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| 2010 | Angle-resolved photoelectron spectroscopy study of the GaN(0001)-2×2 surface
Lorenz, P.; Gutt, R.; Himmerlich, M.; Schaefer, J.A.; Krischok, S. | Journal Article, Conference Paper |
| 2010 | Oberflächenmodifizierung von Carbon Nanotubes mittels technischer Niederdruckplasmen
Zschoerper, P.N. | Dissertation |
| 2010 | Search for a suitable ohmic metallization scheme to GaN/AlGaN heterostructures for sub-micron devices
Kolaklieva, L.; Kakanakov, R.; Chitanov, V.; Dulgerova, P.; Cimalla, V. | Conference Paper |
| 2007 | Oberflächenbehandlung und Verarbeitung von ETFE (Ethylen-Tetrafluorethylen)-Folien
Günther, S.; Lucas, J.; Kiesow, A.; Heilmann, A. | Conference Paper |
| 1998 | Deposition of carbon nitride thin films in a hybrid r.f.-PLD technique
Klotzbücher, T.; Scherge, M.; Mergens, M.; Wesner, D.A.; Kreutz, E.W. | Journal Article |
| 1997 | Adhesion Mechanism of Aluminum, Aluminum Oxide, and Silicon Oxide on Biaxially Oriented Polypropylene (BOPP), Poly(ethyleneterephthalate) (PET), and Poly(vinyl Chloride) (PVC)
Bichler, C.; Langowski, H.-C.; Moosheimer, U.; Seifert, B. | Journal Article |
| 1997 | Characterization of vapor phase deposited organic molecules on silicon surfaces
Dieckhoff, S.; Höper, R.; Schlett, V.; Gesang, T.; Possart, W.; Hennemann, O.-D.; Günster, J.; Kempter, V. | Journal Article |
| 1997 | Integrated process control for cluster tools using an in-line analytical module
Kasko, I.; Oechsner, R.; Froeschle, B.; Schneider, C.; Pfitzner, L.; Ryssel, H. | Conference Paper |
| 1997 | A novel XPS system for integration into advanced semiconductor equipment for in-line process control
Kasko, I.; Oechsner, R.; Schneider, C.; Pfitzner, L.; Ryssel, H.; Trubitsyn, A.A.; Kratenko, V.I. | Conference Paper |
| 1996 | Adhäsion zwischen Polymer und Metall oder Halbleiter. Beobachtungen mit spektroskopischen Methoden
Possart, W.; Dieckhoff, S. | Conference Paper |
| 1996 | Adhesion and film structure of cyanurates on solids
Possart, W.; Dieckhoff, S.; Gesang, T.; Schlett, V.; Hennemann, O.-D. | Conference Paper |
| 1996 | Characterization of triazine derivatives on silicon wafers studied by photoelectron spectroscopy (XPS, UPS) and metastable impact electron spectroscopy (MIES)
Dieckhoff, S.; Schlett, V.; Possart, W.; Hennemann, O.-D.; Günster, J.; Kempter, V. | Journal Article |
| 1996 | Surface treatment of an epoxy resin by CO2 laser irradiation
Hartwig, A.; Vitr, G.; Dieckhoff, S.; Hennemann, O.-D. | Journal Article |
| 1995 | Elektronenspektroskopische Charakterisierung der Adhäsion von Triazinderivaten und Cyansäureestern auf Siliziumoberflächen
Dieckhoff, S. | Dissertation |
| 1995 | XPS studies of thin polycyanurate films on silicon wafers
Dieckhoff, S.; Schlett, V.; Possart, W.; Hennemann, O.-D. | Journal Article |
| 1995 | XPS studies of thin polycyanurate films on silicon wafers and aluminium substrates
Dieckhoff, S.; Schlett, V.; Possart, W.; Hennemann, O.-D. | Conference Paper |
| 1994 | Adsorption and growth of polycyanurate films on silicon wafers and aluminium substrates
Dieckhoff, S.; Schlett, V.; Possart, W.; Hennemann, O.-D. | Conference Paper |
| 1993 | Blitzsaubere optische Gläser - ohne FCKW
Scheerer, F.; Grünwald, H.; Gunkel, C.; Baalmann, A. | Journal Article |
| 1993 | Plasma polymerization of 2-iodothiophene
Kruse, A.; Baalmann, A.; Hennecke, M. | Conference Paper |
| 1993 | Structure investigations of electrical conducting plasmapolymerized films from 2-iodothiophene
Kruse, A.; Schlett, V.; Baalmann, A.; Hennecke, M. | Journal Article |
| 1993 | Thermal diffusivity of diamond films synthesized from methane by ARC-discharge plasma-jet CVD
Boudina, A.; Fitzer, E.; Netzelmann, U.; Reiss, H. | Journal Article |
| 1991 | AES and XPS investigations for the topochemical characterization of dope elements on WC powders
Baalmann, A.; Schlett, V. | Journal Article |
| 1991 | Moderne Analytik - Basis für die Entwicklung von Plasmapolymeren
Kruse, A.; Vissing, K.D.; Baalmann, A. | Journal Article |
| 1989 | Plasmapolymerisation auf dem Weg in die Praxis
Michaeli, W.; Plein, P.; Vissing, K. | Journal Article |
| 1987 | Depth profile analysis of hydrogenated carbon layers on silicon and germanium by XPS, AES and SIMS
Sander, P.; Wiedmann, L.; Benninghoven, A.; Sah, R.E. | Conference Paper |
| 1986 | Surface analysis of ultrafine copper powders
Baalmann, A.; Schlett, V. | Conference Paper |