Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2018Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology
Dammann, Michael; Baeumler, Martina; Brueckner, Peter; Kemmer, Tobias; Konstanzer, Helmer; Graff, Andreas; Simon-Najasek, Michél; Quay, Rüdiger
Journal Article
2018Detailed characterisation of focused ion beam induced lateral damage on silicon carbide samples by electrical scanning probe microscopy and transmission electron microscopy
Stumpf, Florian; Abu Quba, A.A.; Singer, Philip; Rumler, Maximilian; Cherkashin, Nikolay; Schamm-Chardon, Sylvie; Cours, Robin; Rommel, Mathias
Journal Article
2017Atomic diffusion induced degradation in bimetallic layer coated cemented tungsten carbide
Peng, Zirong; Rohwerder, Michael; Choi, Pyuck-Pa; Gault, Baptiste; Meiners, Thorsten; Friedrichs, Marcel; Kreilkamp, Holger; Klocke, Fritz; Raabe, Dierk
Journal Article
2017High resolution physical analysis of ohmic contact formation at GaN-HEMT devices
Graff, A.; Simon-Najasek, M.; Altmann, F.; Kuzmik, J.; Gregušová, D.; Haščík, Š.; Jung, H.; Baur, T.; Grünenpütt, J.; Blanck, H.
Journal Article
2017In-Situ Transmission Electron Microscopy Studies on Advanced Materials for Micro- and Nano-Electronics
Liao, Zhongquan
: Zschech, Ehrenfried (Gutachter); Cuniberti, Gianaurelio (Gutachter); Wolf, Ingrid de (Gutachter)
Dissertation
2017Preparation and TEM characterization of interfaces in co-sintered metal-ceramic composites
Mühle, Uwe; Günther, Anne; Standke, Yvonne; Moritz, Tassilo; Gluch, Jürgen; Zschech, Ehrenfried
Poster
2017Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications
Dammann, Michael; Baeumler, Martina; Polyakov, Vladimir M.; Brueckner, Peter; Konstanzer, Helmer; Quay, Rüdiger; Mikulla, Michael; Graff, Andreas; Simon-Najasek, M.
Journal Article
2016Grain boundary segregation in sintered materials: Effect on densification and grain growth
Lay, Sabine; Guyon, Audrey; Chaix, Jean-Marc; Carry, Claude; Pötschke, Johannes
Conference Paper
2016TEM investigation of time-dependent dielectric breakdown mechanisms in Cu/Low-k interconnects
Liao, Zhongquan; Gall, Martin; Yeap, Kong Boon; Sander, Christoph; Clausner, André; Mühle, Uwe; Gluch, Jürgen; Standke, Yvonne; Rosenkranz, Rüdiger; Aubel, Oliver; Hauschildt, Meike; Zschech, Ehrenfried
Journal Article
2015Bulk titanium nitride ceramics - Significant enhancement of hardness by silicon nitride addition, nanostructuring and high pressure sintering
Bläß, Ulrich W.; Barsukova, Tatiana; Schwarz, Marcus; Köhler, Anke; Schimpf, Christian; Petrusha, Igor A.; Mühle, Uwe; Rafaja, David; Kroke, Edwin
Journal Article
2015Degradation of 0.25 μm GaN HEMTs under high temperature stress test
Dammann, M.; Baeumler, M.; Brückner, P.; Bronner, W.; Maroldt, S.; Konstanzer, H.; Wespel, M.; Quay, R.; Mikulla, M.; Graff, A.; Lorenzini, M.; Fagerlind, M.; Wel, P.J. van der; Roedle, T.
Journal Article
2015Direct generation of titanium dioxide nanoparticles dispersion under supercritical conditions for photocatalytic active thermoplastic surfaces for microbiological inactivation
Zydziak, Nicolas; Ambrosio Zanin, Maria-Helena; Trick, Iris; Hübner, Christof
Journal Article
2015Tunnel oxide passivated carrier-selective contacts based on ultra-thin SiO2 layers
Moldovan, A.; Feldmann, F.; Zimmer, M.; Rentsch, J.; Hermle, M.; Benick, J.
