Fraunhofer-Gesellschaft

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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2016Optimized design for 4H-SiC power DMOSFETs
Benedetto, Luigi di; Licciardo, Gian D.; Erlbacher, Tobias; Bauer, Anton J.; Rubino, Alfredo
Journal Article
2014Thermal properties of interconnects in power MOSFETs
Burenkov, Alex; Bär, Eberhard; Boianceanu, Cristian
Conference Paper
2012Influence of beam conditions and energy for SEE testing
Ferlet-Cavrois, V.; Schwank, J.R.; Liu, S.; Muschitiello, M.; Beutier, T.; Javanainen, A.; Hedlund, A.; Poivey, C.; Mohammadzadeh, Ali; Harboe-Sorensen, Reno; Santin, Giovanni; Nickson, Bob; Menicucci, A.; Binois, C.; Peyre, D.; Höffgen, Stefan Klaus; Metzger, Stefan; Schardt, D.; Kettunen, H.; Virtanen, A.; Berger, G.; Piquet, B.; Foy, J.-C.; Zafrani, M.; Truscott, P.; Poizat, M.; Bezerra, F.
Journal Article
2012Investigations of single event effects with heavy ions of energies up to 1.5 GeV/n
Höffgen, Stefan Klaus; Durante, Marco; Ferlet-Cavrois, Veronique; Harboe-Sorensen, Reno; Lennartz, Wilhelm; Kündgen, Tobias; Kuhnhenn, Jochen; LaTessa, Chiara; Mathes, Markus; Menicucci, Alessandra; Metzger, Stefan; Nieminen, Petteri; Pleskac, Radek; Poivey, Christian; Schardt, Dieter; Weinand, Udo
Journal Article
2012Significant on-resistance reduction of LDMOS devices by intermitted trench gates integration
Erlbacher, Tobias; Bauer, Anton J.; Frey, Lothar
Journal Article
2005Accelerated failure test for high temperature applications of power MOSFETs by power cycling
Schacht, R.; Auerswald, E.; Sommer, J.-P.; Wunderle, B.; Michel, B.; Reichl, H.
Conference Paper