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Diagnostic system for lasers in the visible and near infrared region.

Diagnosesystem für Laser im sichtbaren und nahen Infrarotbereich
: Höltgen, B.; Aehling, H.; Treusch, H.G.

Laude, L.D.; Rauscher, G. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Laser Assisted Processing
Bellingham/Wash.: SPIE, 1989 (Proceedings of SPIE 1022)
ISBN: 0-8194-0057-2
Conference on Laser Assisted Processing <1988, Hamburg>
European Congress on Optics (ECO) <1, 1988, Hamburg>
Fraunhofer ILT ()
CCD-camera chip; CCD-Kamera; CCD-row; CCD-Zeile; chip; Diagnosesystem; diagnostic system; fokussierter Laserstrahl; infrared region; Infrarotbereich; unfocussed laser beam; unfokussiert

The diagnostic device introduced in this paper can be used to determine the distribution of the intensity in the unfocussed and focussed laser beam, and, on the basis of these data, to calculate the beam diameter and the maximum intesity. The temporal behavior of laser pulses can be recorded and the pulse energy and the average power of the pulses can be determined. The most significant characteristics of the presented diagnostic device are the external triggering up to 1 kHz by the repetition rate of a pulsed laser as well as the automatic adaption of the diagnostic system to the laser pulse energy.