Journal Article, Conference Paper
2014Zr coordination change during crystallization of MgO-Al2O3-SiO2-ZrO2 glass ceramics
Patzig, C.; Höche, T.; Hu, Y.; Ikeno, H.; Krause, M.; Dittmer, M.; Gawronski, A.; Rüssel, C.; Tanaka, I.; Henderson, G.S.
Journal Article, Conference Paper
2012Characterization of laser structures in photovoltaic CIGS thin film systems
Kaufmann, K.; Swatek, S.; Werner, M.; Hagendorf, C.
Conference Paper
2012Cross section analysis of Cu filled TSVs based on high throughput plasma-FIB milling
Altmann, F.; Beyersdorfer, J.; Schischka, J.; Krause, M.; Franz, G.; Kwakman, L.
Conference Paper
2012Microscopic degradation analysis of RF-stressed AlGaN/GaN HEMTs
Gütle, F.; Baeumler, M.; Dammann, M.; Cäsar, M.; Walcher, H.; Waltereit, P.; Bronner, W.; Müller, S.; Kiefer, R.; Quay, R.; Mikulla, M.; Ambacher, O.; Graff, A.; Altmann, F.; Simon, M.
Conference Paper
2012Nanostructure, excitations, and thermoelectric properties of Bi2Te3-based nanomaterials
Aabdin, Z.; Peranio, N.; Eibl, O.; Töllner, W.; Nielsch, K.; Bessas, D.; Hermann, R.P.; Winkler, M.; König, J.; Böttner, H.; Pacheco, V.; Schmidt, J.; Hashibon, A.; Elsässer, C.
Journal Article, Conference Paper
2012Precipitation of antimony implanted into silicon
Koffel, S.; Pichler, P.; Reading, M.A.; Berg, J. van den; Kheyrandish, H.; Hamm, S.; Lerch, W.; Pakfar, A.; Tavernier, C.
Journal Article, Conference Paper
2012Room temperature MBE deposition of Bi2Te3 and Sb2Te3 thin films with low charge carrier densities
Peranio, N.; Winkler, M.; Aabdin, Z.; König, J.; Böttner, H.; Eibl, O.
Journal Article
2010Investigation of boron redistribution during silicidation in TiSi2 using atom probe tomography
Wedderhoff, K.; Kleint, C.; Shariq, A.; Teichert, S.
Abstract
2009Korrosionsverhalten von Siliziumkarbid in Gleitbeanspruchung unter Wasserschmierung
Krummhauer, O.; Presser, V.; Kailer, A.; Nickel, K.G.
Conference Paper
2007Verification of grain boundaries in annealed thin ZrO2 films by electrical AFM technique
Yanev, V.; Paskaleva, A.; Weinreich, W.; Lemberger, M.; Petersen, S.; Rommel, M.; Bauer, A.J.; Ryssel, H.
Poster
2006Analytical and mechanical methods for material property investigations of SnAgCu-solder
Petzold, M.; Bennemann, S.; Graff, A.; Krause, M.; Müller, M.; Wiese, S.; Wolter, K.-J.
Conference Paper
2006Influence of intermetallic phases on reliability in thermosonic Au-Al wire bonding
Müller, T.; Schräpler, L.; Altmann, F.; Knoll, H.; Petzold, M.
Conference Paper
2004Structure and properties of crystalline titanium oxide layers deposited by reactive pulse magnetron sputtering
Zywitzki, O.; Modes, T.; Sahm, H.; Frach, P.; Goedicke, K.; Gloss, D.
Conference Paper, Journal Article
2003Silver thick-film contacts on highly doped n-type silicon emitters: Structural and electronic properties of the interface
Ballif, C.; Huljic, D.M.; Willeke, G.; Hessler-Wyser, A.
Journal Article
2002Nature of the Ag-Si Interface in Screen Printed Contacts
Ballif, F.; Huljic, D.M.; Hessler-Wyser, A.; Willeke, G.
