Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2011Comprehensive characterization of advanced cell concepts with sub-micron resolution
Gundel, P.; Drießen, M.; Bartsch, J.; Jäger, U.; Suwito, D.; Heinz, F.D.; Warta, W.; Schubert, M.C.
Conference Paper, Journal Article
2011Comprehensive microscopic analysis of laser-induced high doping regions in silicon
Gundel, P.; Suwito, D.; Jäger, U.; Heinz, F.D.; Warta, W.; Schubert, M.C.
Journal Article
2011Evaluating the aluminum-alloyed p+-layer of silicon solar cells by emitter saturation current density and optical microspectroscopy measurements
Woehl, R.; Gundel, P.; Krause, J.; Rühle, K.; Heinz, F.D.; Rauer, M.; Schmiga, C.; Schubert, M.C.; Warta, W.; Biro, D.
Journal Article
2011Hall mobility in multicrystalline silicon
Schindler, F.; Geilker, J.; Kwapil, W.; Warta, W.; Schubert, M.C.
Journal Article
2011Micro-spectroscopy on silicon wafers and solar cells
Gundel, P.; Schubert, M.C.; Heinz, F.D.; Woehl, R.; Benick, J.; Giesecke, J.A.; Suwito, D.; Warta, W.
Journal Article
2011Minority carrier lifetime imaging of silicon wafers calibrated by quasi-steady-state photoluminescence
Giesecke, J.A.; Schubert, M.C.; Michl, B.; Schindler, F.; Warta, W.
Journal Article
2011Minority carrier lifetime of silicon solar cells from quasi-steady-state photoluminescence
Giesecke, J.A.; Michl, B.; Schindler, F.; Schubert, M.C.; Warta, W.
Journal Article
2011Spatially resolved carrier lifetime calibrated via quasi-steady-state photoluminescence
Giesecke, J.A.; Michl, B.; Schindler, F.; Schubert, M.C.; Warta, W.
Conference Paper, Journal Article
2011Understanding junction breakdown in multicrystalline solar cells
Breitenstein, O.; Bauer, J.; Bothe, K.; Kwapil, W.; Lausch, D.; Rau, U.; Schmidt, J.; Schneemann, M.; Schubert, M.C.; Wagner, J.-M.; Warta, W.
Journal Article
2011Understanding the distribution of iron in multicrystalline silicon after emitter formation
Schön, J.; Habenicht, H.; Schubert, M.C.; Warta, W.
Journal Article
2010Analysis of performance limiting material properties of multicrystalline silicon
Schubert, M.C.; Kwapil, W.; Schön, J.; Habenicht, H.; Kasemann, M.; Gundel, P.; Blazek, M.; Warta, W.
Journal Article, Conference Paper
2010Analysis of simultaneous boron and phosphorus diffusion gettering in silicon
Schön, J.; Schubert, M.C.; Warta, W.; Savin, H.; Haarahiltunen, A.
Journal Article
2010Approach to the physical origin of breakdown in silicon solar cells by optical spectroscopy
Gundel, P.; Kwapil, W.; Schubert, M.C.; Seifert, H.; Warta, W.
Journal Article
2010High net doping concentration responsible for critical diode breakdown behavior of upgraded metallurgical grade multicrystalline silicon solar cells
Kwapil, W.; Wagner, M.; Schubert, M.C.; Warta, W.
Journal Article
2010Imaging of chromium point defects in p-type silicon
Habenicht, H.; Schubert, M.C.; Warta, W.
Journal Article
2010Imaging of metal impurities in silicon by luminescence spectroscopy and synchrotron techniques
Schubert, M.C.; Schön, J.; Gundel, P.; Habenicht, H.; Kwapil, W.; Warta, W.
Journal Article, Conference Paper
2010Impact of stress on recombination of metal precipitates in silicon
Gundel, P.; Schubert, M.C.; Heinz, F.D.; Kwapil, W.; Warta, W.; Martinez-Criado, G.; Reiche, M.; Weber, E.R.
