Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Electrical and structural properties of direct current magnetron sputtered amorphous TiAl thin films
Kolkovsky, V.; Schmidt, Jan-Uwe; Döring, S.
Journal Article
2019Influence of Glassy Carbon Surface Finishing on its Wear Behavior during Precision Glass Moulding of Fused Silica
Grunwald, Tim; Wilhelm, Dennis Patrick; Dambon, Olaf; Bergs, Thomas
Journal Article
2019Repeatability of atomic force microscopy measurements of wood cell surface
Kasal, Bohumil; Li, Juan
Abstract
2019Thin-film lubrication in the water/octyl β-d-glucopyranoside system: Macroscopic and nanoscopic tribological behavior
Chen, W.; Amann, T.; Kailer, A.; Rühe, J.
Journal Article
2018Biomechanical and biomolecular characterization of extracellular matrix structures in human colon carcinomas
Brauchle, Eva; Kasper, Jana; Daum, Ruben; Schierbaum, Nicolas; Falch, Claudius; Kirschniak, Andreas; Schäffer, Tilman E; Schenke-Layland, Katja
Journal Article
2017Nanoscale patterning of self-assembled monolayer (SAM)-functionalised substrates with single molecule contact printing
Sajfutdinow, Martin; Uhlig, Katja; Prager, Andrea; Schneider, C.; Abel, Bernd; Smith, David M.
Journal Article
2016Adhesion force mapping on wood by atomic force microscopy
Jin, X.; Kasal, B.
Journal Article
2016Quantitative comparison of measurement methods for the evaluation of micro- and nanostructures written with 2PP
Harnisch, Emely Marie; König, Niels; Schmitt, Robert
Conference Paper
2015Dielectrophoretic immobilization of proteins: Quantification by atomic force microscopy
Laux, Eva-Maria; Knigge, Xenia; Bier, Frank F.; Wenger, Christian; Hölzel, Ralph
Journal Article
2014Examination of micro- and nanostructures of magnetic and piezoelectric materials in relation to their macroscopic properties by dynamic scanning force microscopy techniques
Batista, Leonardo
Dissertation
2013Adsorption of silver on cellobiose and cellulose studied with MIES, UPS, XPS and AFM
Dahle, S.; Meuthen, J.; Viöl, W.; Maus-Friedrichs, W.
Journal Article
2013Adsorption of silver on glucose studied with MIES, UPS, XPS and AFM
Dahle, S.; Meuthen, J.; Viöl, W.; Maus-Friedrichs, W.
Journal Article
2012Characterization of grain boundaries in multicrystalline silicon with high lateral resolution using conductive atomic force microscopy
Rumler, Maximilian; Rommel, Mathias; Erlekampf, Jürgen; Azizi, Maral; Geiger, Tobias; Bauer, Anton J.; Meißner, Elke; Frey, Lothar
Journal Article
2012Investigation of the influence of laser radiation on material properties of transparent conductive layers
Schaefer, M.; Esser, A.; Schulz-Ruhtenberg, M.; Holtkamp, J.; Gillner, A.
Conference Paper
2011Current voltage characteristics through grains and grain boundaries of high-k dielectric thin films measured by tunneling atomic force microscopy
Murakami, Katsuhisa; Rommel, Mathias; Yanev, Vasil; Bauer, Anton J.; Frey, Lothar
Conference Paper
2011High quality AlGaN epilayers grown on sapphire using SiNx interlayers
Forghani, K.; Klein, M.; Lipski, F.; Schwaiger, S.; Hertkorn, J.; Leute, R.A.R.; Scholz, F.; Feneberg, M.; Neuschl, B.; Thonke, K.; Klein, O.; Kaiser, U.; Gutt, R.; Passow, T.
Conference Paper, Journal Article
2010Fabrication of metallic SPM tips by combining UV nanoimprint lithography and focused ion beam processing
Jambreck, J.D.; Schmitt, H.; Amon, B.; Rommel, M.; Bauer, A.J.; Frey, L.
Journal Article, Conference Paper
2010Manufacturing, characterization, and application of nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy
Jambreck, J.D.; Yanev, V.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.
Poster
2010Nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy: Manufacturing, characterization, and application
Jambreck, J.D.; Yanev, V.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L.
