Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2010A novel functionalization of AlGaN/GaN-pH-ISFETs for DNA-sensors
Linkohr, S.; Schwarz, S.U.; Krischok, S.; Lorenz, P.; Nakamura, T.; Polyakov, V.M.; Cimalla, V.; Nebel, C.E.; Ambacher, O.
Conference Paper
2009Band gap, electronic structure, and surface electron accumulation of cubic and rhombohedral In2O3
King, P.D.C.; Veal, T.D.; Fuchs, F.; Wang, C.Y.; Payne, D.J.; Bourlange, A.; Zhang, H.; Bell, G.R.; Cimalla, V.; Ambacher, O.; Egdell, R.G.; Bechstedt, F.; McConville, C.F.
Journal Article
2009Effect of annealing on the properties of indium-tin-oxynitride films as ohmic contacts for GaN-based optoelectronic devices
Himmerlich, M.; Koufaki, M.; Ecke, G.; Mauder, C.; Cimalla, V.; Schaefer, J.A.; Kondilis, A.; Pelekanos, N.T.; Modreanu, M.; Krischok, S.; Aperathitis, E.
Journal Article
1996Adhäsion zwischen Polymer und Metall oder Halbleiter. Beobachtungen mit spektroskopischen Methoden
Possart, W.; Dieckhoff, S.
Conference Paper
1996The analysis of surface-adsorbed organic molecules by alkali-assisted MIES combined with UPS(Hel)
Günster, J.; Ochs, D.; Dieckhoff, S.; Schlett, V.
Journal Article
1996Characterization of triazine derivatives on silicon wafers studied by photoelectron spectroscopy (XPS, UPS) and metastable impact electron spectroscopy (MIES)
Dieckhoff, S.; Schlett, V.; Possart, W.; Hennemann, O.-D.; Günster, J.; Kempter, V.
Journal Article
1988Oberflächenanalytik. Für gezielte Untersuchungen unentbehrlich
Baalmann, A.; Günther, B.
Journal Article
1987Depth profile analysis of hydrogenated carbon layers on silicon by x-ray photoelectron spectroscopy, Auger electron spectroscopy, electron energyloss spectroscopy, and secondary ion mass spectrometry
Sander, P.; Kaiser, U.; Altebockwinkel, M.; Wiedmann, L.; Benninghoven, A.; Sah, R.E.; Koidl, P.
Journal Article
1984Comments on the composition of anodic films on Hg0.8Cd0.2Te.
Brandt, G.; Richter, H.J.; Seelmann-Eggebert, M.
Journal Article