Year | Title/Author | Document Type |
1994 | 3D-Formvermessung mittels Zwei-Wellenlängen-ESPI-Technik
Maack, T.; Notni, G.; Schreiber, W. | Conference Paper |
1994 | Antiresonant reflecting optical waveguides in strip configuration
Gehler, J.; Bräuer, A.; Karthe, W. | Journal Article |
1994 | C-adsorption behaviour of thin fluoride films
Kaiser, N.; Kaiser, U. | Journal Article |
1994 | Charakterisierung der Rauheit optischer Funktionsflächen - Methodenvergleich
Neubert, J.; Duparre, A.; Kaiser, N.; Notni, G.; Gerold, F.; Risse, S. | Conference Paper |
1994 | Design and fabrication of rib ARROW couplers
Wächter, C.; Biehlig, W.; Bräuer, A.; Gehler, J.; Holtz, B.; Karthe, W.; Lederer, L.; Leine, L. | Conference Paper |
1994 | Drossel fuer Gasfuehrungen und Gaslager
Guyenot, V.; Huebner, G.; Eberhardt, R.; Risse, S. | Patent
Fulltext |
1994 | Fully automated angle resolved scatterometer
Neubert, J.; Seifert, T. | Conference Paper |
1994 | Generic detrending of surface profiles
Duparre, A.; Rothe, H.; Jakobs, S. | Journal Article |
1994 | Glass bearing with an integrated plygonal mirror
Risse, S.; Guyenot, V. | Journal Article |
1994 | Graded reflectance mirror design with unconventional profile for excimer laser
Kaiser, N.; Schallenberg, U.; Uhlig, H. | Journal Article |
1994 | Interface and volume inhomogenities in optical thin films investigated by light scattering methods
Duparre, A.; Gliech, S.; Hehl, K.; Pichlmaier, U.; Schuhmann, U. | Conference Paper |
1994 | Joining of ceramics by glass solder
Eberhardt, R.; Guyenot, V. | Conference Paper |
1994 | Micrometer resolved inspection of defects and laser damage sites in UV high-reflecting coatings by photothermal displacement microscopy
Kaiser, N.; Bodemann, A.; Reichling, M.; Welsch, E. | Journal Article |
1994 | Mikrostrukturierte strahlformende und fokussierende Bauelemente für die Materialbearbeitung mit Lasern
Heinemann, S. | Conference Paper |
1994 | Molecular beam deposition of fluorides
Laux, S.; Kaiser, U.; Richter, W. | Conference Paper |
1994 | Morphology investigations by atomic force microscopy of thin films and substrates for excimer laser mirrors
Kaiser, N.; Duparre, A.; Jakobs, S. | Conference Paper |
1994 | Photothermal absorption microscopy of defects in ZrO2 and MgF2 single-layer films
Duparre, A.; Reichling, M.; Welsch, E.; Matthias,E. | Journal Article |
1994 | Photothermal microscopy of defects and laser damage morphology in Al2O3/SiO2 dielectric mirror coatings for 248 nm
Kaiser, N.; Reichling, M.; Bodemann, A.; Welsch, E. | Conference Paper |
1994 | Photothermische Mikroskopie zeigt verborgene Defekte in UV-Hochleistungsoptiken
Reichling, M.; Kaiser, N.; Bodemann, A. | Journal Article |
1994 | Piezoelectrically driven rotation stepper motor for high resolution movings
Portius, P.; Wehrsdorfer, E. | Conference Paper |
1994 | Remote coupling over 93 mym using ARROW waveguides in strip configuration
Gehler, J.; Bräuer, A.; Karthe, W. | Journal Article |
1994 | Resistance of coated optics to UV laser irradiation
Kaiser, N. | Conference Paper |
1994 | Roughness and scattering measurements on thin films for UV/VIS applications
Duparre, A.; Kiesel, A.; Kaiser, N.; Truckenbrodt, H.; Schuhmann, U. | Conference Paper |
1994 | Schlagwerkantrieb für die Feinwerktechnik
Guyenot, V.; Damm, C.; Siebenhaar, C. | Journal Article |
1994 | Strahlformende und fokussierende Bauelemente für CO2-Laser in der Materialbearbeitung
Heinemann, S. | Journal Article |
1994 | Substrat-Halbzeug fuer optisch-elektrische Hybridschaltungen und Verfahren zu seiner Herstellung
Buss, W.; Eberhardt, R. | Patent
Fulltext |
1994 | Variable-angle spectroscopic ellipsometry for deep UV characterization of dielectric coatings
Kaiser, N.; Zuber, A.; Stehle, J.L. | Conference Paper |
1994 | Verbundsubstrat für elektrisch-optische Hybridschaltungen
Buß, W. | Conference Paper |
1994 | Very high damage threshold Al2O3/SiO2 dielectric coatings for excimer lasers
Kaiser, N.; Uhlig, H.; Schallenberg, U.B.; Anton, B.; Kaiser, U.; Mann, K.; Eva, E. | Conference Paper |
1994 | Vorrichtung zum Abtasten der Oberflaeche eines Hohlraumes mit Hilfe eines Lichtstrahles
Buss, W.; Hoefer, B. | Patent
Fulltext |