Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2015Lab-based in-situ X-ray microscopy - methodical developments and applications in materials science and microelectronics
Niese, Sven
: Schmeißer, Dieter (Gutachter); Zschech, Ehrenfried (Gutachter); Schneider, Gerd (Gutachter)
2012Nitric acid-stabilized superparamagnetic iron oxide nanoparticles studied with X-rays
Mandel, Karl-Sebastian; Szczerba, Wojciech; Thünemann, Andreas F.; Riesemeier, Heinrich; Girod, Matthias; Sextl, Gerhard
Journal Article
2009Oxygen induced strain field homogenization in AlN nucleation layers and its impact on GaN grown by metal organic vapor phase epitaxy on sapphire: An X-ray diffraction study
Bläsing, J.; Krost, A.; Hertkorn, J.; Scholz, F.; Kirste, L.; Chuvilin, A.; Kaiser, U.
Journal Article
2006X-ray topographic imaging of (AI,Ga)N/GaN based electronic device structures on SiC
Kirste, L.; Müller, S.; Kiefer, R.; Quay, R.; Köhler, K.; Herres, N.
Journal Article
1996Lattice locations of silicon atoms in delta-doped layers in GaAs at high doping concentrations
Newman, R.C.; Ashwin, M.J.; Fahy, M.R.; Hart, L.; Holmes, S.N.; Roberts, C.; Zhang, X.; Wagner, J.
Journal Article
1995Gitterdeformation in Silicium nach Implantationen von Phosphor
Remmler, M.; Frey, L.; Ryssel, H.
Conference Paper
1995Investigation of the thermal stability of NI/C multilayers by X-ray methods
Krawietz, R.; Wehner, B.; Meyer, D.; Richter, K.; Mai, H.; Dietsch, R.; Hopfe, S.; Scholz, R.; Pompe, W.
Journal Article
1995Strain profiles in phosphorus implanted /100/-silicon
Remmler, M.; Frey, L.; Horvath, Z.E.; Ryssel, H.
Conference Paper
1994Formation of ordered arrays of metal clusters by annealing of nm-period metal carbon multilayer films
Sewing, A.; Gorbunov, A.A.; Pompe, W.; Dietsch, R.; Mai, H.; Krawietz, R.; Wehner, B.
Conference Paper
1994Thermal ageiing of Ni/C multilayers prepared by pulsed laser deposition
Krawietz, R.; Wehner, B.; Kallis, N.; Dietsch, R.; Mai, H.
Journal Article
1994Untersuchung der Hochtemperaturkorrosion von Titandisilizid mittels zeit- und temperaturaufgelöster Röntgendiffraktometrie
Fietzek, H.
1991Molecular beam epitaxy of Pb1-xSrxSe for the use in IR devices
Kuhn, S.; Evers, J.; Böttner, H.; Herres, N.; Lambrecht, A.; Spanger, B.; Tacke, M.
Journal Article
1986Mikro-Computer automatisiert die Roentgendiffraktometrie fuer den Einsatz in der thermischen Analyse
Marschar, J.
Journal Article