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| 2021 | Monitoring the surface aging of wood through its pits using atomic force microscopy with functionalized tips
Mao, Jia; Abushammala, Hatem; Kasal, Bohumil | Journal Article |
| 2021 | Repeatability of adhesion force measurement on wood longitudinal cut cell wall using atomic force microscopy
Juan, Li; Kasal, Bohumil | Journal Article |
| 2018 | Air plasma treatment of aluminium trihydrate filled poly(methyl methacrylate)
Vovk, M.; Wallenhorst, L.; Kaldun, C.; Meuthen, J.N.; Arendt, A.L.; Sernek, M.; Zigon, J.; Kaufmann, D.E.; Viöl, W.; Dahle, S. | Journal Article |
| 2018 | Force-induced unravelling of DNA origami
Engel, Megan C.; Smith, David M.; Jobst, Markus A.; Sajfutdinow, Martin; Liedl, Tim; Romano, Flavio; Rovigatti, Lorenzo; Louis, Ard A.; Doye, Jonathan P.K. | Journal Article |
| 2018 | Nano- and micro-patterned S-, H- and X-PDMS for cell-based applications: Comparison of wettability, roughness and cell-derived parameters
Scharin-Mehlmann, Marina; Häring, Aaron; Rommel, Mathias; Dirnecker, Tobias; Friedrich, Oliver; Frey, Lothar; Gilbert, Daniel F. | Journal Article |
| 2017 | An end of service life assessment of PMMA lenses from veteran concentrator photovoltaic systems
Miller, D.C.; Khonkar, H.I.; Herrero, R.; Anton, I.; Johnson, D.K.; Hornung, T.; Schmid-Schirling, T.; Vinzant, T.B.; Deutch, S.; To, B.; Sala, G.; Kurtz, S.R. | Journal Article |
| 2017 | Phase transformation in AFM silicon tips
Kopycinska-Müller, Malgorzata; Barth, Martin; Küttner, Martin; Köhler, Bernd | Journal Article |
| 2016 | Mechanical characterization of porous nano-thin films by use of atomic force acoustic microscopy
Kopycinska-Müller, Malgorzata; Clausner, André; Yeap, Kong Boon Oon; Köhler, Bernd; Kuzeyeva, Nataliya; Mahajan, Sukesh; Savage, Travis; Zschech, Ehrenfried; Wolter, Klaus-Jürgen | Journal Article |
| 2016 | Piezo-force and vibration analysis of ZnO nanowire arrays for sensor application
Christian, B.; Volk, J.; Lukács, I.E.; Sautieffc, E.; Sturm, C.; Graillot, A.; Dauksevicius, R.; O'Reilly, E.; Ambacher, O.; Lebedev, V. | Journal Article |
| 2016 | Study of mechanical behavior of AFM silicon tips under mechanical load
Kopycinska-Müller, Malgorzata; Gluch, Jürgen; Köhler, Bernd | Journal Article |
| 2016 | Tribological wear analysis and numerical lifetime prediction of glassy carbon tools in fused silica molding
Dukwen, Julia; Friedrichs, Marcel; Liu, Gang; Tang, Minjie; Dambon, Olaf; Klocke, Fritz | Journal Article |
| 2015 | Influence of growth temperature on the defect density for 4H-SiC homoepitaxy
Kaminzky, Daniel; Roßhirt, Katharina; Kallinger, Birgit; Berwian, Patrick; Friedrich, Jochen | Poster |
| 2014 | Engineering of a bio-functionalized hybrid off-the-shelf heart valve
Hinderer, Svenja; Seifert, Jan; Votteler, Miriam; Shen, Nian; Rheinlaender, Johannes; Schäffer, Tilman E; Schenke-Layland, Katja | Journal Article |
| 2012 | Atomic force microscopy probes with integrated boron doped diamond electrodes: Fabrication and application
Eifert, A.; Smirnov, W.; Frittmann, S.; Nebel, C.E.; Mizaikoff, B.; Kranz, C. | Journal Article |
| 2011 | The creation of a biomimetic interface between boron-doped diamond and immobilized proteins
Hoffmann, R.; Kriele, A.; Obloh, H.; Tokuda, N.; Smirnov, W.; Yang, N.; Nebel, C.E. | Journal Article |
| 2011 | Gate oxide reliability at the nano-scale evaluated by combining cAFM and CVS
Erlbacher, T.; Yanev, V.; Rommel, M.; Bauer, A.J.; Frey, L. | Journal Article |
| 2010 | Electrical scanning probe microscopy techniques for the detailed characterization of high-k dielectric layers
Rommel, M.; Yanev, V.; Paskaleva, A.; Erlbacher, T.; Lemberger, M.; Bauer, A.J.; Frey, L. | Conference Paper |
