Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2002Preparation, morphology, and gas-sensing behavior of Cr/sub 2-x/Ti/sub x/O/sub 3+z/ thin films on standard silicon wafers
Wöllenstein, J.; Plescher, G.; Kühner, G.; Böttner, H.; Niemeyer, D.; Williams, D.E.
Journal Article
2002Reliability of thinned silicon ICs
Landesberger, C.; Bollmann, D.; Klink, G.; Bock, H.; Reichl, H.
Conference Paper
1994X-ray residual stress analysis in components of microsystem technology
Schubert, A.; Kämpfe, B.; Michel, B.
Conference Paper
1993X-ray analysis of residual stress gradients and textures in thin coatings
Schubert, A.; Kämpfe, B.; Auerswald, E.
Conference Paper
1992X-ray diffraction study of small laser-treated spots on WC-Co hardmetal
Ermrich, M.; Stephan, D.; Schultrich, B.
Journal Article