Conference Paper
2002Zahnoberfläche nach Fluoridierung
Petzold, M.; Berthold, L.; Cismak, A.; Morawietz, K.
Book
2000Analysis of peculiar structural defects created in GaAs by diffusion of copper
Frigeri, C.; Weyher, J.; Müller, S.; Hiesinger, P.
Journal Article
2000Deformation Modes and Structure Evolution in Laser-Shock-Loaded Molybdenum Single Crystals of High Purity
Kaspar, J.; Luft, A.; Skrotzki, W.
Journal Article
2000Untersuchung der Mikrostruktur kubisch-raumzentrierter Metalle nach Laserschockbehandlung
Kaspar, J.; Luft, A.
Journal Article
1999On the nature of grain boundary defects in high quality CVD diamond films and their influence on physical properties
Steeds, J.W.; Gilmore, A.; Bussmann, K.M.; Butler, J.E.; Koidl, P.
Journal Article
1998Cross-sectional TEM study of degraded high power diode lasers
Frigeri, C.; Weyher, J.L.; Baeumler, M.; Müller, S.; Jantz, W.; Luft, J.; Herrmann, G.; Späth, W.
Conference Paper
1997Strukturuntersuchungen an nanodiamanthaltigen NickelDispersionsschichten mittels anomaler Röntgenkleinwinkelstreuung (ASAXS)
Probst, S.; Schiffmann, K.; Goerigk, G.
Book Article
1996Polymer coating of metal nanoparticles by a combination of inert gas condensation and plasma polymerization processes
Brauneck, U.; Busmann, H.G.; Günther, B.; Kunze, H.-D.; Petzoldt, F.; Wagener, M.
Conference Paper
1995Investigation of surface topography, morphology and structure of hard amorphous carbon films by AFM and TEM
Drescher, D.; Kolitsch, A.; Mensch, A.; Scheibe, H.J.
Conference Paper
1995Local material removal by focused ion beam milling and etching
Lipp, K.; Frey, L.; Franz, G.; Demm, E.; Petersen, S.; Ryssel, H.
Conference Paper
1995Preparation of cubic boron nitride films by use of electrically conductive boron carbide targets
Lüthje, H.; Bewilogua, K.; Daaud, S.; Johansson, M.; Hultmann, L.
Journal Article
1994Microstructure and contours of crack tip crazes in PVC created under different loading conditions
Könczöl, L.; Döll, W.; Michler, G.H.; Enßlen, M.
Conference Paper
1994Pulsed laser deposition of x-Ray optical layer stacks with atomically flat interfaces
Mai, H.; Dietsch, R.; Holz, T.; Völlmar, S.; Hopfe, S.; Scholz, R.; Weißbrodt, P.; Krawietz, R.; Wehner, B.; Eichler, H.; Wendrock, H.
Conference Paper
1994Untersuchungen zur Brauchbarkeit von TEM-Wellenleiter-Simulatoren als EMV-Empfangsantennen
Braun, C.; Graf, W.; Guidi, P.; Schmidt, H.U.
Conference Paper
1993Compositional analysis of molecular beam epitaxy grown InyGa1-yAs/GaAs/AlxGa1-xAs quantum wells by determination of film thickness.
Maier, M.; Köhler, K.; Höpner, A.; As, D.J.
Journal Article
1992First attempts towards the early detection of fatigued substructures using cyclic-loaded 20 MnMoNi 5 5 steel
Seibold, A.; Dobmann, G.
Journal Article
1988Gefügedarstellung hochverfestigter Scherzonen mit Hilfe der Licht- und Elektronenmikroskopie
Pintat, T.; Rickel, J.; Schäfer, H.
Conference Paper
1985Untersuchungen der Relaxationsrißbildung mit Hilfe der Elektronenstrahlmetallographie
Horn, H.; Pintat, T.; Kunze, H.-D.
Conference Proceedings
1984Untersuchungen der Bruchmechanismen bei Relaxationsversuchen mittels Elektronenstrahlmetallographie
Horn, H.; Pintat, T.
Conference Paper