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| 2021 | Gallium-Doped Silicon for High-Efficiency Commercial Passivated Emitter and Rear Solar Cells
Grant, N.E.; Altermatt, P.P.; Niewelt, T.; Post, R.; Kwapil, W.; Schubert, M.C.; Murphy, J.D. | Journal Article |
| 2020 | Front Side Optimization on Boron- and Gallium-Doped Cz-Si PERC Solar Cells Exceeding 22% Conversion Efficiency
Lohmüller, E.; Greulich, J.; Saint-Cast, P.; Lohmüller, S.; Schmidt, S.; Belledin, U.; Fellmeth, T.; Mack, S.; Emanuel, G.; Krieg, K.; Zimmer, M.; Kunert, R.; Zobel, F.; Linse, M.; Horzel, J.; Meßmer, M.; Wolf, A.; Preu, R. | Conference Paper |
| 2020 | Ga-, Y-, and Sc-substituted M-type ferrites for self-biasing circulators in LTCC microwave modules
Heidenreich, Manuel; Ma, Xinyi; Gitzel, Wanja; Jacob, Arne; Capraro, Beate; Töpfer, Jörg | Journal Article |
| 2019 | Recovery of gallium from smartphones - Part I: Thermal and mechanical pretreatment
Flerus, Benedikt; Billmann, Laura; Bokelmann, Katrin; Stauber, Rudolf; Friedrich, Bernd | Conference Paper |
| 2019 | Ressourceneffiziente magnetische Formgedächtnismaterialien mit reduziertem Galliumbedarf. Schlussbericht Projekt MAREGA
Laufenberg, Markus; Pagounis, Emmanouel; Tüysüz, Arda; Breisch, Sebastian; Böhm, Andrea; Panesso Perez, Miguel Antonio; Pagel, Kenny; Brillo, Jürgen; Kargl, Florian; Behnken, Herfried | Report |
| 2018 | Elektrolytische Gallium-Abscheidung als Recyclingtechnologie
Knoblauch, Christiane; Schmid, Klaus | Journal Article |
| 2017 | Recyclingpotenzial strategischer Metalle (ReStra)
Sander, Knut; Gößling-Reisemann, Stefan; Zimmermann, Till; Marscheider-Weidemann, Frank; Wilts, Henning; Schebek, Liselotte; Wagner, Jörg; Heegn, Hanspeter; Pehlken, Alexandra | Report |
| 2013 | Light-induced degradation in copper-contaminated gallium-doped silicon
Lindroos, J.; Yli-Koski, M.; Haarahiltunen, A.; Schubert, M.C.; Savin, H. | Journal Article |
| 2012 | Angular distributions of sputtered silicon at grazing gallium ion beam incidence
Burenkov, Alex; Sekowski, Matthias; Belko, Viktor; Ryssel, Heiner | Journal Article, Conference Paper |
| 2012 | Evaluation of resistless Ga+ beam lithography for UV-NIL stamp fabrication
Rumler, Maximilian; Fader, Robert; Haas, Anke; Rommel, Matthias; Bauer, Anton J.; Frey, Lothar | Poster |
| 2007 | Degradation of the minority carrier lifetime caused by Mn-correlated defects in Ga-implanted Si:P
Beljakowa, S.; Pensl, G.; Rommel, M. | Poster |
| 1999 | Comparison of beam-induced deposition using ion microprobe
Park, Y.S.; Nagai, T.; Takai, M.; Lehrer, C.; Frey, L.; Ryssel, H. | Journal Article, Conference Paper |
| 1983 | Phonon softening in ultra heavily doped Si and Ge.
Cardona, M.; Axmann, A.; Compaan, A.; Contreras, G. | Journal Article |
| 1981 | Nd-YAG laser annealing of gallium-implanted silicon.
Takai, M.; Tsou, S.C.; Tsien, P.H.; Roeschenthaler, D.; Ryssel, H. | Journal Article |