Poster
2010Semiconducting to metallic-like boron doping of nanocrystalline diamond films and its effect on osteoblastic cells
Kromka, A.; Grausova, L.; Bacáková, L.; Vacik, J.; Rezek, B.; Vanecek, M.; Williams, O.A.; Haenen, K.
Journal Article, Conference Paper
2009Correlation of microscopic and macroscopic electrical characteristics of high-k ZrSixO2-x thin films using tunneling atomic force microscopy
Weinreich, W.; Wilde, L.; Kücher, P.; Lemberger, M.; Yanev, V.; Rommel, M.; Bauer, A.J.; Erben, E.; Heitmann, J.; Schröder, U.; Oberbeck, L.
Conference Paper, Journal Article
2009FEM-simulations of vibrations and resonances of stiff AFM cantilevers
Geng, K.; Rabe, U.; Hirsekorn, S.
Conference Paper
2008AFM testing of the nanomechanical behaviour of MEMS micromembranes
Ekwinski, G.; Goehlich, A.; Trieu, H.-K.; Rymuza, Z.; Koszewski, A.
Journal Article
2008Combinatorial fabrication of thin film-libraries and evaluation of their piezoelectricity by ultrasonic piezo-mode imaging
Rende, D.; Schwarz, K.; Rabe, U.; Maier, W.F.; Arnold, W.
Journal Article
2008Mapping of elastic stiffness in an alpha+beta titanium alloy using atomic force acoustic microscopy
Kumar, A.; Rabe, U.; Arnold, W.
Conference Paper, Journal Article
2008Novel carbon-cage-based ultralow-k materials: Modeling and first experiments
Zagorodniy, K.; Chumakov, D.; Täschner, C.; Lukowiak, A.; Stegmann, H.; Schmeißer, D.; Geisler, H.; Engelmann, H.-J.; Hermann, H.; Zschech, Ehrenfried
Journal Article
2007Calibration of atomic force microscope for nanoscale friction measurements
Masalska, A.; Kolanek, K.; Woszczyna, M.; Zawierucha, P.; Ritz, Y.; Zschech, Ehrenfried
Conference Paper
2007Near-field acoustical imaging using lateral bending mode of atomic force microscope cantilevers
Caron, A.; Rabe, U.; Rödel, J.; Arnold, W.
Conference Paper
2007Nonlinear contact resonance spectroscopy in atomic force microscopy
Rupp, D.; Rabe, U.; Hirsekorn, S.; Arnold, W.
Journal Article
2007Visibility of buried structures in atomic force acoustic microscopy
Striegler, A.; Pathuri, N.; Köhler, B.; Bendjus, B.
Conference Paper
2006Investigation of ceramics and ferroelectric materials by atomic force acoustic microscopy
Arnold, W.
Conference Paper
2006Structure and thermoelectric properties of boron doped nanocrystalline Si0.8Ge0.2 thin film
Takashiri, M.; Borca-Tasciuc, T.; Jacquot, A.; Miyazaki, K.; Cheng, G.
Journal Article
2006Surface characterization with nanometer lateral resolution using the vibration modes of atomic force microscope cantilevers
Rabe, U.; Arnold, W.; Caron, A.; Hirsekorn, S.; Schwarz, K.
Conference Paper
2005Atomic force microscopy at ultrasonic frequencies
Arnold, W.; Caron, A.; Hirsekorn, S.; Kopycinska-Müller, M.; Rabe, U.; Reinstädtler, M.
Conference Paper
2005Investigating ultra-thin lubricant layers using resonant friction force microscopy
Reinstädtler, M.; Rabe, U.; Goldade, A.; Bhushan, B.; Arnold, W.
Journal Article, Conference Paper
2004Atomic force microscopy with lateral modulation
Scherer, V.; Reinstädtler, M.; Arnold, W.
Book Article
2004Investigating ultra-thin lubricant layers using lateral atomic force acoustic microscopy
Reinstädtler, M.; Rabe, U.; Hirsekorn, S.; Arnold, W.; Goldade, A.V.; Kasai, T.; Bhushan, B.
Conference Paper
2004Materials characterization of micro-devices
Schreiber, J.; Bendjus, B.; Köhler, B.; Melov, V.; Baumbach, T.
