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2017 | Grundlagen der Röntgenbildgebung Fuchs, Theobald; Hanke, Randolf | Book Article |
2016 | X-Ray microtomography for materials characterization Hanke, Randolf; Fuchs, Theobald; Salamon, Michael; Zabler, Simon | Book Article |
2015 | Development of a Timepix based detector for the NanoXCT project Nachtrab, Frank; Hofmann, Thomas; Speier, Christoph; Lucic, Julija; Firsching, Markus; Uhlmann, Norman; Takman, Per; Heinzl, Christoph; Holmberg, Anders; Krumm, Michael; Sauerwein, Christoph | Journal Article, Conference Paper |
2015 | NanoXCT: Entwicklung eines Nano-Computertomographie-Gerätes für den Laboreinsatz Firsching, Markus; Nachtrab, Frank; Uhlmann, Norman; Takman, Per; Heinzl, Christoph; Holmberg, Anders; Krumm, Michael; Sauerwein, Christoph | Conference Paper |
2014 | Development of an imaging X-ray detector for the NanoXCT project Habl, Matthias; Firsching, Markus; Nachtrab, Frank; Uhlmann, Norman | Conference Paper |
2014 | Evaluation of influencing factors in dual energy X-ray imaging Ennen, Alexander; Firsching, Markus; Mühlbauer, Jörg; Bierl, Daniel; Schmitt, Michael; Voland, Virginia | Abstract |
2009 | Automatisierte Faserorientierungsanalyse an Faserverbundwerkstoffen Lugin, S.; Netzelmann, U. | Conference Paper |
2007 | Tomolibri - CT als industrielles Messmittel Modrich, Kai-Udo; Neumayer, Dirk | Conference Paper |
2007 | X-ray system measures surface density Modrich, Kai-Udo | Journal Article |
2004 | Automation of the EMBL Hamburg protein crystallography beamline BW7B Pohl, E.; Ristau, U.; Gehrmann, T.; Jahn, D.; Robrahn, B.; Malthan, D.; Dobler, J.; Hermes, C. | Journal Article |
2003 | Low noise, large area CMOS X-ray image sensor for C.T. application Kemna, A.; Brockherde, W.; Hosticka, B.J.; Özkan, E.; Morales-Serrano, F.; Steadman, R.; Vogtmeier, G. | Conference Paper |
2003 | Low noise, large area CMOS X-ray image sensor for C.T. application Kemna, A.; Brockherde, W.; Hosticka, B.J.; Özkan, E.; Morales-Serrano, F.; Steadman, R.; Vogtmeier, G. | Conference Paper |