Journal Article
2010Minority carrier lifetime in silicon wafers from quasi-steady-state photoluminescence
Giesecke, J.A.; Schubert, M.C.; Walter, D.; Warta, W.
Journal Article
2010Quantitative carrier lifetime measurement with micron resolution
Gundel, P.; Heinz, F.D.; Schubert, M.C.; Giesecke, J.A.; Warta, W.
Journal Article
2010Quantitative iron concentrating imaging
Schubert, M.C.; Habenicht, H.; Kerler, M.J.; Warta, W.
Conference Paper
2010Separation of local bulk and surface recombination in crystalline silicon from luminescence reabsorption
Giesecke, J.A.; Kasemann, M.; Schubert, M.C.; Würfel, P.; Warta, W.
Journal Article
2010Simulation of iron distribution after crystallization of mc silicon
Schön, J.; Habenicht, H.; Schubert, M.C.; Warta, W.
Conference Paper
2010Simultaneous stress and defect luminescence study on silicon
Gundel, P.; Schubert, M.C.; Warta, W.
Journal Article
2010Submicron resolution carrier lifetime analysis in silicon with Fano resonances
Gundel, P.; Schubert, M.C.; Heinz, F.D.; Benick, J.; Zizak, I.; Warta, W.
Journal Article
2009Diode breakdown related to recombination active defects in block-cast multicrystalline silicon solar cells
Kwapil, W.; Kasemann, M.; Gundel, P.; Schubert, M.C.; Warta, W.; Bronsveld, P.; Coletti, G.
Journal Article
2009Influence of heterogeneous profiles in carrier density measurements with respect to iron concentration measurements in silicon
Schubert, M.C.; Kerler, M.J.; Warta, W.
Journal Article
2009Micro-photoluminescence spectroscopy on metal precipitates in silicon
Gundel, P.; Schubert, M.C.; Kwapil, W.; Schon, J.; Reiche, M.; Savin, H.; Yli-Koski, M.; Sans, J.A.; Martinez-Criado, G.; Seifert, W.; Warta, W.; Weber, E.R.
Journal Article
2009Observation of metal precipitates at prebreakdown sites in multicrystalline silicon solar cells
Kwapil, W.; Gundel, P.; Schubert, M.C.; Heinz, F.D.; Warta, W.; Weber, E.R.; Goetzberger, A.; Martinez-Criado, G.
Journal Article
2009X-ray excited optical luminescence from crystalline silicon
Gundel, P.; Martinez-Criado, G.; Schubert, M.C.; Sans, J.A.; Kwapil, W.; Warta, W.; Weber, E.R.
Journal Article
2008Origin of trapping in multicrystalline silicon
Gundel, P.; Schubert, M.C.; Warta, W.
Journal Article
2007Prediction of diffusion length in multicrystalline silicon solar cells from trapping images on starting material
Schubert, M.C.; Warta, W.
Journal Article
2007Quantitative carrier lifetime images optically measured on rough silicon wafers
Schubert, M.; Pingel, S.; The, M.; Warta, W.
Journal Article
2006Comparison of luminescence imaging and illuminated lock-in thermography on silicon solar cells
Kasemann, M.; Schubert, M.C.; The, M.; Köber, M.; Hermle, M.; Warta, W.
Journal Article
2006Determination of spatially resolved trapping parameters in silicon with injection dependent carrier density imaging
Schubert, M.C.; Riepe, S.; Bermejo, S.; Warta, W.
Journal Article
2006Photoluminescence imaging of silicon wafers
Trupke, T.; Bardos, R.A.; Schubert, M.C.; Warta, W.
Journal Article
2006Trapping artifacts in quasi-steady-state photoluminescence and photoconductance lifetime measurements on silicon wafers
Bardos, R.A.; Trupke, T.; Schubert, M.C.; Roth, T.
Journal Article
2004Thermographic imaging of free carrier density in silicon
Schubert, M.C.; Isenberg, J.; Riepe, S.; Warta, W.
Journal Article
2003Spatially resolved lifetime imaging of silicon wafers by measurement of infrared emission
Schubert, M.C.; Isenberg, J.; Warta, W.
Journal Article