Conference Paper
2004Phenomena in microwear experiments on metal-free and metal-containing diamond-like carbon coatings: Friction, wear, fatigue and plastic
Schiffmann, K.
Journal Article
2004Quantitative measurement of elastic constants of anisotropic materials by atomic force acoustic microscopy
Arnold, W.; Hirsekorn, S.; Kopycinska-Müller, M.; Reinstädtler, M.; Rabe, U.
Conference Paper
2004Ultrasonic modes in atomic force microscopy
Kopycinska-Müller, M.; Reinstädtler, M.; Rabe, U.; Caron, A.; Hirsekorn, S.; Arnold, W.
Conference Paper
2003Characterizing CaF2 for VUV optical components: Roughness, surface scatter, and bulk scatter
Hultaker, A.; Benkert, N.; Gliech, S.; Duparre, A.
Conference Paper
2003Methology to evaluate light scatter mechanisms of VUV substrates and coatings
Duparre, A.; Gliech, S.; Hultaker, A.
Book Article
2002Atomic force microscopy at ultrasonic frequencies
Arnold, W.; Hirsekorn, S.; Kopycinska, M.; Rabe, U.; Reinstädtler, M.; Scherer, V.
Conference Paper
2001Measurements of elastic properties of ultra-thin diamond-like carbon coatings using atomic force acoustic microscopy
Amelio, S.; Goldade, A.; Rabe, U.; Scherer, V.; Bhushan, B.; Arnold, W.
Journal Article
2001Ultrasonic radiation in dynamic force microscopy
Hirsekorn, S.; Rabe, U.; Arnold, W.
Journal Article
2000Analysis of peculiar structural defects created in GaAs by diffusion of copper
Frigeri, C.; Weyher, J.; Müller, S.; Hiesinger, P.
Journal Article
2000Measurement of Young's Modulus of Nanocrystalline Ferrites with Spinel Structures by Atomic Force Acoustic Microscopy
Kester, E.; Rabe, U.; Presmanes, L.; Tailhades, P.; Arnold, W.
Journal Article
2000Quantitative contact spectroscopy by atomic force acoustic microscopy
Amelio, S.; Rabe, U.; Kester, E.; Hirsekorn, S.; Arnold, W.
Conference Paper
2000X-ray study of the roughness of surfaces and interfaces
Kozhevnikov, I.V.; Asadchikov, V.E.; Bukreeva, I.N.; Duparre, A.
Conference Paper
1999Characterization of oxide etching and wafer cleaning using vapor phase anhydrous hydrofluoric acid and ozone
Bauer, A.J.; Froeschle, B.; Beichele, M.; Ryssel, H.
Conference Paper
1999Comparative study of the roughness of optical surfaces and thin films by x-ray scattering and atomic force microscopy
Asadchikov, V.E.; Duparre, A.; Jakobs, S.; Karabekov, Y.; Kozhevnikov, I.V.
Journal Article
1999Comparative study of the roughness of optical surfaces and thin films using atomic force microscopy, x-ray scattering, and light scattering methods
Kozhevnikov, I.V.; Asadchikov, V.E.; Duparre, A.; Gilev, O.N.; Havronin, N.A.; Krivonosov, Y.S.; Ostashev, V.I.; Steinert, J.
Conference Paper
1999Lateral Force Microscopy using Acoustic Friction Force Microscopy
Scherer, V.; Arnold, W.; Bhushan, B.
Journal Article
1999On the Contrast in Eddy Current Microscopy using Atomic Force Microscopes
Hirsekorn, S.; Rabe, U.; Boub, A.; Arnold, W.
Conference Paper
1999Probing Linear and Non-linear Tip-Sample Interaction Forces by Atomic Force Acoustic Microscopy
Rabe, U.; Arnold, W.; Kester, E.
Journal Article
1999Scanning probe method investigation of carbon nanotubes produced by high energy ion irradiation of graphite
Biro, L.P.; Mark, G.I.; Gyulai, J.; Rozlosnik, N.; Kurti, J.; Szabo, B.; Frey, L.; Ryssel, H.
Journal Article
1999Surface roughness characterization of smooth optical films deposited by ion plating
Jakobs, S.; Duparre, A.; Huter, M.; Pulker, H.K.
Journal Article