paper
2002Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components
Duparre, A.; Ferre-Borrull, J.; Gliech, S.; Notni, G.; Steinert, J.; Bennett, J.M.
Journal Article
2001Surface characterization of optical components for the DUV, VUV und EUV
Duparre, A.; Kozhevnikov, I.; Gliech, S.; Steinert, J.; Notni, G.
Journal Article
2000Advanced Methods for surface and subsurface defect characterization of optical components
Steinert, J.; Gliech, S.; Wuttig, A.; Duparre, A.; Truckenbrodt, H.
Conference Paper
2000DUV/VUV light scattering measurement of optical components for lithography applications
Gliech, S.; Steinert, J.; Flemming, M.; Duparre, A.
Conference Paper
2000InP-based pin TWA photoreceivers with low group delay scatter over 40 GHz bandwidth
Bach, H.-G.; Schlaak, W.; Mekonnen, G.G.; Seeger, A.; Steingrüber, R.; Schramm, C.; Jacumeit, G.; Ziegler, R.; Umbach, A.; Unterborsch, G.; Passenberg, W.; Ebert, W.; Eckardt, T.
Conference Paper
1999Application and cost analysis of scatterometry for integrated metrology
Benesch, N.; Schneider, C.; Pfitzner, L.; Ryssel, H.
Conference Paper
1999Comparative study of the roughness of optical surfaces and thin films using atomic force microscopy, x-ray scattering, and light scattering methods
Kozhevnikov, I.V.; Asadchikov, V.E.; Duparre, A.; Gilev, O.N.; Havronin, N.A.; Krivonosov, Y.S.; Ostashev, V.I.; Steinert, J.
Conference Paper
1999DUV light scattering and morphology of ion beam sputtered fluoride coatings
Quesnel, E.; Petit dit Dariel, A.; Duparre, A.; Ferre-Borrull, J.; Steinert, J.
Conference Paper
1999Ion-assisted deposition of oxide materials at room temperature by use of different ion sources
Niederwald, H.S.; Laux, S.; Kennedy, M.; Schallenberg, U.; Duparre, A.; Kaiser, N.; Ristau, D.
Journal Article
1999Light scattering and atomic force microscopic investigations on magnetron sputtered oxide single layers and multilayers for micromechanical laser mirrors
Kupfer, H.; Richter, F.; Schlott, P.; Duparre, A.; Gliech, S.
Conference Paper
1999Multi-type surface and thin film characterization using light scattering, scanning force microscopy and white light interferometry
Duparre, A.; Notni, G.
Conference Paper
1999Surface roughness and subsurface damage characterization of fused silica substrates
Wuttig, A.; Steinert, J.; Duparre, A.; Truckenbrodt, H.
Conference Paper
1999Surface roughness characterization of smooth optical films deposited by ion plating
Jakobs, S.; Duparre, A.; Huter, M.; Pulker, H.K.
Journal Article
1999Wide-scale surface characterization by combination of scanning force microscopy, white light interferometry, and light scattering
Gliech, S.; Duparre, A.; Recknagel, R.-J.; Notni, G.
Conference Paper
1998AFM and light scattering measurements of optical thin films for applications in the UV spectral region
Jakobs, S.; Duparre, A.; Truckenbrodt, H.
Journal Article
1998AFM helps engineer low-scatter thin films
Duparre, A.; Kaiser, N.
Journal Article
1998Interfacial roughness and related scatter in UV-optical coatings
Jacobs, S.; Duparre, A.; Truckenbrodt, H.
Journal Article
1998Scatter investigation of UV-films. Facing the trend towards shorter wavelength
Duparre, A.; Kaiser, N.
Conference Paper
1997Characterization of SiO2 protective coatings on polycarbonate
Jakobs, S.; Schulz, U.; Duparre, A.; Kaiser, N.
Journal Article
1997Concepts for standardization of total scatter measurements at 633 nm
Kadkhoda, M.; Strink, P.; Ristau, D.; Duparre, A.; Gliech, S.; Reng, N.; Greif, M.; Schuhmann, R.; Goldner, M.