| 2010 | Fabrication of metallic SPM tips by combining UV nanoimprint lithography and focused ion beam processing
Jambreck, J.D.; Schmitt, H.; Amon, B.; Rommel, M.; Bauer, A.J.; Frey, L. | Journal Article |
| 2010 | Manufacturing, characterization, and application of nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy
Jambreck, J.D.; Yanev, V.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L. | Poster |
| 2010 | Nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy: Manufacturing, characterization, and application
Jambreck, J.D.; Yanev, V.; Schmitt, H.; Rommel, M.; Bauer, A.J.; Frey, L. | Poster |
| 2009 | Observation of local internal friction and plasticity onset in nanocrystalline nickel by atomic force acoustic microscopy
Caron, A.; Arnold, W. | Journal Article |
| 2008 | Electrical AFM techniques for the advanced characterization of materials in semiconductor technology
Yanev, V.; Rommel, M.; Spoldi, G.; Beuer, S.; Amon, B.; Petersen, S.; Lugstein, A.; Steiger, A.; Bauer, A.J.; Ryssel, H. | Poster |
| 2007 | Combinatorial synthesis of thin mixed oxide films and automated study of their piezoelectric properties
Rende, D.; Schwarz, K.; Rabe, U.; Maier, W.F.; Arnold, W. | Conference Paper |
| 2007 | Combinatorial synthesis of thin mixed oxide-films and examinations of their piezoelectricity by ultrasonic piezo-mode imaging
Rende, D.; Maier, W.F.; Schwarz, K.; Rabe, U.; Arnold, W. | Conference Paper |
| 2007 | Verification of grain boundaries in annealed thin ZrO2 films by electrical AFM technique
Yanev, V.; Paskaleva, A.; Weinreich, W.; Lemberger, M.; Petersen, S.; Rommel, M.; Bauer, A.J.; Ryssel, H. | Poster |
| 2006 | Mikrotribologische Untersuchungen dünner Schichten unter Anwendung rastersondenbasierter Verfahren
Küster, R. | Dissertation |
| 2005 | Scanning force microscopy for optical surface metrology
Flemming, M.; Roder, K.; Duparre, A. | Conference Paper |
| 2005 | Zerstörungsfreie Prüfverfahren für die Elektronik, mikrobearbeitete Strukturen und Baugruppen
Köhler, B.; Schreiber, J.; Bendjus, B.; Herms, M.; Melov, V.G.; Krüger, P.; Meyendorf, N. | Journal Article |
| 2004 | Atomic force microscopy with lateral modulation
Scherer, V.; Reinstädtler, M.; Arnold, W. | Book Article |
| 2004 | Determination of local stress intensity factor at crack tip using image correlation techniques
Tsai, Y.; Keller, J.; Eylon, D.; Vogel, D.; Michel, B.; Meyendorf, N. | Conference Paper |
| 2003 | Silver thick-film contacts on highly doped n-type silicon emitters: Structural and electronic properties of the interface
Ballif, C.; Huljic, D.M.; Willeke, G.; Hessler-Wyser, A. | Journal Article |
| 2002 | Growth of Ag films on PET deposited by magnetron sputtering
Charton, C.; Fahland, M. | Journal Article |
| 2002 | Reliability of thinned silicon ICs
Landesberger, C.; Bollmann, D.; Klink, G.; Bock, H.; Reichl, H. | Conference Paper |
| 2001 | Rastersondertechniken
Reschke, S. | Journal Article |
| 2000 | Analysis of peculiar structural defects created in GaAs by diffusion of copper
Frigeri, C.; Weyher, J.; Müller, S.; Hiesinger, P. | Journal Article |
| 2000 | Studies on phase transformations of Cu-phthalocyanine thin films
Berger, O.; Fischer, W.-J.; Adolphi, B.; Tierbach, S.; Melov, V.G.; Schreiber, J. | Journal Article |
| 1999 | DUV light scattering and morphology of ion beam sputtered fluoride coatings
Quesnel, E.; Petit dit Dariel, A.; Duparre, A.; Ferre-Borrull, J.; Steinert, J. | Conference Paper |
| 1999 | Hochauflösende Topometrie im Kontext globaler Makrostrukturen
Duparre, A.; Notni, G.; Recknagel, R.-J.; Feigl, T.; Gliech, S. | Journal Article |
| 1998 | Comparative study of surface roughness measured on polysilicon using spectroscopic ellipsometry and atomic force microscopy
