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| 2008 | Definierte Oberflächenfeingestalt von Rohren und Profilen für das Innenhochdruck-Umformen (IHU)
Neugebauer, Reimund; Kurka, P.; Groche, P.; Elsen, A. | Research Report |
| 2006 | Dreidimensionale Topographiesimulation der ionisierten Metallplasma-Abscheidung in der Halbleitertechnologie
Kistler, S. | Dissertation |
| 2003 | Nondestructive topographic resistivity evaluation of semi-insulating SiC substrates
Stibal, R.; Müller, S.; Jantz, W.; Pozina, G.; Magnusson, B.; Ellison, A. | Journal Article |
| 2002 | Topographic electrical characterization of semi-insulating GaAs, InP and SiC substates
Stibal, R.; Müller, S.; Jantz, W. | Conference Paper |
| 2001 | Calibrated reference standards for films in the nanometer range
Hasche, K.; Herrmann, K.; Krumrey, M.; Ulm, G.; Schädlich, S.; Frank, W.; Procop, M. | Conference Paper |
| 1995 | Investigation of surface topography, morphology and structure of hard amorphous carbon films by AFM and TEM
Drescher, D.; Kolitsch, A.; Mensch, A.; Scheibe, H.J. | Conference Paper |
| 1995 | Topographie planen
Bolch, T.; Holeczek, H.; Müll, K. | Journal Article |
| 1994 | Bleachable dyed resist - investigation of its process latitude in comparison with standard resists
Kunze, D.; Pforr, R. | Journal Article |
| 1993 | Contactless resistivity mapping of semi-insulating substrates.
Jantz, W.; Stibal, R. | Journal Article |
| 1991 | Ambient and low temperature photoluminescence topography of GaAs substrates, epitaxial and implanted layers.
Wang, Z.M.; As, D.J.; Jantz, W.; Windscheif, J. | Journal Article |