Fraunhofer-Gesellschaft

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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2002Characterisation of BaxSr1-xTiO3 films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction
Petrik, P.; Khanh, N.Q.; Horvath, Z.E.; Zolnai, Z.; Barsony, I.; Lohner, T.; Fried, M.; Gyulai, J.; Schmidt, C.; Schneider, C.; Ryssel, H.
Journal Article
2002Non-destructive characterization of strontium bismuth tantalate films
Petrik, P.; Khanh, N.Q.; Horvath, Z.E.; Zoknai, P.Z.; Barsony, I.; Lohner, T.; Freid, M.; Guylai, J.; Schmidt, C.; Schneider, C.; Ryssel, H.
Journal Article
1999Thin stoichiometric silicon nitride prepared by r.f. reactive sputtering
Qian, F.; Temmel, G.; Schnupp, R.; Ryssel, H.
Conference Paper
1996Material characterisation of SrS:Ce,Mn,Cl films
Troppenz, U.; Bilger, G.; Bohne, W.; Gers, G.; Kreissl, J.; Mauch, R.-H.; Sieber, K.; Velthaus, K.O.
Conference Paper
1994Quantitative Analysis of W-C:H coatings by EPMA, RBS (ERD) and SIMS
Willich, P.; Wang, M.; Wittmaack, K.
Journal Article