Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
1997Growth of Sn thin films on CdTe(111)
Zimmermann, H.; Keller, R.C.; Meisen, P.; Seelmann Eggebert, M.
Journal Article
1997Imaging scatterer planes by photoelectron diffraction
Seelmann Eggebert, M.
Journal Article
1993A case study for XPD in the presence of a compositional depth profile - interface formation between metals -Ag, Al- and HgCdTe.
Seelmann-Eggebert, M.; Carey, G.P.; Klauser, R.; Richter, H.J.
Journal Article
1993Monolayer-resolved x-ray-excited Auger-electron diffraction from single-plane emission in GaAs
Seelmann-Eggebert, M.; Fasel, U.; Larkins, E.C.; Osterwalder, J.
Journal Article
1992Photoemission spectroscopic techniques to assess physical and chemical properties of mercury cadmium telluride.
Seelmann-Eggebert, M.
Journal Article
1989Angle-resolved x-ray photoelectron spectroscopy as a noninvasive characterization technique for the surface region of processed -Hg, Cd-Te
Richter, H.J.; Seelmann-Eggebert, M.
Conference Paper