Conference Paper
1997Influence of substrate surface and film roughness on the quality of optical coatings for the UV spectral region
Duparre, A.; Jakobs, S.; Kaiser, N.
Conference Paper
1997Non-contact testing of optical surfaces by multiple-wavelength light scattering measurement
Duparre, A.; Gliech, S.
Conference Paper
1996Analysis of interface and volume inhomogenities in a multilayer system by light scattering methods
Pichlmaier, S.; Hehl, K.; Schuhmann, U.; Duparre, A.; Gliech, S.
Conference Paper
1996Apparatus for measuring integrated light scattering of optical components over an extended range of wavelengths
Duparre, A.; Gliech, S.
Conference Paper
1996Combination of surface characterization techniques for investigating optical thin-film components
Duparre, A.; Jakobs, S.
Journal Article
1996Dependence of the surface morphology and scattering of optical coatings on film material, substrate roughness, and deposition process
Jakobs, S.; Feigl, T.; Duparre, A.
Conference Paper
1996Optical scattering and surface microstructure of thin films for laser application
Duparre, A.; Kiesel, A.; Gliech, S.
Journal Article
1996Polarizerless electro-optic IR shutter based on a cholesteric scattering effect
Stieb, A.E.
Journal Article
1996Roughness analysis of optical films and substrates by atomic force microscopy
Duparre, A.; Ruppe, C.
Journal Article
1995Light scattering of thin dielectric films
Duparre, A.
Book Article
1994Charakterisierung der Rauheit optischer Funktionsflächen - Methodenvergleich
Neubert, J.; Duparre, A.; Kaiser, N.; Notni, G.; Gerold, F.; Risse, S.
Conference Paper
1994Interface and volume inhomogenities in optical thin films investigated by light scattering methods
Duparre, A.; Gliech, S.; Hehl, K.; Pichlmaier, U.; Schuhmann, U.
Conference Paper
1994Roughness and scattering measurements on thin films for UV/VIS applications
Duparre, A.; Kiesel, A.; Kaiser, N.; Truckenbrodt, H.; Schuhmann, U.
Conference Paper
1993Bulk and surface light scattering from transparent silica aerogel
Platzer, W.J.; Bergkvist, M.
Journal Article
1993Laterally and depth resolved photothermal absorption measurements on ZrO2 and MgF2 single-layer films
Reichling, M.; Welsch, E.; Duparre, A.; Matthias, E.
Conference Paper
1993Optical reflection and angle-resolved light scattering from textured polycrystalline diamond films.
Locher, R.; Wild, C.; Müller-Sebert, W.; Kohl, R.; Koidl, P.
Journal Article
1993Overcoming the influence of rayleigh backscattering in a coherent communication system
Hilbk, U.; Hermes, T.H.; Meissner, P.; Westphal, F.-J.
Conference Paper
1993Real-time detection of surface damage by direct assessment of the BRDF
Rothe, H.; Duparre, A.; Truckenbrodt, H.; Timm, M.
Conference Paper
1993Relation between light scattering and the microstructure of optical thin films
Duparre, A.; Kassam, S.
Journal Article
1993Scattering losses of oxide and fluoride coatings for lasers
Duparre, A.; Uhlig, H.; Kassam, S.
Conference Paper
1992Light scattering from the volume of optical thin films: theory and experiment
Duparre, A.; Kassam, S.; Hehl, K.; Bussemer, P.; Neubert, J.
Journal Article
1992Roughness and defect characterization of optical surfaces by light scattering measurements
Truckenbrodt, H.; Duparre, A.; Schuhmann, U.
Conference Paper
1991Grundlagen der Streulichtpartikelmeßtechnik
Ernst, C.
Conference Paper
1986Comparison of two methods for the determination of particle deposition on surfaces
Hollaender, W.; Morawietz, G.
Conference Paper