Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2016Process informed accurate compact modelling of 14-nm FinFET variability and application to statistical 6T-SRAM simulations
Wang, Xingsheng; Reid, Dave; Wang, Liping; Millar, Campbell; Burenkov, Alex; Evanschitzky, Peter; Baer, Eberhard; Lorenz, Juergen; Asenov, Asen
Conference Paper
2012Correlation-aware analysis of the impact of process variations on circuit behavior
Burenkov, Alex; Baer, Eberhard; Lorenz, Juergen; Kampen, Christian
Conference Paper
2012Influence of beam conditions and energy for SEE testing
Ferlet-Cavrois, V.; Schwank, J.R.; Liu, S.; Muschitiello, M.; Beutier, T.; Javanainen, A.; Hedlund, A.; Poivey, C.; Mohammadzadeh, Ali; Harboe-Sorensen, Reno; Santin, Giovanni; Nickson, Bob; Menicucci, A.; Binois, C.; Peyre, D.; Höffgen, Stefan Klaus; Metzger, Stefan; Schardt, D.; Kettunen, H.; Virtanen, A.; Berger, G.; Piquet, B.; Foy, J.-C.; Zafrani, M.; Truscott, P.; Poizat, M.; Bezerra, F.
Journal Article
2011On the influence of RTA and MSA peak temperature variations on Schottky contact resistances of 6-T SRAM cells
Kampen, C.; Burenkov, A.; Pichler, P.; Lorenz, J.
Journal Article, Conference Paper
1998Computer-forgetfulness, cosmic radiation, and an ion-microscope
Adler, E.; Barak, J.; Fischer, B.E.; Metzger, S.
Journal Article
1998Microbeam mapping of single event latchups and single event upsets in CMOS SRAMs
Barak, J.; Adler, E.; Fischer, B.E.; Schlögl, M.; Metzger, S.
Journal Article
1996Kombinierte RAM/PROM Speicherzellen in kalibrierbaren Sensorschaltungen
Boom, T. van den; Hammerschmidt, D.; Machul, O.; Brockherde, W.; Hosticka, B.J.
Conference Paper