Fraunhofer-Gesellschaft

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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2017Approximative derivation of the extinction efficiency for a two and threefold stratified cylinder
Brendel, Harald; Seifert, Gerhard; Raether, Friedrich
Journal Article
1998AFM and light scattering measurements of optical thin films for applications in the UV spectral region
Jakobs, S.; Duparre, A.; Truckenbrodt, H.
Journal Article
1998Interfacial roughness and related scatter in UV-optical coatings
Jacobs, S.; Duparre, A.; Truckenbrodt, H.
Journal Article
1997Characterization of SiO2 protective coatings on polycarbonate
Jakobs, S.; Schulz, U.; Duparre, A.; Kaiser, N.
Journal Article
1997Concepts for standardization of total scatter measurements at 633 nm
Kadkhoda, M.; Strink, P.; Ristau, D.; Duparre, A.; Gliech, S.; Reng, N.; Greif, M.; Schuhmann, R.; Goldner, M.
Conference Paper
1997Influence of substrate surface and film roughness on the quality of optical coatings for the UV spectral region
Duparre, A.; Jakobs, S.; Kaiser, N.
Conference Paper
1997Non-contact testing of optical surfaces by multiple-wavelength light scattering measurement
Duparre, A.; Gliech, S.
Conference Paper
1996Analysis of interface and volume inhomogenities in a multilayer system by light scattering methods
Pichlmaier, S.; Hehl, K.; Schuhmann, U.; Duparre, A.; Gliech, S.
Conference Paper
1996Apparatus for measuring integrated light scattering of optical components over an extended range of wavelengths
Duparre, A.; Gliech, S.
Conference Paper
1996Combination of surface characterization techniques for investigating optical thin-film components
Duparre, A.; Jakobs, S.
Journal Article
1996Dependence of the surface morphology and scattering of optical coatings on film material, substrate roughness, and deposition process
Jakobs, S.; Feigl, T.; Duparre, A.
Conference Paper
1996Optical scattering and surface microstructure of thin films for laser application
Duparre, A.; Kiesel, A.; Gliech, S.
Journal Article
1996Polarizerless electro-optic IR shutter based on a cholesteric scattering effect
Stieb, A.E.
Journal Article
1996Roughness analysis of optical films and substrates by atomic force microscopy
Duparre, A.; Ruppe, C.
Journal Article
1995Light scattering of thin dielectric films
Duparre, A.
Book Article
1994Größenanalyse transparenter Partikel mit Hilfe der Laser-Beugungsspektrometrie
Teipel, U.; Siegl, T.; Aksel, N.
Conference Paper
1994Interface and volume inhomogenities in optical thin films investigated by light scattering methods
Duparre, A.; Gliech, S.; Hehl, K.; Pichlmaier, U.; Schuhmann, U.
Conference Paper
1994Roughness and scattering measurements on thin films for UV/VIS applications
Duparre, A.; Kiesel, A.; Kaiser, N.; Truckenbrodt, H.; Schuhmann, U.
Conference Paper
1993Laterally and depth resolved photothermal absorption measurements on ZrO2 and MgF2 single-layer films
Reichling, M.; Welsch, E.; Duparre, A.; Matthias, E.
Conference Paper
1993Real-time detection of surface damage by direct assessment of the BRDF
Rothe, H.; Duparre, A.; Truckenbrodt, H.; Timm, M.
Conference Paper
1993Relation between light scattering and the microstructure of optical thin films
Duparre, A.; Kassam, S.
Journal Article
1993Scattering losses of oxide and fluoride coatings for lasers
Duparre, A.; Uhlig, H.; Kassam, S.
Conference Paper
1992Light scattering from the volume of optical thin films: theory and experiment
Duparre, A.; Kassam, S.; Hehl, K.; Bussemer, P.; Neubert, J.
Journal Article
1992Roughness and defect characterization of optical surfaces by light scattering measurements
Truckenbrodt, H.; Duparre, A.; Schuhmann, U.
Conference Paper
1983Light scattering from parallel-pump instabilities in yttrium iron garnet
Wettling, W.; Wilber, W.D.; Kabos, P.; Patton, C.E.
Journal Article
1982Observation of the high frequency spin wave branch and the uniform precession mode in FeBO3 by Brillouin scattering
Wettling, W.; Wilber, W.D.; Patton, C.E.
Journal Article