Petrik, P.; Biro, L.P.; Fried, M.; Lohner, T.; Berger, R.; Schneider, C.; Gyulai, J.; Ryssel, H. | Journal Article |
| 1998 | Scatter investigation of UV-films. Facing the trend towards shorter wavelength
Duparre, A.; Kaiser, N. | Conference Paper |
| 1998 | Wide scale surface measurement using white light interferometry and atomic force microscopy
Recknagel, R.-J.; Feigl, T.; Duparre, A.; Notni, G. | Conference Paper |
| 1997 | Adhesion Mechanism of Aluminum, Aluminum Oxide, and Silicon Oxide on Biaxially Oriented Polypropylene (BOPP), Poly(ethyleneterephthalate) (PET), and Poly(vinyl Chloride) (PVC)
Bichler, C.; Langowski, H.-C.; Moosheimer, U.; Seifert, B. | Journal Article |
| 1997 | Characterization of vapor phase deposited organic molecules on silicon surfaces
Dieckhoff, S.; Höper, R.; Schlett, V.; Gesang, T.; Possart, W.; Hennemann, O.-D.; Günster, J.; Kempter, V. | Journal Article |
| 1997 | Progress in the layer thickness determination of AlGaAs/GaAs heterostructures using selective etching and AFM imaging of the (110) cleavage planes
Müller, S.; Weyher, J.L.; Dian, R.; Jantz, W. | Journal Article |
| 1997 | Structural and optical properties of AlGaN/GaN quantum well structures grown by MOCVD on sapphire
Niebuhr, R.; Bachem, K.H.; Behr, D.; Hoffmann, C.; Kaufmann, U.; Lu, Y.; Santic, B.; Wagner, J.; Arlery, M.; Rouviere, J.L.; Jürgensen, H. | Conference Paper |
| 1996 | Adhesion and film structure of cyanurates on solids
Possart, W.; Dieckhoff, S.; Gesang, T.; Schlett, V.; Hennemann, O.-D. | Conference Paper |
| 1996 | Combination of selective etching and AFM imaging for the thickness analysis of AlGaAs/GaAs heterostructures
Müller, S.; Weyer, J.L.; Köhler, K.; Jantz, W.; Frigeri, C. | Conference Paper |
| 1995 | AFM - Abbildung feinster Strukturen
Gesang, T.; Höper, R.; Possart, W.; Hennemann, O.-D. | Journal Article |
| 1995 | Formation of surface defects on polymer lenses depending on moisture absorption
Schulz, U.; Jakobs, S.; Anton, B.; Kaiser, N. | Conference Paper |
| 1995 | Imaging elastic sample properties with an atomic force microscope operating in the Tapping Mode
Höper, R.; Gesang, T.; Possart, W.; Hennemann, O.-D.; Boseck, S. | Journal Article |
| 1995 | Investigation of surface topography, morphology and structure of hard amorphous carbon films by AFM and TEM
Drescher, D.; Kolitsch, A.; Mensch, A.; Scheibe, H.J. | Journal Article |
| 1995 | Kraftmikroskopische Untersuchungen an Ultrapräzisionsbearbeiteten Oberflächen
Scherer, Volker | Thesis |
| 1995 | Organic film formation investigated by atomic force microscopy on the nanometer scale
Gesang, T.; Höper, R.; Dieckhoff, S.; Schlett, V.; Possart, W.; Hennemann, O.-D. | Journal Article |
| 1995 | Quantitative Erfassung von Oberflächentopographien
Gesang, T.; Höper, R.; Possart, W.; Hennemann, O.-D. | Journal Article |
| 1994 | Investigation of heteroepitaxial diamond films by scanning tunneling and atomic force microscopy
Jiang, X.; Schiffmann, K.I. | Journal Article |
| 1994 | Nucleation and initial growth phase of diamond thin films on (100) silicon
Jiang, X.; Klages, C.-P.; Schiffmann, K.I. | Journal Article |
| 1993 | Atomic-force-microscopic study of heteroepitaxial diamond nucleation on (100) silicon
Jiang, X.; Schiffmann, K.I.; Westphal, A.; Klages, C.-P. | Journal Article |
| 1993 | Investigation of fabrication parameters for the electron-beam induced deposition of contamination tips used in atomic force microscopy
Schiffmann, K.I. | Journal Article |
| 1992 | Influence of a RF plasma on the nucleation of aluminium using n-trimethy lamine-alane -TMAA- as precursor
Bringmann, U.; Klages, C.-P.; Weber, A.; Schiffmann, K.I. | Conference Paper |