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| 2009 | Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems
Dammann, M.; Pletschen, W.; Waltereit, P.; Bronner, W.; Quay, R.; Müller, S.; Mikulla, M.; Ambacher, O.; Wel, P.J. van der; Murad, S.; Rödle, T.; Behtash, R.; Bourgeois, F.; Riepe, K.; Fagerlind, M.; Sveinbjörnsson, E.Ö. | Journal Article, Conference Paper |
| 2009 | Reliability of AlGaN/GaN HEMTs under DC- and RF-operation
Dammann, Michael; Cäsar, M.; Waltereit, Patrick; Bronner, Wolfgang; Konstanzer, Helmer; Quay, Rüdiger; Müller, Stefan; Mikulla, Michael; Ambacher, O.; Wel, P. van der; Rödle, T.; Behtash, R.; Bourgeois, F.; Riepe, K. | Conference Paper |
| 2008 | Experimental evidence of different hydrogen donors in n-type InN
Pettinari, G.; Masia, F.; Capizzi, M.; Polimeni, A.; Losurdo, M.; Bruno, G.; Kim, T.H.; Choi, S.; Brown, A.; Lebedev, V.; Cimalla, V.; Ambacher, O. | Journal Article |
| 2008 | Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems
Dammann, M.; Pletschen, W.; Waltereit, P.; Bronner, W.; Quay, R.; Müller, S.; Mikulla, M.; Ambacher, O.; Wel, P.J. van der; Murad, S.; Rödle, T.; Behtash, R.; Bourgeois, F.; Riepe, K.; Fagerlind, M.; Sveinbjörnsson, E.Ö. | Conference Paper |
| 1992 | Frequenzabhängige Kapazitäts-Spannungs-Messungen an Metall-Halbleiter-Randschichten
Steiner, K. | Journal Article |
| 1991 | Elektronenspinresonanz von tiefen und flachen Störstellen in Siliziumkarbid
Maier, K. | Thesis |
| 1991 | Raman spectroscopy for impurity characterization in III-V semiconductors.
Wagner, J. | Journal Article |
| 1990 | Raman spectroscopy of impurities in GaAs
Wagner, J. | Conference Paper |
| 1989 | Optical spectroscopy of impurity levels in GaAs
Wagner, J. | Journal Article |