Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2018MgF2 films prepared from solvothermally treated precursor solutions
Jahn, Rainer; Löbmann, Peer
Journal Article
2017Characterization of sol-gel thin films by ellipsometric porosimetry
Löbmann, Peer
Journal Article
2016Im Durchlauf: Inline-Prüfung von gekrümmten Oberflächen und Beschichtungen
Negara, Christian
Journal Article
2009Observation of Fermi-edge and excitons and exciton-phonon complexes in the optical response of heavily doped n-type wurtzite GaN
Shokhovets, S.; Köhler, K.; Ambacher, O.; Gobsch, G.
Journal Article
2008Anisotropy of the momentum matrix element, dichroism, and conduction-band dispersion relation of wurtzite semiconductors
Shokhovets, S.; Ambacher, O.; Meyer, B.K.; Gobsch, G.
Journal Article
2008Investigation of thin oxide films on titanium for capacitor applications
Schroth, S.; Schneider, M.; Mayer-Uhma, T.; Michaelis, A.; Klemm, V.
Conference Paper, Journal Article
2008Spectroscopic ellipsometry and ellipsometric porosimetry studies of CVD low-k dielectric films
Marsik, P.; Verdonck, P.; Schneider, D.; Roest, D. de; Kaneko, S.; Baklanov, M.R.
Conference Paper, Journal Article
2003Temperaturstabile transparente und hochbrechende dünne Schichten auf der Basis von Titandioxid
Hunsche, B.
Dissertation
2001Least squares orthogonal distance fitting of implicit curves and surfaces
Ahn, S.J.; Rauh, W.; Recknagel, M.
Conference Paper
2001Least-squares orthogonal distances fitting of circle, sphere, ellipse, hyperbola, and parabola
Ahn, S.J.; Rauh, W.; Warnecke, H.-J.
Journal Article
1999Geometric Fitting of Line, Plane, Circle, Sphere and Ellipse
Ahn, S.J.; Rauh, W.; Recknagel, M.
Conference Paper
1999Simulation of a Coating Protection for an In Situ Ellipsometer in a CVD Furnace
Poscher, S.; Lehnert, W.; Ryssel, H.
Conference Paper
1998Geometric Fitting of Circle and Ellipse
Ahn, S.J.
Conference Paper
1998Least Squares Fitting of Circle and Ellipse
Ahn, S.J.; Rauh, W.; Oberdorfer, B.
Conference Paper
1998Optische Untersuchungen von antimonidischen III/V-Verbindungshalbleitern
Serries, D.
Thesis
1998Oxide layer thickness measurement
Schneider, C.
Journal Article
1996Structural characterization of InAs/(GaIn)Sb superlattices for IR optoelectronics
Wagner, J.; Schmitz, J.; Fuchs, F.; Weimar, U.; Herres, N.; Tränkle, G.; Koidl, P.
Conference Paper
1995Comparative film thickness determination by atomic force microscopy and ellipsometry for ultrathin prepolymer films
Gesang, T.; Fanter, D.; Höper, R.; Possart, W.; Hennemann, O.-D.
Journal Article
1995InAs/GaSb superlattices with different interfaces studied by resonant raman scattering ans ellipsometry
Behr, D.; Wagner, J.; Ralston, J.D.; Koidl, P.; Ramsteiner, M.; Schrottke, L.; Jungk, G.
Conference Paper
1995Licht untersucht dünnste Schichten
Fanter, D.; Possart, W.; Hennemann, O.-D.
Journal Article
1995Pulsed laser deposition of laterally graded X-ray optical multilayers on substrates of technical relevance
Dietsch, R.; Holz, T.; Krawietz, R.; Mai, H.; Schöneich, B.; Scholz, R.; Völlmar, S.; Wehner, B.
Conference Paper
1995Surface influence on the doping dependence of the E1 plus Delta1 critical points of GaAs - electric field and inpurity unscreening effect
Kuball, M.; Kelly, M.K.; Santos, P.V.; Cardona, M.; Köhler, K.; Wagner, J.
Conference Paper
1995Variable-angle spectroscopic ellipsometry for deep UV characterization of dielectric coatings
Zuber, A.; Kaiser, N.; Stehle, J.L.
Journal Article
1992Diamond-like carbon films prepared by laser arc
Schöneich, B.; Mucha, A.; Siemroth, P.; Scheibe, H.J.
Conference Paper
1992Laser pulse vapour deposition of metal-carbon superlattices for soft X-ray mirror applications
Dietsch, R.; Mai, H.; Pompe, W.; Schöneich, B.; Völlmar, S.; Hopfe, S.; Scholz, R.; Wehner, B.; Weißbrodt, P.; Wendrock, H.
Conference Paper
1992Multischichten für die Optik im weichen Röntgengebiet
Dietsch, R.; Mai, H.; Pompe, W.; Völlmar, S.
Conference Paper
1986Hard amorphous carbon studied by ellipsometry and photoluminescence
Lautenschlager, P.; Wagner, J.
Journal Article