Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2017Identification of defect-suppressing grain boundaries in multicrystalline silicon based on measurements of as-cut wafers using advanced image processing
Strauch, T.; Demant, M.; Krenckel, P.; Riepe, S.; Rein, S.
Conference Paper
2016Introduction
Kaskel, Stefan
Book Article